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Showing papers in "Microelectronics Reliability in 1970"


Journal ArticleDOI
G.H. Schwuttke1
TL;DR: In this article, the influence of micro defects in silicon on semiconductor device performance is reviewed and it is shown that such defects are more important in determining device yield, device performance and device reliability than the material properties normally specified.

35 citations



Journal ArticleDOI
J.F. Verwey1
TL;DR: In this article, a model consisting of the penetration of charge (hot electrons and holes) into the oxide along the perimeter of the emitter-base junction and a creation of recombination centers at the Si-SiO 2 interface was proposed.

15 citations


Journal ArticleDOI
TL;DR: In this article, MOS shift registers are compared to bipolar ones, and it is shown that both technologies are suited equally well for large scale integration, if no major change in technology takes place, this conclusion holds for the near future too.

7 citations


Journal ArticleDOI
TL;DR: In this paper, the reliability characteristics of a stand-by redundant equipment consisting of two components with an imperfect sensing and switching mechanism have been evaluated and the point-wise availability of such a system has also been obtained among other results.

6 citations


Journal ArticleDOI
TL;DR: In this article, three kinds of silicone films were crosslinked by electron beam irradiation, and their dielectric properties were examined with a parallel-plate capacitor configuration, and all constants of these films were unchanged after 2 months storage in dry air.

4 citations


Journal ArticleDOI
TL;DR: In this paper, the behaviour of a standby redundant electronic equipment having two types of components with imperfect switching has been studied and the repair of all the failed components of standby class has been assumed to be opportunistic.

4 citations



Journal ArticleDOI

4 citations


Journal ArticleDOI
TL;DR: In this paper, the authors described the nomogram for calculation of numbers of spare parts at probability p = 0·9 and 0·95 that the cause of a system down time will not be a lack of spare part of the determinate type.

4 citations



Journal ArticleDOI
C.M. Hart1, C. Mulder1
TL;DR: A new electronic concept has been applied, resulting in a simple and accurate electronic adjustment for film speed and diaphragm, enabling a very compact and fast circuit for automatic control of the shutter time in cameras to be made.

Journal ArticleDOI
TL;DR: In this paper, a p-channel enhancement MOST is described that gives an extended range of control-lable resistance variation for a range of applied gate voltage, using a laterally diffused concentration gradient in the substrate.

Journal ArticleDOI
TL;DR: In this article, the short time high current rating for aluminum conductors of the type used on present-day integrated circuits is calculated by using appropriate approximations, and three failure regimes can be identified.


Journal ArticleDOI
TL;DR: In this article, a justification for applying energy band theory to amorphous and polycrystalline insulating films is offered, and the effect of interface and surface states considered.

Journal ArticleDOI
TL;DR: In this article, the stochastic behavior of a quasi-redundant complex system under repair echelon has been discussed and use of Laplace transforms has been made in developing the mathematical model and solutions obtained.



Journal ArticleDOI
TL;DR: In this paper, the effect of frequency on the dissipation factor and equivalent series capacitance is determined and approximations made for certain frequency ranges, which enable the relevant capacitors parameters to be practically determined.

Journal ArticleDOI
TL;DR: For complete integration of a given transfer function, the number, size and spread of components will be of prime interest, in contrast, for example, to sensitivity as discussed by the authors, and a given degree three Cauer response is synthesized in five ways with emphasis upon complete integration.

Journal ArticleDOI
TL;DR: In this article, an analytical method has been suggested for the calculation of the temperature coefficient of a diffused monolithic resistor with a Gaussian impurity distribution, which can be also used to calculate the resistivity and temperature coefficient with exponential or error function impurity distributions.

Journal ArticleDOI
TL;DR: The first line of solid-state display devices for one-and three-digit numeric indicators as mentioned in this paper were based on the BCD input signals and 5-V power to display any numeral from 0 to 9 in an array of bright red dots.

Journal ArticleDOI
TL;DR: In this article, it was shown through the use of dimensional analysis that the transfer function sensitivity depends only upon the transfer functions and not upon the realization configuration, and an interpretation through the Bode plot showed that sharp cutoff leads to high sensitivity.

Journal ArticleDOI
TL;DR: In this paper, the authors discussed the relation between the probability of acceptance and the MTBF (mean-time-between-failures) of a batch subjected to test and the reliability level of individual equipments.

Journal ArticleDOI
TL;DR: A maintainability demonstration on a Station Technical Control facility that is a part of the Overseas AUTOVON System is discussed, which may serve as an introduction to some of the maintainability concepts.

Journal ArticleDOI
TL;DR: In this paper, the authors examined properties of a circulator in such a way that the low frequency circuit designers may appreciate its usefulness, since the circulator originated from the microwave region its circuit properties may not be very well known to designers unfamiliar with the microwave circuitry.


Journal ArticleDOI
TL;DR: A brief review of the available techniques for reducing electron beam aberrations is presented in this article, and a D-to-A system capable of resolving 1 part in 100,000 in the analog output is described.

Journal ArticleDOI
J.M. Grange1, J. Dorleans1
TL;DR: A simulation, using the Monte Carlo method, is made to gain an idea of the validity of the predictions, made from the standpoint of real equipment by making various assumptions on the distributions of the failure rates.