Stevens Institute of Technology

About: Stevens Institute of Technology is a education organization based out in Hoboken, New Jersey, United States. It is known for research contribution in the topics: Computer science & Cognitive radio. The organization has 5440 authors who have published 12684 publications receiving 296875 citations. The organization is also known as: Stevens & Stevens Tech.

Effect of oxygen on the surface tension of liquid copper

Abstract: The influence of oxygen on the surface tension of liquid copper has been determined by the sessile drop technique. The surface tension of pure liquid copper at 1108 °C is found to be equal to 1.320 ± 0.015 N/m. The effect of oxygen is investigated for partial pressures of oxygen ranging from 10−13 to 5 X 10−6 atm. The surface activity of oxygen is deduced to equal 3200 ± 600 N/m and the saturation adsorption to equal 5.72 X 10"6 mole/m2, which corresponds to a saturation area of 29 ±5A2 per adsorbed oxygen atom. The adsorption of oxygen on liquid copper is consistent with the formation at the metal surface of a two-dimensional compound of stoichiometry Cu3O. It is also concluded that equivalent attractive forces operate between neighboring adsorbed atoms.

Miniaturized Circularly Polarized Square Slot Antenna With Enhanced Axial-Ratio Bandwidth Using an Antipodal Y-strip

Abstract: A novel single-fed, wideband, circularly polarized slot antenna is proposed and fabricated. Wideband circular polarization is obtained by introducing an antipodal Y-strip to a square slot antenna. The feedline is a U-shaped microstrip line that provides a wide impedance bandwidth. The overall size of the antenna is only 28 × 28 mm 2 (0.3 λ o × 0.3 λ o ). A prototype of the antenna is fabricated and tested. The measured bandwidths for the axial ratio (AR <; 3 dB) and relative impedance (|S 11 | <; -10 dB) are 41.3% (from 4.4 to 6.67 GHz) and 84% (from 3.25 to 8 GHz), respectively, and the antenna has a stable radiation pattern and a gain of greater than 3 dBi over the entire circular polarization frequency band.

Integration maturity metrics: Development of an integration readiness level

Abstract: In order to optimize the process of complex system integration, it is necessary to first improve the management of the process. This can be accomplished through the use of a generally understood metric. One such metric is Technology Readiness Level (TRL), which is used to determine technology maturity, but does not address integration maturity. Integration Maturity Metric (IMM) requirements are developed through review of aerospace and defense related literature. These requirements are applied to currently existing integration maturity metrics, and the proposed Integration Readiness Level (IRL). IRL is then refined to fully meet these requirements, and applied to three aerospace case studies, along with the other identified metrics, to compare and contrast the results obtained.

Recent Developments in Control Chart Techniques

Abstract: In the last three decades several control chart procedures were developed. Prominent among these, are the Cumulative Sum, Economic design of X-bar control charts, Acceptance and Multi-Characteristic charts. This article presents description and analysis..