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Institution

Mitsubishi

CompanyTokyo, Japan
About: Mitsubishi is a company organization based out in Tokyo, Japan. It is known for research contribution in the topics: Layer (electronics) & Signal. The organization has 53115 authors who have published 54821 publications receiving 870150 citations. The organization is also known as: Mitsubishi Group of Companies & Mitsubishi Companies.


Papers
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Journal ArticleDOI
TL;DR: It is suggested that plasma PAI-1 plays an important role in sustaining DIC in sepsis-induced DIC cases and contributes to multiple organ failure and decreased survival in such patients.
Abstract: Sepsis-induced disseminated intravascular coagulation (DIC) is a serious condition because it is closely linked to the development of multiple organ dysfunctions.We compared molecular fibrinolysis markers for 117 patients with sepsis-induced DIC and 1627 patients with nonseptic DIC. Levels of fibrinogen and fibrin degradation products and D-dimer were significantly lower in sepsis-induced DIC cases than in nonseptic DIC cases. In septic DIC cases, plasma plasminogen activator inhibitor 1 (PAI-1) levels were significantly higher than in nonseptic DIC cases. D-dimer levels were negatively correlated with plasma PAI-1 levels in septic DIC cases. Multiple Organ Dysfunction Scores were significantly higher in septic DIC patients with PAI-1 levels >90 ng/mL than in the group with PAI-1 levels 90 ng/mL than in the other groups. In a multivariate analysis, plasma PAI-1 levels at DIC diagnosis were an independent risk factor for mortality in sepsis-induced DIC (hazard ratio, 1.012; P = .008). These data suggest that plasma PAI-1 plays an important role in sustaining DIC in septic DIC cases and contributes to multiple organ failure and decreased survival in such patients.

115 citations

Patent
Shigenobu Maeda1
15 Nov 2002
TL;DR: In this article, a patterned resist (25 ) is formed so as to cover a low voltage operation region (A 2 ), a second LDD implantation process of implanting an impurity ion ( 14 ) by using the resist ( 25 ) as a mask, is performed over a silicon oxide film ( 6 ) thereby to form an impurate diffusion region ( 13 ) in the surface of a semiconductor substrate ( 1 ) in a high voltage operation regions (A 1 ).
Abstract: Provided are a semiconductor device that optimizes the operation characteristics such as of both an insulating gate type transistor for high voltage and an insulating gate type transistor for low voltage, and a method of manufacturing the same. Specifically, a patterned resist ( 25 ) is formed so as to cover a low voltage operation region (A 2 ), a second LDD implantation process of implanting an impurity ion ( 14 ) by using the resist ( 25 ) as a mask, is performed over a silicon oxide film ( 6 ) thereby to form an impurity diffusion region ( 13 ) in the surface of a semiconductor substrate ( 1 ) in a high voltage operation region (A 1 ). After this step, the silicon oxide film ( 6 ) in the high voltage operation region (A 1 ) contains the impurity during the second LDD implantation process whereas the silicon oxide film ( 6 ) in a low voltage operation region (A 2 ) contains no impurity. This leads to such a characteristic that in the following pre-treatment with a wet process, the silicon oxide film ( 6 ) containing the impurity in the high voltage operation region (A 1 ) is reduced in thickness, and the silicon oxide film ( 6 ) containing no impurity in the low voltage operation region (A 2 ) is not reduced in thickness.

