Journal of Research of the National Institute of Standards and Technology 

About: Journal of Research of the National Institute of Standards and Technology is an academic journal published by The National Institute of Standards and Technology. The journal publishes majorly in the area(s): NIST & Neutron. It has an ISSN identifier of 1044-677X. It is also open access. Over the lifetime, 1210 publications have been published receiving 29471 citations. The journal is also known as: Journal of research of the National Institute of Standards and Technology & Journal of Research of NIST.

DAVE: A Comprehensive Software Suite for the Reduction, Visualization, and Analysis of Low Energy Neutron Spectroscopic Data.

Abstract: National user facilities such as the NIST Center for Neutron Research (NCNR) require a significant base of software to treat the data produced by their specialized measurement instruments. There is no universally accepted and used data treatment package for the reduction, visualization, and analysis of inelastic neutron scattering data. However, we believe that the software development approach adopted at the NCNR has some key characteristics that have resulted in a successful software package called DAVE (the Data Analysis and Visualization Environment). It is developed using a high level scientific programming language, and it has been widely adopted in the United States and abroad. In this paper we describe the development approach, elements of the DAVE software suite, its usage and impact, and future directions and opportunities for development.

Material Properties of Titanium Diboride.

Abstract: The physical, mechanical, and thermal properties of polycrystalline TiB2 are examined with an emphasis on the significant dependence of the properties on the density and grain size of the material specimens. Using trend analysis, property relations, and interpolation methods, a coherent set of trend values for the properties of polycrystalline TiB2 is determined for a mass fraction of TiB2 98 %, a density of (4.50.1) g/cm 3 , and a mean grain size of (91) m.

Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction , and Tip Estimation

Abstract: To the extent that tips are not perfectly sharp, images produced by scanned probe microscopies (SPM) such as atomic force microscopy and scanning tunneling microscopy are only approximations of the specimen surface. Tip-induced distortions are significant whenever the specimen contains features with aspect ratios comparable to the tip’s. Treatment of the tip-surface interaction as a simple geometrical exclusion

Fundamental Parameters Line Profile Fitting in Laboratory Diffractometers.

Abstract: The fundamental parameters approach to line profile fitting uses physically based models to generate the line profile shapes Fundamental parameters profile fitting (FPPF) has been used to synthesize and fit data from both parallel beam and divergent beam diffractometers The refined parameters are determined by the diffractometer configuration In a divergent beam diffractometer these include the angular aperture of the divergence slit, the width and axial length of the receiving slit, the angular apertures of the axial Soller slits, the length and projected width of the x-ray source, the absorption coefficient and axial length of the sample In a parallel beam system the principal parameters are the angular aperture of the equatorial analyser/Soller slits and the angular apertures of the axial Soller slits The presence of a monochromator in the beam path is normally accommodated by modifying the wavelength spectrum and/or by changing one or more of the axial divergence parameters Flat analyzer crystals have been incorporated into FPPF as a Lorentzian shaped angular acceptance function One of the intrinsic benefits of the fundamental parameters approach is its adaptability any laboratory diffractometer Good fits can normally be obtained over the whole 20 range without refinement using the known properties of the diffractometer, such as the slit sizes and diffractometer radius, and emission profile

Comprehensive Review and Critical Evaluation of the Half-Life of Tritium.

Abstract: As part of the preparation and calibration of three new National Institute of Standards and Technology (NIST) tritiated-water radioactivity Standard Reference Materials (SRMs), we have performed a comprehensive review and critical evaluation of the half-life of tritium (hydrogen-3). Twenty three experimentally-determined values of the half-life of tritium, reported between 1936 and 2000, were found. Six of these values were updated by later values. Two values were limits. Two values were deemed to be outliers. The 13 remaining values were evaluated in several ways. The results are compared with the results of other recent evaluations and all are found to be in good agreement. Our final recommended value for the half-life of tritium is the average of the adopted values from the four most recent evaluations, (4500 ± 8) d, where 8 d corresponds to one standard uncertainty.