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Showing papers in "Physica Status Solidi (a) in 1987"


Journal ArticleDOI
TL;DR: In this article, the study of thermal vacancy formation in pure metals by positron annihilation and the determination of vacancy formation enthalpies is reviewed with particular emphasis to the potential of positron lifetime spectroscopy.
Abstract: The study of thermal vacancy formation in pure metals by positron annihilation and the determination of vacancy formation enthalpies is reviewed with particular emphasis to the potential of positron lifetime spectroscopy. The investigation of high-temperature vacancy migration by positron annihilation in pulse-heating experiments is outlined and first results are reported. Es wird ein Uberblick gegeben uber die Untersuchung von Leerstellen im thermischen Gleichgewicht in reinen Metallen mit Hilfe der Positronenzerstrahlung und uber die dabei gewonnenen Resultate der Leerstellenbildungsenthalpie. Hierbei wird insbesondere auf die spezifischen Moglichkeiten der Positronlebensdauerspektroskopie hingewiesen. Es wird zudem uber die Ergebnisse von Messungen der Positronenzerstrahlung in schnellen Aufheizexperimenten berichtet, mit denen die Leerstellenwanderung bei hohen Temperaturen untersucht werden kann.

286 citations


Journal ArticleDOI
TL;DR: In this paper, the superconducting transition temperature in the compound Ba2YCu3O7−δ exhibits a positive correlation with the magnitude of the volume fraction of the orthorhombic phase in two-phase material, showing that this phase is responsible for the high transition temperature (>90 K.
Abstract: The superconducting transition temperature in the compound Ba2YCu3O7–δ exhibits a positive correlation with the magnitude of the volume fraction of the orthorhombic phase in two-phase material, showing that this phase is responsible for the high transition temperature (>90 K). It cannot be excluded that the low temperature tetragonal phase is also superconducting with a lower transition temperature. The orthorhombic phase is fragmented in fine coherent twin lammellae parallel with (110) and (110) planes; they result from the decrease in symmetry 4/mmm → mmm on cooling through the high temperature tetragonal (TH) → orthorhombic (O). The orthorhombic phase can be transformed back into the high temperature tetragonal phase by “in-situ” heating in the electron microscope. This reversible phase transformation takes place at a temperature of the order of 750 °C, where the vacancies on the oxygen sublattice become disordered. In well annealed specimens weak superstructure spots are sometimes observed at 1/2 0 0 and 0 1/2 0 positions; they are attributed to a 2a0 × b0 superstructure resulting from vacancy ordering. Weak streaking along [001]* is attributed to disordering in the direction of vacancy ordering in successive CuO planes. The high temperature tetragonal phase can be retained on fast cooling. The high resolution images of the orthorhombic phase along the [100], [001] and [010] zones are consistent with the crystal structure of Ba2YCu3O7–δ proposed recently. Evidence is presented for the occurrence of disorder in the cation sublattice. In rapidly cooled specimens the cation disorder causes lattice deformation.

131 citations


Journal ArticleDOI
TL;DR: In this article, the lifetime of positrons in metals, whether free or trapped in vacancy-type defects, possesses an upper limit of τ∞ ≈ 500 ps, corresponding to the "low-density limit" of e+ annihilation in an electron gas.
Abstract: The insight that the lifetime of positrons in metals, whether “free” or trapped in vacancy-type defects, possesses an upper limit of τ∞ ≈ 500 ps, corresponding to the “low-density limit” of e+ annihilation in an electron gas, is used to derive empirical rules for both the bulk lifetime and the lifetime of monovacancy-trapped e+ from a comprehensive collection of experimentally determined e+ lifetimes. The predictive power of these rules allows us to understand why it has not yet been possible to observe positron trapping by vacancies in the alkali metals. Als Folge der Begrenzung der Zerstrahlungsrate von Positronen in einem Elektronengas geringer Dichte kann die Lebensdauer von Positronen in einem Metal nicht hoher als τ∞ ≈ 500 ps sein, und zwar unabhangig davon, ob die Positronen „frei” oder in Leerstellen eingefangen sind. Diese Erkenntnis wird dazu benutzt, um aus einer Zusammenstellung der experimentell bestimmten Positronenlebensdauern in Metallen und Elementhalbleitern empirische Gesetzmasigkeiten uber die Lebensdauer von Positronen sowohl im „freien” als auch im eingefangenen Zustand abzuleiten. Ihre Anwendung auf Alkali-Metalle erklart, weshalb bisher ein Positroneneinfang durch Leerstellen in diesen Metallen nicht beobachtet worden ist.

