IEICE Transactions on Electronics
Institute of Electronics, Information and Communication Engineers
About: IEICE Transactions on Electronics is an academic journal. The journal publishes majorly in the area(s): CMOS & Amplifier. It has an ISSN identifier of 0916-8524. Over the lifetime, 6077 publications have been published receiving 39089 citations.
Papers published on a yearly basis
TL;DR: An architecturally based scaling strategy is presented which indicates that the optimum voltage is much lower than that determined by other scaling considerations, and is achieved by trading increased silicon area for reduced power consumption.
Abstract: Motivated by emerging battery-operated applications that demand intensive computation in portable environments, techniques are investigated which reduce power consumption in CMOS digital circuits while maintaining computational throughput Techniques for low-power operation are shown which use the lowest possible supply voltage coupled with architectural, logic style, circuit, and technology optimizations An architecturally based scaling strategy is presented which indicates that the optimum voltage is much lower than that determined by other scaling considerations This optimum is achieved by trading increased silicon area for reduced power consumption >
TL;DR: In this article, the effects of switching transients in digital MOS circuits that perturb analog circuits integrated on the same die by means of coupling through the substrate were observed. And the authors showed that in such cases the substrate noise is highly dependent on layout geometry.
Abstract: An experimental technique is described for observing the effects of switching transients in digital MOS circuits that perturb analog circuits integrated on the same die by means of coupling through the substrate Various approaches to reducing substrate crosstalk (the use of physical separation of analog and digital circuits, guard rings, and a low-inductance substrate bias) are evaluated experimentally for a CMOS technology with a substrate comprising an epitaxial layer grown on a heavily doped bulk wafer Observations indicate that reducing the inductance in the substrate bias is the most effective Device simulations are used to show how crosstalk propagates via the heavily doped bulk and to predict the nature of substrate crosstalk in CMOS technologies integrated in uniform, lightly doped bulk substrates, showing that in such cases the substrate noise is highly dependent on layout geometry A method of including substrate effects in SPICE simulations for circuits fabricated on epitaxial, heavily doped substrates is developed >
TL;DR: In this paper, two new power-saving schemes for high-performance VLSIs with a large-scale memory and many interface signals are described, one is a current-controlled latch sense amplifier that reduces the power dissipation by stopping sense current automatically.
Abstract: Two new power-saving schemes for high-performance VLSIs with a large-scale memory and many interface signals are described. One is a current-controlled latch sense amplifier that reduces the power dissipation by stopping sense current automatically. This sense amplifier reduces power without degrading access time compared with the conventional current-mirror sense amplifier. The other is a static power-saving input buffer (SPSIB) that reduces DC current in interface circuits receiving TTL high input level. The effectiveness of these new circuits is demonstrated with a 512-kb high-speed SRAM. >
TL;DR: Circuit optimization and design automation techniques are introduced to bring leakage under control in CMOS circuits and present techniques for active leakage control.
Abstract: In many new high performance designs, the leakage component of power consumption is comparable to the switching component. Reports indicate that 40% or even higher percentage of the total power consumption is due to the leakage of transistors. This percentage will increase with technology scaling unless effective techniques are introduced to bring leakage under control. This article focuses on circuit optimization and design automation techniques to accomplish this goal. The first part of the article provides an overview of basic physics and process scaling trends that have resulted in a significant increase in the leakage currents in CMOS circuits. This part also distinguishes between the standby and active components of the leakage current. The second part of the article describes a number of circuit optimization techniques for controlling the standby leakage current, including power gating and body bias control. The third part of the article presents techniques for active leakage control, including use of multiple-threshold cells, long channel devices, input vector design, transistor stacking to switching noise, and sizing with simultaneous threshold and supply voltage assignment.
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