scispace - formally typeset
Search or ask a question
Institution

Mitsubishi

CompanyTokyo, Japan
About: Mitsubishi is a company organization based out in Tokyo, Japan. It is known for research contribution in the topics: Layer (electronics) & Signal. The organization has 53115 authors who have published 54821 publications receiving 870150 citations. The organization is also known as: Mitsubishi Group of Companies & Mitsubishi Companies.


Papers
More filters
Patent
11 Dec 1998
TL;DR: In this article, an obstruction detection device is incorporated in an ultrasonic wave transmitter/receiver for changing a combination of transmitting of ultrasonic waves and of receiving of reflected ultrasonic signals.
Abstract: In the obstruction detection apparatus incorporated in a vehicle (11), ultrasonic wave transmitter/receiver (16 to 19 171) for changing a combination of transmitting of ultrasonic waves and of receiving of reflected ultrasonic waves, a CPU (20) calculates a distance between the vehicle (11) and an obstruction and stores data corresponding to the calculated distance into the distance table (23), and the LC display device (27) displays the obstruction on display bars of a lattice shape corresponding to the data stored in the distance table (23), and a buzzer (26) sounds an alarm for a driver.

139 citations

Journal ArticleDOI
TL;DR: Investigation of the induction of apoptotic nuclear changes by mycotoxins and other microbial products in human promyelotic leukemia cells revealed that T-2 toxin induced the apoptosis at 10 ng/ml levels within 2-6 hr without significant cytotoxicity evaluated by the dye exclusion and MTT.
Abstract: Based on the DNA fragmentation profile in gel electrophoresis and the morphological changes in electron microscopy, the induction of apoptotic nuclear changes by mycotoxins and other microbial products, in total 31 chemicals, was investigated in HL-60 human promyelotic leukemia cells, along with the cytotoxicity tests with 3-[4,5-dimethylthiazol-zyl]-2,5-diphenyltetrazolium bromide (MTT) and trypan blue exclusion. Among the chemicals tested, trichothecenes (T-2 toxin, roridin A, nivalenol, deoxynivalenol), certain anthraquinones (luteoskyrin, skyrin, 2-hydroxyemodin), diketopiperazines (emethallicin A, emestrin), isocoumarins (ochratoxin A, citrinin), lactone (penicillic acid), dihydrobisfuran (aflatoxin B1), potassium ionophore (valinomycin), and an inhibitor of interleukin-2 synthesis (cyclosporin A) were positive for the induction of DNA fragmentation. No DNA fragmentation was observed under the present conditions with fumonisin B1, cyclic peptides (cyclochlorotine, phalloidin, microcystin-LR), certain anthraquinones (emodin, chrysophanol, rugulosin), and others (sterigmatocystin, cytochalasin A, griseofulvin, fusaric acid, kojic acid, rubratoxin B, butenolide, wortmannin, FK506, and sphingosine). The apoptotic changes in the cells exposed to T-2 toxin and luteoskyrin were confirmed by electron microscopic observation. Detailed experiments on dose and time dependencies revealed that T-2 toxin induced the apoptosis at 10 ng/ml (= 4 x 10(-8) M) levels within 2-6 hr without significant cytotoxicity evaluated by the dye exclusion and MTT.

138 citations

Patent
23 Jun 1994
TL;DR: In this paper, a test analysis apparatus for OBIC analysis and luminous analysis from a rear surface of a semiconductor wafer is presented, which is mounted on a wafer chuck and a probe card which has metallic needles and which is movable along the X, Y, and Z axes supplies a test pulse signal to respective electrode pads.
Abstract: A test analysis apparatus for OBIC analysis and luminous analysis from a rear surface of a semiconductor wafer. According to the present invention, a semiconductor wafer is mounted on a wafer chuck and a probe card which has metallic needles and which is movable along the X, Y, and Z axes supplies a test pulse signal to respective electrode pads on the front surface of the semiconductor wafer. Then, current generated in the semiconductor wafer is detected at the electrode pads. Optical analysis, such as irradiation with a light beam, detection of reflected light, detection of light generated in the semiconductor wafer and the like, is performed from the rear side of the semiconductor wafer, thereby enabling analysis of a failure or a defect of a defective portion while the semiconductor wafer is in actual operating conditions.

138 citations

Journal ArticleDOI
TL;DR: The identification of a Drosophila homolog of cortactin as a molecule that interacts with Droseophila ZO-1 using yeast two-hybrid screening is described and the potential roles of the cortactIn·ZO- 1 complex in cell adhesion and cell signaling are discussed.

138 citations

Patent
13 Dec 1995
TL;DR: In this article, a semiconductor device includes an encapsulating resin encapsulating a substrate, a lead pattern or a laminated wiring layers transferred or secured on the lower surface of the encapsulating resins, and a plurality of external electrode disposed on the upper surface of lead pattern.
Abstract: A semiconductor device includes an encapsulating resin encapsulating a semiconductor substrate, a lead pattern or a laminated wiring layers transferred or secured on the lower surface of the encapsulating resin and a plurality of external electrode disposed on the lower surface of the lead pattern. The device may be manufactured by bonding a semiconductor substrate on a transferring substrate to which a lead pattern is formed, resin encapsulating an upper portion of the transferring substrate to cover the semiconductor substrate, and removing only the transferring substrate with the lead pattern left bonded to the encapsulating resin and the semiconductor substrate.

138 citations


Authors

Showing all 53117 results

NameH-indexPapersCitations
Thomas S. Huang1461299101564
Kazunari Domen13090877964
Kozo Kaibuchi12949360461
Yoshimi Takai12268061478
William T. Freeman11343269007
Tadayuki Takahashi11293257501
Takashi Saito112104152937
H. Vincent Poor109211667723
Qi Tian96103041010
Andreas F. Molisch9677747530
Takeshi Sakurai9549243221
Akira Kikuchi9341228893
Markus Gross9158832881
Eiichi Nakamura9084531632
Michael Wooldridge8754350675
Network Information
Related Institutions (5)
Osaka University
185.6K papers, 5.1M citations

90% related

Tokyo Institute of Technology
101.6K papers, 2.3M citations

89% related

University of Tokyo
337.5K papers, 10.1M citations

89% related

Nagoya University
128.2K papers, 3.2M citations

88% related

Kyoto University
217.2K papers, 6.5M citations

88% related

Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
20231
20222
2021199
2020310
2019389
2018422