Showing papers in "Microelectronics Reliability in 1996"

TL;DR: In this paper, two different time-series models generated using different available wind data are used to illustrate these models, and the proposed wind models satisfy the basic statistical tests and preserve the high-order auto-correlation, seasonal property and diurnal distributions of the actual wind speed.

TL;DR: In this article, the authors review the hot-carrier effects and reliability problem in MOSFETs, and the mechanisms that produce the substrate and gate current are discussed.

TL;DR: In this article, the authors presented the methodology for obtaining point and interval estimates of the parameters of the Burr Type XII distribution with multiple-censored and singly censored data (Type I censoring or Type II censoring) using the maximum likelihood method.

TL;DR: The use of the exponential distribution is frequently preferred over mathematically more complex distributions, such as the Weibull and the lognormal among others, suggests that most engineers favour the application of simpler models to obtain failure rates and reliability figures quickly.

TL;DR: In this paper, failure failures induced on analog integrated circuits by electromagnetic interference (EMI) were analyzed with particular emphasis on integrated operational amplifiers built with different technologies. And the correlation found between EMI susceptibility and large-signal opamp behavior was discussed.

TL;DR: In this article, the reliability analysis of the powerloom plant with a cold standby for its strategic unit has been discussed and the common cause failure and critical human errors have also been considered to avoid overestimation of the reliability.

TL;DR: In this paper, the dependence of the deposition rates versus the beam parameters for both, ion beam and electron beam induced deposition were investigated and compared with each other, and a more precise consideration of the influence of secondary electrons on the deposition process was accomplished.

TL;DR: In this paper, the behavioural analysis for shell gasification and carbon recovery process in a urea fertilizer plant is discussed, where the system consists of three subsystems D, E and F arranged in series, with three possible states good, reduced and failed.

TL;DR: A process map is a visual aid for picturing work processes which shows how inputs and tasks are linked as mentioned in this paper and prompts new thinking about how work is done, and alerts one to areas in which a change in processes will have the greatest impact on improving quality.

TL;DR: In this paper, five different series system configurations with standby units are compared based on their overall reliability and availability, where the time-to-failure of a component and its repair time are assumed to have the negative exponential distribution.

TL;DR: In this paper, the reliability of a linear m-consecutive k-out-of-n :F system was studied in terms of multinomial and binomial coefficients, respectively.

TL;DR: A model is developed which can describe imperfect debugging process and has the inbuilt flexibility of capturing a wide class of growth curves and is shown to be applicable on several data sets obtained from different software development projects.

TL;DR: In this article, it is shown that voiding failure is identical in both contacts and vias and is independent of the structure (i.e. with or without W - plugs).

TL;DR: A tree-structured system with multistate components consists of a certain number of components which are arranged in a tree structure and are capable of receiving and sending a signal.

TL;DR: In this paper, the microDAC method is used to measure deformation fields on packaging components under mechanical and thermal load to analyse actual material behavior. But the method is not suitable for the analysis of finite element simulations.

TL;DR: In this paper, the authors developed a mathematical model for determining a periodic inspection schedule in a preventive maintenance program for a single machine subject to random failure, and formulated the problem as a profit maximization model with general failure time distribution.

TL;DR: In this article, the degradation of thin gate oxide is described as the continuous generation of electron traps, until a critical electron trap density is reached, corresponding to the formation of a breakdown path.

TL;DR: This paper formulate the building membership functions of component reliability based on the α-cut method and proposes some fuzzy mathematic models for solving fuzzy system reliability in an unrepairable system and in a repairable system.

TL;DR: In this paper, micro-Raman spectroscopy offers a unique tool for the validation of stress models for microelectronics devices, starting from an analytical or numerical model that describes the variation of local stress in a device, the corresponding Raman shift is calculated and compared with the data.

TL;DR: In this article, a new ESD protection method is proposed to rescue this internal gate-oxide damage by adding ESD-protection devices on the long metal line between digital-analog interfaces.

TL;DR: In this paper, the authors proposed a method to evaluate the reliability of a hydraulic truck crane model with the field data by the fuzzy sets theory, and demonstrated the effectiveness of the method through an example.

TL;DR: In this article, clear relations have been established between E-sort yield and bum-in, EFR and field failure rates for nearly 50 million high volume products in bipolar, CMOS and BICMOS technologies from different waferfabs.

TL;DR: In this article, the availability analysis of a system composed of a robot and its associated safety system is presented, where the failed robot system is repairable and the associated repair rates could be constant or non-constant.

TL;DR: In this article, a lack of correlation between human body model ESD testers conforming to current standards and transmission line pulsing (TLP) was observed and the influence of the initial 5% 40% risetime of TLP testers on the failure thresholds and failure signatures of transistors with single and multiple fingers was demonstrated.

TL;DR: In this paper, the authors illustrate how binary decision diagrams can be exploited for determining terminal reliability of networks, and demonstrate how to use binary decision diagram for the purpose of network reliability determination.

TL;DR: In this article, the estimators of CPMk and its asymptotic distribution are presented and the two-sided confidence interval for Cpmk based on a percentile-t bootstrap method is derived.

TL;DR: In this article, experimental results from stressing Schottky diodes and HBTs employing TLP (Transmission Line Pulses) with 100ns duration time and ESD pulses following the Human Body Model are compared.

TL;DR: A solution method for the nonlinear integer programming refined from the optimal allocation of redundant components, which optimal solution has been proved in the bound region of the problem is proposed.

TL;DR: The paper gives the origins of AIC and discusses the main properties of this measure when it is applied to continuous and discrete models, illustrating that AIC is not a measure of informativity because it fails to have some expected properties of information measures.

TL;DR: In this article, a linear consecutive-2-out-of-n:F repairable system is studied, where the working time and repair time of each component are both exponentially distributed, and each component after repair is as good as new.