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Institution

Polytechnic University of Milan

EducationMilan, Italy
About: Polytechnic University of Milan is a education organization based out in Milan, Italy. It is known for research contribution in the topics: Finite element method & Population. The organization has 18231 authors who have published 58416 publications receiving 1229711 citations. The organization is also known as: PoliMi & L-NESS.


Papers
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Journal ArticleDOI
TL;DR: In this article, a photon emission efficiency of 2.9*10/sup 5/ photons with energy higher than 1.14 eV per carrier crossing the junction, independent of the lattice temperature down to 20 K, was measured.
Abstract: Spectrally resolved absolute measurements of hot-carrier-induced photon emission in silicon are reported. In order to avoid uncertainties in geometrical and physical parameters, the simplest conceivable device, an avalanching p-n junction, was used. A photon emission efficiency of 2.9*10/sup 5/ photons with energy higher than 1.14 eV per carrier crossing the junction, independent of the lattice temperature down to 20 K, was measured. On the basis of these results the bremsstrahlung origin of the hot-carrier-induced light emission is critically reviewed. >

326 citations

Journal ArticleDOI
TL;DR: An innovative framework both highlighting the links between I4.0 and CE and unveiling future research fields has been developed, and results show as it is possible to enhance a set of different relations.
Abstract: Industry 4.0 (I4.0) and Circular Economy (CE) are undoubtedly two of the most debated topics of the last decades. Progressively, they gained the interest of policymakers, practitioners and scholars...

322 citations

Journal ArticleDOI
TL;DR: In this paper, the authors proposed a threshold switching model for low-mobility semiconductors with a deep Fermi level and hopping-type conduction, which can predict the thickness, temperature, and material dependence of threshold voltage and current.
Abstract: Chalcogenide glasses are widely used in phase-change nonvolatile memories and in optical recording media for their ability to rapidly change their structure to crystalline, thus obtaining different electrical resistance and optical reflectivity. Chalcogenide glasses universally display threshold switching, that is a sudden, reversible transition from a high-resistivity state to a low-resistivity state observed in the current-voltage $(I\text{\ensuremath{-}}V)$ characteristic. Since threshold switching controls the operating voltage and speed of phase-change memories, the predictability of the switching voltage, current, and speed is of critical importance for selecting the proper chalcogenide material for memory applications. Although threshold switching has long been recognized to be an electronic process with an intimate relation to localized states, its detailed physical mechanism is still not clear. In this work, threshold switching is explained by the field-induced energy increase in electrons in their hopping transport, moderated by the energy relaxation due to phonon-electron interaction. The energy increase leads to an enhancement of conductivity and a collapse of the electric field within the amorphous chalcogenide layer, accounting for the observed negative differential resistance at switching. Threshold switching is found to obey to a constant electrical-power condition. The proposed model generally applies to low-mobility semiconductors featuring a deep Fermi level and hopping-type conduction, and can predict the thickness, temperature, and material dependence of threshold voltage and current.

322 citations

Journal ArticleDOI
TL;DR: In this article, a first-order estimation of the tuning curve for MOS-varactor-tuned VCOs is provided, based on which a simplified phase-noise model for double cross-coupled VOCs is derived.
Abstract: The tuning curve of an LC-tuned voltage-controlled oscillator (VCO) substantially deviates from the ideal curve 1//spl radic/(LC(V)) when a varactor with an abrupt C(V) characteristic is adopted and the full oscillator swing is applied directly across the varactor. The tuning curve becomes strongly dependent on the oscillator bias current. As a result, the practical tuning range is reduced and the upconverted flicker noise of the bias current dominates the 1/f/sup 3/ close-in phase noise, even if the waveform symmetry has been assured. A first-order estimation of the tuning curve for MOS-varactor-tuned VCOs is provided. Based on this result, a simplified phase-noise model for double cross-coupled VCOs is derived. This model can be easily adapted to cover other LC-tuned oscillator topologies. The theoretical analyses are experimentally validated with a 0.25 /spl mu/m CMOS fully integrated VCO for 5 GHz wireless LAN receivers. By eliminating the bias current generator in a second oscillator, the close-in phase noise improves by 10 dB and features -70 dBc/Hz at 10 kHz offset. The 1/f/sup 2/ noise is -132 dBc/Hz at 3 MHz offset. The tuning range spans from 4.6 to 5.7 GHz (21%) and the current consumption is 2.9 mA.

320 citations

Journal ArticleDOI
TL;DR: In this paper, the theoretical and practical relationship between business model innovation (BMI) and Lean Startup Approaches (LSAs) in dynamic digital environments has been investigated, with the aim of developing a research agenda directed towards integrating BMI, LSAs and AD processes and methods.

320 citations


Authors

Showing all 18743 results

NameH-indexPapersCitations
Alex J. Barker132127384746
Pierluigi Zotto128119778259
Andrea C. Ferrari126636124533
Marco Dorigo10565791418
Marcello Giroletti10355841565
Luciano Gattinoni10361048055
Luca Benini101145347862
Alberto Sangiovanni-Vincentelli9993445201
Surendra P. Shah9971032832
X. Sunney Xie9822544104
Peter Nijkamp97240750826
Nicola Neri92112241986
Ursula Keller9293433229
A. Rizzi9165340038
Martin J. Blunt8948529225
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Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
2023302
2022811
20214,151
20204,301
20193,831
20183,767