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JournalISSN: 1043-7398

Journal of Electronic Packaging 

About: Journal of Electronic Packaging is an academic journal. The journal publishes majorly in the area(s): Heat transfer & Heat sink. It has an ISSN identifier of 1043-7398. Over the lifetime, 1925 publication(s) have been published receiving 32692 citation(s).


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Journal ArticleDOI
TL;DR: In this paper, a unified viscoplastic constitutive law, the Anand model, was applied to represent the inelastic deformation behavior for solders used in electronic packaging.
Abstract: A unified viscoplastic constitutive law, the Anand model, was applied to represent the inelastic deformation behavior for solders used in electronic packaging. The material parameters of the constitutive relations for 62Sn36Pb2Ag, 60Sn40Pb, 96.5Sn3.5Ag, and 97.5Pb2.5Sn solders were determined from separated constitutive relations and experimental results. The achieved unified Anand model for solders were tested for constant strain rate testing, steady-state plastic flow and stress/strain responses under cyclic loading. It is concluded that the Anand model can be applied for representing the inelastic deformation behavior of solders at high homologous temperature and can be recommended for finite element simulation of the stress/strain responses of solder joints in service. @DOI: 10.1115/1.1371781#

294 citations

Journal ArticleDOI
TL;DR: In this article, a review of the most commonly used measurement techniques for thermal conductivity and interfacial thermal conductance is presented, including the 3-omega method and transient plane source method.
Abstract: Thermal conductivity and interfacial thermal conductance play crucial roles in the design of engineering systems where temperature and thermal stress are of concerns. To date, a variety of measurement techniques are available for both bulk and thin film solid-state materials with a broad temperature range. For thermal characterization of bulk material, the steady-state absolute method, laser flash diffusivity method, and transient plane source method are most used. For thin film measurement, the 3{\omega} method and transient thermoreflectance technique including both frequency-domain and time-domain analysis are employed widely. This work reviews several most commonly used measurement techniques. In general, it is a very challenging task to determine thermal conductivity and interface contact resistance with less than 5% error. Selecting a specific measurement technique to characterize thermal properties need to be based on: 1) knowledge on the sample whose thermophysical properties is to be determined, including the sample geometry and size, and preparation method; 2) understanding of fundamentals and procedures of the testing technique and equipment, for example, some techniques are limited to samples with specific geometrics and some are limited to specific range of thermophysical properties; 3) understanding of the potential error sources which might affect the final results, for example, the convection and radiation heat losses.

217 citations

Journal ArticleDOI
TL;DR: In this article, the problem of dimensionless thermal resistance in closed finned channels was generalized with a statement of the number of channels and the ratio of the heat source to the cooling channel.
Abstract: For fully developed flow in closed finned channels used to augment heat transfer, there exists an optimal geometrical design of the size and number of cooling channels. In this paper, the problem is generalized with a statement of dimensionless thermal resistance in terms of 9 the number of channels 9 a fin to channel thickness ratio 8 the length to width {planar dimensions) ratio of the heat source, and 9 a specified fin efficiency or fin length 9 a fluid to fin thermal conductivity ratio 9 the Prandtl Number of the coolant 8 a dimensionless pressure term, which incorporates the maximum allowable pressure drop through the cooling channels or alternatively, 9 a dimensionless work rate term, which incorporates the maximum allowable cool­ ant pumping power required, An optimization scheme is described and used for comparison with two previously published cases wherein both designs were restricted to a fixed fin to channel thickness ratio and laminar flow; one by Goldberg (1984) using air and copper and a second one only by Tuckerman and Pease (1981) for water-cooled Silicon wafers. Results from the present optimization scheme show that upon reexamination of the first study by Goldberg, significant reduction of thermal resistance can be obtained by using fin/channel dimensions other than unity. A similar reduction is found in the second instance (Tuckerman and Pease) with the relaxation of the laminar limitation.

214 citations

Journal ArticleDOI
TL;DR: In this paper, the authors explored the possibility of using a unified theory of creep-fatigue, similar to the Halford-Manson strain-range partitioning method, for examining the effect of cyclic temperature range on fatigue life, over a wide range of temperatures.
Abstract: This study explores the possibility of using a unified theory of creep-fatigue, similar to the Halford-Manson strain-range partitioning method, for examining the effect of cyclic temperature range on fatigue life, over a wide range of temperatures. Other investigators have attempted similar techniques before for solder fatigue analysis. The present study is different since it proposes an energy-partitioning technique rather than strain-partitioning to examine the dependence of solder fatigue behavior on temperature dependent changes in the relative amounts of plastic and creep strains. The solder microstructure also dictates creep behavior but is assumed to be a given invariant parameter in this study. In other words, this study is targeted at as-cast microstructures and does not address post-recrystallization behavior. A sample solder joint of axisymmetric configuration, commonly found in leaded through-hole mounting technology, is analyzed with the help of nonlinear finite element methods. The strain history is determined for constant-amplitude temperature cycling with linear loading and unloading, and with constant dwells at upper and lower ends of the cycle. Large-deformation continuum formulations are utilized in conjunction with a viscoplastic constitutive model for the solder creep-plasticity behavior. Relevant material properties are obtained from experimental data in the literature. The results show significant amounts of rachetting and shakedown in the solder joint. Detailed stress-strain histories are presented, illustrating the strain amplitude, mean strain and residual stresses and strains. For illustrative purposes, the hysteresis cycles are partitioned into elastic, plastic and creep components. Such partitioned histories are essential in order to implement either the Halford-Manson strain-range partitioning technique or the energy-based approach suggested here, for analyzing the creep-fatigue damage accumulation in solder material. This study also illustrates the role and utility of the finite element method in generating the detailed stress-strain histories necessary for implementing the energy partitioning approach for creep-fatigue damage evaluation. Solder life prediction is presented as a function of cyclic temperature range at a given mean temperature.

212 citations

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Performance
Metrics
No. of papers from the Journal in previous years
YearPapers
202222
202163
202069
201947
201842
201748