NEC

About: NEC is a company organization based out in Tokyo, Japan. It is known for research contribution in the topics: Signal & Layer (electronics). The organization has 33269 authors who have published 57670 publications receiving 835952 citations. The organization is also known as: NEC Corporation & NEC Electronics Corporation.

Semiconductor memory device having dynamic data amplifier circuit capable of reducing power dissipation

Abstract: In a semiconductor memory device including a pair of data input/output lines, a data amplifier circuit amplifies voltages at the data input/output lines, and a data maintaining circuit maintains output signals of the data amplifier circuit. A data determination circuit, generates a data determination signal after the data maintaining circuit manintains the output signals of the data amplifier circuit and transmits the data transmitting the data determination signal to the data amplifier circuit, thus suspending the operation of the data amplifier circuit.

Electric-Field-Induced Color Changes and Pitch DILATION in Cholesteric Liquid Crystals

Abstract: A new electric-field-induced color range, in which colors change from blue to red with increasing field, has been observed in cholesteric liquid crystals. Observations of this new color range quantitatively confirm the theories of Meyer and de Gennes and enable identification of the specific nature of the electric-field-induced cholesteric-nematic phase transitions previously observed by other workers.

Tunable filter, manufacturing method thereof and optical switching device comprising the tunable filter

Abstract: The invention provides a tunable filter that can minimize adjacent channel cross talk despite an increase of a number of available wavelengths and quickly switch a wavelength to be used, and manufacturing method thereof, and also an optical switching device comprising such tunable filter. In a tunable filter having a Fabry-Perot etalon structure, not less than two cavity gaps 114 to 116 are provided and separation between the cavity gaps is controlled by any of electrostatic drive, electromagnetic drive or piezoelectric drive. In this case, the cavity gaps can be formed through the steps of forming a sacrificial layer in advance where a cavity gap is to be formed; forming a plurality of optical multilayer films 100 to 103 ; and removing the sacrificial layer by etching. Substrates 107 and 109 are combined through a supporting column 108.

Determination of the νe and total B8 solar neutrino fluxes using the Sudbury Neutrino Observatory Phase I data set

Abstract: This article provides the complete description of resultsfrom the Phase I data set of the Sudbury Neutrino Observatory (SNO). ThePhase I data set is based on a 0.65 kt-year exposure of heavy water tothe solar 8B neutrino flux. Included here are details of the SNO physicsand detector model, evaluations of systematic uncertainties, andestimates of backgrounds. Also discussed are SNO's approach tostatistical extraction of the signals from the three neutrino reactions(charged current, neutral current, and elastic scattering) and theresults of a search for a day-night asymmetry in the ?e flux. Under theassumption that the 8B spectrum is undistorted, the measurements fromthis phase yield a solar ?e flux of ?(?e) =1.76+0.05?0.05(stat.)+0.09?0.09 (syst.) x 106 cm?2 s?1, and a non-?ecomponent ?(? mu) = 3.41+0.45?0.45(stat.)+0.48?0.45 (syst.) x 106 cm?2s?1. The sum of these components provides a total flux in excellentagreement with the predictions of Standard Solar Models. The day-nightasymmetry in the ?e flux is found to be Ae = 7.0 +- 4.9 (stat.)+1.3?1.2percent (sys.), when the asymmetry in the total flux is constrained to bezero.