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Institution

STMicroelectronics

CompanyGeneva, Switzerland
About: STMicroelectronics is a company organization based out in Geneva, Switzerland. It is known for research contribution in the topics: Transistor & Signal. The organization has 17172 authors who have published 29543 publications receiving 300766 citations. The organization is also known as: SGS-Thomson & STM.


Papers
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Patent
26 Jan 1998
TL;DR: In this article, a method and apparatus for encoding digital video utilising a single pass variable bit rate encoding procedure is presented. But this method is restricted to video sequences and the bit rate for encoding blocks or frames in the sequence of moving pictures is determined according to the complexity of the video sequence.
Abstract: A method and apparatus for encoding digital video utilising a single pass variable bit rate encoding procedure. An encoding quality is set and the bit rate for encoding blocks or frames in the sequence of moving pictures is determined to achieve the selected quality according to the complexity of the video sequence. The bit rate is constrained by predetermined upper and lower bit rate limits.

99 citations

Journal ArticleDOI
TL;DR: In this paper, a quantitative evaluation of the contributions of different sources of statistical variability, including the contribution from the polysilicon gate, is provided for a low-power bulk N-MOSFET corresponding to the 45-nm technology generation.
Abstract: A quantitative evaluation of the contributions of different sources of statistical variability, including the contribution from the polysilicon gate, is provided for a low-power bulk N-MOSFET corresponding to the 45-nm technology generation. This is based on a joint study including both experimental measurements and ldquoatomisticrdquo simulations on the same fully calibrated device. The position of the Fermi-level pinning in the polysilicon bandgap that takes place along grain boundaries was evaluated, and polysilicon-gate-granularity contribution was compared to the contributions of other variability sources. The simulation results indicate that random discrete dopants are still the dominant intrinsic source of statistical variability, while the role of polysilicon-gate granularity is highly dependent on Fermi-level pinning position and, consequently, on the structure of the polysilicon-gate material and its deposition and annealing conditions.

98 citations

Journal ArticleDOI
21 May 1995
TL;DR: In this paper, the use of finite element (FE) techniques to predict residual warpage in PQFPs after encapsulation was addressed. But the authors did not consider the effect of mold compound chemical shrinkage on the warpage sensitivity of different packages to changes in downset.
Abstract: This paper addresses the use of finite element (FE) techniques to predict residual warpage in plastic quad flat packs (PQFPs) after encapsulation. Experimental measurements of package warpage are used to validate FE models of the packages. Failure to incorporate mold compound chemical shrinkage into the FE analysis leads to erroneous predictions of package warpage. The warpage sensitivity of different packages to changes in downset is presented. The validated FE package models predict stress levels in packages which are 70% greater than those with temperature coefficient of expansion (TCE) shrinkage alone and questions the accuracy of previous simulations which do not include molding compound chemical shrinkage.

98 citations

Journal ArticleDOI
A. Costa, A. De Gloria, Paolo Faraboschi, A. Pagni1, G. Rizzotto1 
01 Mar 1995
TL;DR: An overview of the computational complexity of the fuzzy inference process and the various techniques adopted for fuzzy control tasks is presented, highlighting the tradeoffs that can guide a system designer toward correct choices according to application features and cost/performance issues.
Abstract: A large fraction of software designs using microcontrollers is today adopting fuzzy logic algorithms and this fraction is likely to increase in the future. Hardware implementation of fuzzy logic ranges from standard microprocessors to dedicated ASICs and each different approach is targeted to a different application domain or market area. In this paper, we present an overview of the computational complexity of the fuzzy inference process and the various techniques adopted for fuzzy control tasks, highlighting the tradeoffs that can guide a system designer toward correct choices according to application features and cost/performance issues. In addition, we detail three case studies of architectures that address three different market segments in the fuzzy hardware scenario: dedicated fuzzy coprocessors, RISC processors with specialized fuzzy support and application specific fuzzy ASICs. >

98 citations

Patent
Kim C. Ng1
18 Apr 2002
TL;DR: In this article, a plurality of image features corresponded between different 2D views of the scene, the corresponded image features deviating between different views as a result of camera relative motion.
Abstract: An image processing system and method reconstructs 3D image information corresponding to a scene from a plurality of 2D images of the scene. The method receives a plurality of image features corresponded between different 2D views of the scene, the corresponded image features deviating between different views as a result of camera relative motion. The method determines image features of the received plurality of image features that are occluded views, determines image features of the received plurality of image features that are confident seeds associated with 3D depth information, and propagates 3D depth information from the confident seeds to neighboring image features, while avoiding image features that have been determined to be occluded views. The 3D image information can be rendered and displayed such as for a virtual walkthrough of the scene.

98 citations


Authors

Showing all 17185 results

NameH-indexPapersCitations
Bharat Bhushan116127662506
Albert Polman9744542985
G. Pessina8482830807
Andrea Santangelo8388629019
Paolo Mattavelli7448219926
Daniele Ielmini6836716443
Jean-François Carpentier6245914271
Robert Henderson5844013189
Bruce B. Doris5660412366
Renato Longhi551778644
Aldo Romani5442511513
Paul Muralt5434412694
Enrico Zanoni5370513926
Gaudenzio Meneghesso5170312567
Franco Zappa502749211
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Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
202225
2021560
2020798
2019952
2018948
2017781