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Institution

Raytheon

CompanyWaltham, Massachusetts, United States
About: Raytheon is a company organization based out in Waltham, Massachusetts, United States. It is known for research contribution in the topics: Signal & Antenna (radio). The organization has 15290 authors who have published 18973 publications receiving 300052 citations.
Topics: Signal, Antenna (radio), Radar, Turbine, Amplifier


Papers
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Patent
Butler Jesse L1
17 Sep 1954

179 citations

Journal ArticleDOI
TL;DR: In this article, the Tropospheric Emission Spectrometer (TES) on the Earth Observing System (EOS)-Aura spacecraft measured global profiles of atmospheric ozone with vertical resolution of 6-7 km in the troposphere for the nadir view.
Abstract: [1] The Tropospheric Emission Spectrometer (TES) on the Earth Observing System (EOS)-Aura spacecraft measures global profiles of atmospheric ozone with vertical resolution of 6–7 km in the troposphere for the nadir view. For a first validation of TES ozone measurements we have compared TES-retrieved ozone profiles to ozonesondes from fall, 2004. In some cases the ozonesonde data are from dedicated launches timed to match the Aura overpass, while other comparisons are performed with routine data available from the Southern Hemisphere Additional Ozonesonde (SHADOZ) archive and World Ozone and Ultraviolet Data Center (WOUDC) data archives. We account for TES measurement sensitivity and vertical resolution by applying the TES-averaging kernel and constraint to the ozonesonde data before differencing the profiles. Overall, for V001 data, TES ozone profiles are systematically higher than sondes in the upper troposphere but compare well in the lower troposphere, with respect to estimated errors. These comparisons show that TES is able to detect relative variations in the coarse vertical structure of tropospheric ozone.

178 citations

Journal ArticleDOI
TL;DR: In this paper, a low-loss radio frequency (RF) microelectromechanical (MEMS) 4-bit X-band monolithic phase shifter is presented.
Abstract: In this work, development of a low-loss radio frequency (RF) microelectromechanical (MEMS) 4-bit X-band monolithic phase shifter is presented. These microstrip circuits are fabricated on 0.021-in-thick high-resistivity silicon and are based on a reflection topology using 3-dB Lange couplers. The average insertion loss of the circuit is 1.4 dB with the return loss >11 dB at 8 GHz. To the best of our knowledge, this is a lowest reported loss for X-band phase shifter and promises to greatly reduce the cost of designing and building phase arrays.

177 citations

Patent
22 Mar 1993
TL;DR: In this paper, a dual-band radio frequency antenna system is described, where the center element of the array antenna is in a common location with the feed of the reflector antenna.
Abstract: An antenna system is described including a reflector antenna, responsive to radio frequency signals at a first frequency, having a first reflector surface, a second reflector surface and a Cassegrain feed. The antenna system further includes an array antenna having a plurality of antenna elements responsive to radio frequency signals having a second different frequency, wherein a center element is in a common location with the feed of the reflector antenna. With such an arrangement, an improved dual band antenna system is provided. By providing the center element of the array antenna in a common location with the feed of the reflector antenna, a dual band radio frequency antenna system is provided which is more compact with improved radiation characteristics than known similar configured antennas.

177 citations

Journal ArticleDOI
TL;DR: A method is presented for correcting the gain and phase imbalances and the bias errors of the in-phase and quadrature channels of a coherent signal processor by means of coefficients which are derived from measurements of a test signal.
Abstract: A method is presented for correcting the gain and phase imbalances and the bias errors of the in-phase and quadrature channels of a coherent signal processor [1] by means of coefficients which are derived from measurements of a test signal. The residual errors after correction depend upon the signal-to-noise ratio (S/N) of the test signal and the degree of filtering used in deriving the correction coefficients.

175 citations


Authors

Showing all 15293 results

NameH-indexPapersCitations
Peter J. Kahrilas10958646064
Edward J. Wollack104732102070
Duong Nguyen9867447332
Miroslav Krstic9595542886
Steven L. Suib8986234189
Gabriel M. Rebeiz8780632443
Charles W. Engelbracht8321028137
Paul A. Grayburn7739726880
Eric J. Huang7220122172
Thomas F. Eck7215032965
David M. Margolis7022717314
David W. T. Griffith6528814232
Gerhard Klimeck6568518447
Nickolay A. Krotkov6321911250
Olaf Stüve6329014268
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Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
20232
20228
2021265
2020655
2019579
2018457