Showing papers in "Microelectronics Reliability in 1995"

TL;DR: In this article, the effects of border traps (near-interfacial oxide traps that can communicate with the underlying Si over a wide range of time scales) on the response of metal-oxide-semiconductor (MOS) devices to ionizing radiation are investigated.

TL;DR: A new simple algorithm to determine all minimal paths between specified single terminal pair of arbitrary graphs or to determineall minimal cuts when the graph is planar is presented.

TL;DR: A review of the possibility of using noise measurements in analysis and prediction of electron device reliability is given in this paper, where the noise as an informative parameter for device reliability and its advantages and disadvantages are discussed.

TL;DR: In this article, the optimal operation of a single removable and non-reliable server in a Markovian queueing system under steady-state conditions is studied, where the server can be turned on at arrival epochs or off at departure epochs.

TL;DR: The fundamental calculation formulas of fuzzy reliability are developed and the fuzzy reliability models of unrepairable systems are established.

TL;DR: In this paper, the role of failure analysis is discussed, common and new techniques and tools are reviewed, and oppurtunities for the future are considered, as well as a review of existing tools and techniques.

TL;DR: In this article, the authors present an information system for registration and analysis of so-called near misses (or: near accidents) in the chemical process industry, which can enhance industrial safety and reliability by applying cognitive psychological models of human behaviour as the basis of safety management tool.

TL;DR: This paper discusses posbist reliability behaviour of fault-tolerant systems, including cold redundant systems and warm redundant systems, and expresses the system posbists reliability in terms of a system lifetime.

TL;DR: This paper develops an SRGM which takes care of the underlying error dependency in a software system and has the built-in flexibility and has been tested on real software error data to show its applicability.

TL;DR: In this article, a detailed analysis of gamma-irradiation induced degradation of threshold voltage and gain factor in power VDMOSFETs, as well as the underlying changes in gate oxide charge and interface trap densities, is presented.

TL;DR: Bayesian prediction bounds are obtained for the future observations from the Burr type X distribution in the presence of outliers.

TL;DR: In this paper, the role of temperature in achieving cost-effective reliability electronic equipment has been investigated based on failure mechanisms and electrical parameter variations, and a methodology for derivation of the functional relationship between temperature and microelectronic reliability has been discussed.

TL;DR: A parametric investigation is performed which provides numerical results to show the effects of various system parameters to the system reliability.

TL;DR: In this article, the economic behavior of a removable server in the N policy M/E k /1 queueing system with finite capacity is analyzed. But the authors focus on the case where the number of customers in the system is fixed.

TL;DR: In this article, the approach to introduce Probabilistic Safety Assessment (PSA) which incorporates these reliability methods into wind turbine engineering is described, by means of two recent case studies, the applicability, benefits, and limitations of these methods are illustrated.

TL;DR: In this article, the authors suggest a periodic inspection of a storage system with two kinds of units where unit 1 is inspected and maintained at each inspection, however, unit 2 is not done.

TL;DR: In this paper, a two-unit warm standby system with a single repair facility is considered, where the repair facility was subjected to random breakdown and was restored after a random time.

TL;DR: In this paper, the pointwise availability, steady state availability, MTTF and variance of the time to failure of 3 state, 1-out-of-2 unit systems with cold standby, under common cause and human failures.

TL;DR: From an analysis of present trends, it is concluded not only that more applications can be expected, but that also more application oriented research needs to be done.

TL;DR: This paper compares availability assessment methods for continuous production systems in a design phase based on a literature search, analytical considerations and on practical experience with the methods and the tools.

TL;DR: In this paper, the authors proposed some network reduction techniques applicable to the structures which could not be handled by the existing polygon-to-chain reduction techniques and derived the relationship between the reliabilities of the original graph and the reduced graphs.

TL;DR: This method can be used for systems described by possibility measures and considered the problem for different systems including systems with switching devices, computer systems with autonomous storage batteries.

TL;DR: In this paper, a two-unit standby system is considered under excess time stochastic behaviour, i.e., the failure and repair time of the on line (off line) unit is exceeding some prespecified value.

TL;DR: In this article, the effects of heavy ion irradiation on gate oxide reliability in power MOSFETs were explored and it was shown that heavy ion exposure does not result in a significant reduction in oxide reliability, but the gate voltage at which oxide breakdown occurs and the gate I-V curves suggest subtle changes in device characteristics that can be detected at high gate biases.

TL;DR: In this paper, a simple percentile method is used to estimate the two parameters of the two-parameter Weibull distribution and computer simulation is employed to compare the proposed method with the maximum likelihood estimation and graphical methods results.

TL;DR: In this article, reliability and availability analysis of having k active, N cold standby units with repair facilities and multiple noncritical and critical errors while the switching mechanism is subjected to failure is presented.

TL;DR: In this paper, the cost analysis of a one-unit repairable system subject to on-line preventive maintenance (PM) and/or repair is dealt with, and the explicit expression for the expected total cost incurred on the system in a specified time interval is obtained by considering the expected busy period of the server spent on inspection, associated with PM, on PM work, on inspection and on repair work, carried out in a given interval of time.

TL;DR: This article contains a simplified method, almost fool-proof, for selection of the appropriate SPC chart.

TL;DR: In this paper, a modified M/M/R machine repair problem of M operating units with two types of spares, and R servers in the repair facility under steady-state conditions is considered.

TL;DR: In this paper, the authors solve three reliability optimization problems for repairable systems with arbitrary distributed times to unit failure and to unit repair, and find the allocation of redundant units and repairmen.