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Institution

Varian Associates

About: Varian Associates is a based out in . It is known for research contribution in the topics: Beam (structure) & Amplifier. The organization has 2160 authors who have published 2591 publications receiving 46002 citations.
Topics: Beam (structure), Amplifier, Wafer, Cathode, Resonance


Papers
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Journal ArticleDOI
J. Haimson1
TL;DR: In this article, the design of high attenuation periodic microwave structures and their application during the past few years as internal collinear terminating loads for high power linear accelerator systems is described.

12 citations

Journal ArticleDOI
TL;DR: In this article, a two-heater side-by-side injection system was proposed for in-situ synthesis and growth of InP singlecrystals, utilizing the phosphorus vapor injection method.
Abstract: The high partial pressure of phosphorus at the stoichiometric melting point of InP precludes the in-situ synthesis in the puller by simple admixture of indium and phosphorus. This paper describes a system that was considered for the in-situ synthesis and growth of InP single crystal, utilizing the phosphorus vapor injection method. The advantages of this two-heater side-by-side injection synthesis system is dis-cussed and the effect of chamber pressure and phosphorus temperature on the InP synthesis yield is described. The procedures used for in-situ synthesis and growth are also described. Electrical and optical properties of LEC cry-stals grown by in-situ synthesis compare favorably with those of crystals grown from polycrystalline charges synthe-sized with the high-pressure autoclave or the gradient freeze method.

12 citations

Proceedings ArticleDOI
01 Jan 1987
TL;DR: In this paper, the intrinsic rf losses in each of a series of experimental helix circuits were measured to evaluate loss mechanisms in the helix tape and dielectric support rods, and the effects of helix material, helix surface finish, and rod material were measured over the frequency range of 10 GHz to 20 GHz in a test vehicle similar in design to circuits used in I-J band TWTs.
Abstract: The intrinsic rf losses in each of a series of experimental helix circuits were measured to evaluate loss mechanisms in the helix tape and dielectric support rods. The effects of helix material, helix surface finish, and rod material were measured over the frequency range of 10 GHz to 20 GHz in a test vehicle similar in design to circuits used in I-J band TWTs. The nonresonant perturbation measurement technique permitted separation of conductor losses from dielectric losses while avoiding errors common to other measurement methods. A by-product of the measurement technique was the circuit wavelength used to normalize the loss data.

12 citations


Authors

Showing all 2160 results

NameH-indexPapersCitations
Richard R. Ernst9635253100
Fred E. Regnier8841225169
Norbert Schuff8828025442
James S. Hyde7941235755
Carl Djerassi77152337630
Ray Freeman7326922872
Robert Kaptein7243624275
Minghwei Hong5851514309
Jesse L. Beauchamp5527510971
Herbert Kroemer522379936
Hans J. Jakobsen492748401
James N. Eckstein421686634
Ivan Bozovic311285060
John Glushka31763004
Gary Virshup241132374
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Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
20171
20161
20122
20111
20104
20093