Showing papers in "Microelectronics Reliability in 1989"

TL;DR: In this article, a removable overlay layer together with its associated metallization pattern is used to effectively provide wafer scale integration for integrated circuit chips, and the method and configuration of the present invention provide for the fabrication and testing of systems which are otherwise untestable.

TL;DR: An algorithm based on a discretization procedure which permits consideration of any arbitrary possiblity distribution for the events and provides a higher precision than that could be obtained in a graphical approach is presented.

TL;DR: In this paper, the inverted gamma distribution is studied as a prospective life distribution and a comparison with the log-normal and inverse Gaussian distribution is illustrated in terms of an example based on a maintenance data set.

TL;DR: In this article, a profit model is developed to determine the optimal values of the number of spares and repairment simultaneously, and several system characteristics are computed under optimal operating conditions.

TL;DR: In this paper, a probe head for use with equipment for testing a semiconductor device such as a large scale integrated circuit (LSI) includes electrode pads are formed on a circuit substrate, and a pad protecting conductive layer formed on the pads.

TL;DR: In this paper, the authors considered a man-machine system operating under changing environment subject to a Markov process with two states and used Markov renewal theory to obtain the system availability, failure frequency and reliability function.

TL;DR: In this article, the authors find the most efficient (airport) runway utilization by using a methodology which they call Constrained Position Shifting (CPS) from the perspectives of both pilots and air traffic controllers by simulation.

TL;DR: It is shown that fuzzy logic is a potential tool for creating expert bases in situations which are by nature imprecise and where quantitative data is either not available or appropriate.

TL;DR: In this article, a focused ion beam (FIB) was used to produce a series of nucleation sites on the substrate surface, which can be either formed by lattice damage or sputtering directly in the substrate material.

TL;DR: In this article, the reliability characteristics of a system with M operating machines, S warm standby spares and R repairmen in the repair facility were investigated. Failure times and repair times were assumed to be exponentially distributed.

TL;DR: In this paper, the availability and MTTF of a system with three states (good, reduced and failed) consisting of three subsystems in series having one standby unit in subsystem D is presented.

TL;DR: This work suggests to use different rankings for different improvement actions, indicated that the importance measure suggested by Birnbaum can not be directly used, but the new measure is strongly connected to it.

TL;DR: In this paper, a bonded ceramic-metal composite substrate comprising a ceramic substrate having opposite surfaces and a copper sheet having a face directly bonded to one of the surfaces of the ceramic substrate was proposed.

TL;DR: An integrated circuit package produced by bonding a rear surface of an insulating substrate enclosed in the package to a heat sink such as a cooling fin by a resinous adhesive, which may include one or more fillers, having a Young's modulus of 500 kg/cm2 or less when formed into a film, has high reliability at the bonding portion and withstands without damages even if subjected to thermal shocks as discussed by the authors.

TL;DR: Human error prevention and reduction methods are discussed along with human reliability data banks, in particular, Data Store and Operational Recording and Data System (OPREDS).

TL;DR: An up-to-date review of results in the field of instabilities in MOS transistors is presented in this paper, where the authors point out the relationship between transistor characteristic instabilities and corresponding changes in the gate oxide charge and interface trap densities, and further, physico-chemical and electro-physical processes responsible.

TL;DR: In this paper, a method and circuitry for testing in situ the components mounted on a circuit board is presented. But this method requires the component to be removed from the board and a testing circuit is installed in place of the removed component.

TL;DR: In this paper, an electronic, digital IC module includes a substrate element on which is formed a test integrated circuit for the execution of a boundary scan on a standard integrated circuit formed on another substrate element.

TL;DR: In this paper, a test statistic intended for testing exponentiality against the NBUE-NWUE property is presented and the asymptotic normality of the test statistic is established and a simulation study is presented.

TL;DR: In this article, a diffusion approximation to the G/G/R machine repair problem with warm standbys under the assumption of heavy traffic approximation is studied, where the probability density functions of the number of failed machines in the system are utilized to compute the system characteristics.

TL;DR: A method of universal decoding (U-decoding) which does not depend on transition probabilities of MAC is presented, and the logarithmic asymptotes of error probability for the symmetrical model of RDSE are obtained.

TL;DR: In this paper, a model for a two unit cold standby system in which the repair man appears and disappears from the system randomly is presented, where the repair time is arbitrary and failure time of a unit and appearance and disappearance time of the repairman are negative exponential.

TL;DR: In this paper, the cost-benefit analysis of a one-server two unit system subject to two different failure modes and slow switch is considered, where the repair times and the switchover time are assumed to be arbitrarily distributed.

TL;DR: In this paper, a pattern defect detection system for an integrated semiconductor circuit or the like, utilizing the phenomenon that in the case of a test pattern having regularity, the intensity of diffracted light appearing on a back-focal plane of a lens is high, while defects or foreign matters not having a regularity are low in the intensity.

TL;DR: A single channel queueing system with Poisson arrivals and exponential service in batches of fixed size b ( ≥ 1) and the steady state solutions as well as the average queue length have been obtained explicitly.

TL;DR: In this paper, the reliability of complex repairable systems is characterized by time dependent rate of occurence of failures and the corresponding mathematical model is the nonhomogeneous Poisson process.

TL;DR: This paper presents a simple and accurate approximation that has computational complexity that is O(n) with O(1) storage requirements and makes use of several well known relations for IFR renewal functions.

TL;DR: In this article, the regenerative point technique in the Markov renewal process is applied to a redundant system with two types of spare units, a warm standby unit for instantaneous replacement of a failed operative unit and a cold standby which takes a random amount of time to become operative/warm.

TL;DR: Reliability and availability analysis of a n-unit parallel system with common-cause failures and human errors with Laplace transforms of state probabilities, system availability, and reliability is presented.