115 citations

Proceedings ArticleDOI
04 Oct 1998
TL;DR: A region-of-interest (RoI) coding functionality into Said and Pearlman's SPIHT coding with integer transforms is incorporated, which significantly saves transmission time and storage space by terminating encoding or transmission in situations where the RoI needs to be coded losslessly and the rest of the image visually losslessly
Abstract: We have incorporated a region-of-interest (RoI) coding functionality into Said and Pearlman's (see IEEE. Trans. CSVT, vol.6, p.243-50, 1996) SPIHT coding with integer transforms. By placing a higher emphasis on the transform coefficients pertaining to the RoI, the RoI is coded with higher fidelity than the rest of the image in earlier stages of progressive reconstruction thus the "important" part of the image is reconstructed more quickly than the rest of the image. This method significantly saves transmission time and storage space by terminating encoding or transmission in situations where the RoI needs to be coded losslessly and the rest of the image visually losslessly (lossy). In our model, the RoI can be flexibly specified either in the beginning or in the middle of the encoding process (either on the original image or on the full- or low-resolution image reconstructed by the decoder), through interaction with the user at the transmitting or the receiving end. Also, the speed with which the quality of the RoI improves in progressive decoding is flexibly specified by the user at either end. The proposed method is especially advantageous in an application where the image is browsed interactively, e.g. telemedicine.

115 citations

Patent
20 Dec 2002
TL;DR: In this article, a method of manufacturing a semiconductor device which is capable of forming a gate structure having dimensions as designed is provided, and a photoresist is applied, and is then exposed to light using a photomask (18) for defining the ends of gate structures as seen in a direction of a gate width.
Abstract: A method of manufacturing a semiconductor device which is capable of forming a gate structure having dimensions as designed is provided. A silicon oxide film (4), a polysilicon film (5) and a silicon oxide film (6) are formed in the order named on a silicon substrate (1). Then, the silicon oxide film (6) is patterned to form silicon oxide films (14a, 14b). Next, a photoresist (15) is applied, and is then exposed to light using a photomask (18) for defining the ends of gate structures (25i-25k) as seen in a direction of a gate width. Next, the photoresist (15) is developed to form openings (21s-21u). Using the photoresist (15) as an etch mask, portions of the silicon oxide films (14a, 14b) exposed in the openings (21s-21u) are etched away.

115 citations

Journal ArticleDOI
TL;DR: Findings suggest a likely role of Arx in regulating the expression of putative instructive signals produced in the olfactory bulb for the proper innervation of Olfactory sensory axons.
Abstract: The olfactory system provides an excellent model in which to study cell proliferation, migration, differentiation, axon guidance, dendritic morphogenesis, and synapse formation. We report here crucial roles of the Arx homeobox gene in the developing olfactory system by analyzing its mutant phenotypes. Arx protein was expressed strongly in the interneurons and weakly in the radial glia of the olfactory bulb, but in neither the olfactory sensory neurons nor bulbar projection neurons. Arx-deficient mice showed severe anatomical abnormalities in the developing olfactory system: (1) size reduction of the olfactory bulb, (2) reduced proliferation and impaired entry into the olfactory bulb of interneuron progenitors, (3) loss of tyrosine hydroxylase-positive periglomerular cells, (4) disorganization of the layer structure of the olfactory bulb, and (5) abnormal axonal termination of olfactory sensory neurons in an unusual axon-tangled structure, the fibrocellular mass. Thus, Arx is required for not only the proper developmental processes of Arx-expressing interneurons, but also the establishment of functional olfactory neural circuitry by affecting Arx-non-expressing sensory neurons and projection neurons. These findings suggest a likely role of Arx in regulating the expression of putative instructive signals produced in the olfactory bulb for the proper innervation of olfactory sensory axons.

115 citations


Authors

Showing all 53117 results

NameH-indexPapersCitations
Thomas S. Huang1461299101564
Kazunari Domen13090877964
Kozo Kaibuchi12949360461
Yoshimi Takai12268061478
William T. Freeman11343269007
Tadayuki Takahashi11293257501
Takashi Saito112104152937
H. Vincent Poor109211667723
Qi Tian96103041010
Andreas F. Molisch9677747530
Takeshi Sakurai9549243221
Akira Kikuchi9341228893
Markus Gross9158832881
Eiichi Nakamura9084531632
Michael Wooldridge8754350675
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Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
20231
20222
2021199
2020310
2019389
2018422