Philips

About: Philips is a company organization based out in Vantaa, Finland. It is known for research contribution in the topics: Signal & Layer (electronics). The organization has 68260 authors who have published 99663 publications receiving 1882329 citations. The organization is also known as: Koninklijke Philips Electronics N.V. & Royal Philips Electronics.

Plasmonics for solid-state lighting: enhanced excitation and directional emission of highly efficient light sources

Abstract: Light sources based on reliable and energy-efficient light-emitting diodes (LEDs) are instrumental in the development of solid-state lighting (SSL). Most research efforts in SSL have focused on improving both the intrinsic quantum efficiency (QE) and the stability of light emitters. For this reason, it is broadly accepted that with the advent of highly efficient (QE close to 1) and stable emitters, the fundamentalresearchphaseofSSLiscomingtoanend.Inthisstudy,wedemonstrateaverylargeimprovementinSSLemission(above 70-fold directional enhancement for p-polarized emission and 60-fold enhancement for unpolarized emission) using nanophotonic structures. This is attained by coupling emitters with very high QE to collective plasmonic resonances in periodic arrays of aluminum nanoantennas.OurresultsopenanewpathforfundamentalandappliedresearchinSSLinwhichplasmonicnanostructuresareableto mold the spectral and angular distribution of the emission with unprecedented precision. Light: Science & Applications (2013) 2, e66; doi:10.1038/lsa.2013.22; published online 10 May 2013

A structured and scalable mechanism for test access to embedded reusable cores

Abstract: The main objective of core-based IC design is improvement of design efficiency and time-to-market. In order to prevent test development from becoming the bottleneck in the entire development trajectory, reuse of pre-computed tests for the reusable pre-designed cores is mandatory. The core user is responsible for translating the test at core level into a test at chip level. A standardized test access mechanism eases this task, therefore contributing to the plug-n-play character of core-based design. This paper presents the concept of a structured test access mechanism for embedded cores. Reusable IP modules are wrapped in a TESTSHELL. Test data access from chip pins to TESTSHELL and vice versa is provided by the TESTRAIL, while the operation of the TESTSHELL is controlled by a dedicated test control mechanism (TCM). Both TESTRAIL as well as TCM are standardized, but open for extensions.