Journal•ISSN: 0026-2714
Microelectronics Reliability
Elsevier BV
About: Microelectronics Reliability is an academic journal published by Elsevier BV. The journal publishes majorly in the area(s): Reliability (statistics) & Reliability (semiconductor). It has an ISSN identifier of 0026-2714. Over the lifetime, 11811 publications have been published receiving 152345 citations. The journal is also known as: Microelectronics and reliability & Microelectronics reliability.
Topics: Reliability (statistics), Reliability (semiconductor), Gate oxide, Soldering, Threshold voltage
Papers published on a yearly basis
Papers
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TL;DR: This compendium provides the main failure modes, the physical or chemical processes that lead to the failure, and reports some major technological countermeasures, which are used for realizing the very stringent reliability requirements imposed in particular by the electrical traction applications.
862 citations
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TL;DR: Several of the extraction methods currently used to determine the value of threshold voltage from the measured drain current versus gate voltage transfer characteristics, focusing specially on single-crystal bulk MOSFETs are reviewed.
813 citations
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TL;DR: A comprehensive model for NBTI phenomena within the framework of the standard reaction–diffusion model is constructed and it is demonstrated how to solve the reaction-diffusion equations in a way that emphasizes the physical aspects of the degradation process and allows easy generalization of the existing work.
710 citations
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TL;DR: This paper provides the groundwork for an understanding of the reliability issues of LEDs across the supply chain and identifies the relationships between failure causes and their associated mechanisms, issues in thermal standardization, and critical areas of investigation and development in LED technology and reliability.
648 citations
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TL;DR: This paper presents a projection of the reliability challenges in 3D IC packaging technology on the basis of what the authors have known from flip chip technology.
493 citations