94 citations


Journal ArticleDOI
TL;DR: In this paper, a detailed model of the long-range internal stress field in the channels of the wall structure of persistent slip bands (PSBs) is developed, which is shown to be in good accord with the available experimental data.
Abstract: A detailed model of the long-range internal stress field in the channels of the wall structure of persistent slip bands (PSBs) is developed. It is proposed that the long-range internal stress field consists of a (constant) back stress and an internal forward stress which varies in space and increases from the centre of the channels to the walls. The physical origin of the internal stress field is seen in the constrained configuration of the moving glide dislocations in the channels. The (athermal) cyclic flow stress of PSBs is then expressed easily in terms of the so-called composite model. The proposed model is shown to be in good accord with the available experimental data. A critical assessment of the model in relation to the observed scatter of the local stress data leads to the conclusion that the scatter is due partly to the error of the measurements and to the other part due to real fluctuations. Es wird ein detailliertes Modell des weitreichenden inneren Spannungsfeldes in den Kanalen der Wandstruktur persistenter Gleitbander (PGB) entwickelt. Dabei wird vorgeschlagen, das das weitreichende innere Spannungsfeld sich aus einer (konstanten) Ruckspannung zusammensetzt und aus einer inneren Vorwartsspannung, die raumlich variiert und von der Mitte der Kanale zu den Wanden hin zanimmt. Die Zwangsform der bewegten Gleitversetzungen in den Kanalen wird dabei als physikalische Ursache des inneren Spannungsfeldes betrachtet. Die (athermische) zyklische Fliesspannung der PGB last sich leicht im Rahmen des sogenannten Verbundmodells darstellen. Es wird gezeigt, das das vorgeschlagene Modell in guter Ubereinstimmung mit den vorliegenden experimentellen Daten ist. Aus einer kritischen Betrachtung des Modells bezuglich der beobachteten Streuung der Daten der lokalen Spannung wird geschlossen, das diese Streuung zu einem Teil auf Mesfehler und zum anderen Teil auf tatsachliche Schwankungen zuruckzufuhren ist.

90 citations



Journal ArticleDOI
TL;DR: In this article, the spectra of luminescence and photoexcitation as well as emission decay kinetics in various parts of spectra are investigated in ZnWO4 and CdWO 4 crystals in a wide temperature range (4.2 to 300 K).
Abstract: The spectra of luminescence and photoexcitation as well as emission decay kinetics in various parts of spectra are investigated in ZnWO4 and CdWO4 crystals in a wide temperature range (4.2 to 300 K). The bands of red afterglow and of rapidly decaying violet luminescence are observed for the first time. The likeness of the emission properties of ZnWO4 and CdWO4 allows the explanation of the luminescence in these tungstenite type crystals in terms of configurational coordinate diagrams of self-activated radiation centre and of self-trapped exciton. [Russian Text Ignored].

81 citations


Journal ArticleDOI
M. Werner1
TL;DR: In this article, the authors measured the temperature dependence of the cyclic flow stress of ultrapure tantalum single crystals (RRR ⪆ 14000) and extended the results to lower temperatures.
Abstract: Measurements of the temperature dependence of the cyclic flow stress of ultrapure tantalum single crystals (RRR ⪆ 14000) are extended to lower temperatures. After cyclic deformation well into saturation at 400 K, the temperature dependence of the flow stress is measured between 80 and 460 K at five different plastic resolved shear-strain rates, e, in the range 2 × 10−5 to 6 × 10−3 s−1. Below a critical temperature Tk the flow stress is dominantly controlled by the mobility of screw dislocations. A recent theory of Seeger describes the “thermal” component, σ*, of the flow stress (resolved shear stress) in the temperature and stress regime where the strain rate is determined by the formation and migration of kink pairs. The analytical expressions are valid in well-defined ranges of stress and temperature. The evaluation of the experimental data yields a value for the formation enthalpy of two isolated kinks 2Hk = 0.98 eV. From the low-stress (σ* < 10 MPa) data at higher temperatures the diffusion coefficient of kinks is evaluated as Dk = 2.0 × 10−6 m2 s−1. The product of the density of mobile screw dislocations and the distance between insurmountable obstacles is found to be 2 × 10−5 m−1. The stress dependence of the kink-pair formation enthalpy Hkp follows the theoretically predicted curve in the elastic-interaction stress regime. At the transition to the line-tension approximation (near σ* ≈ 80 MPa) the activation volume increases rather abruptly. Moreover, the quantitative analysis involves kinks other than those of minimum height. The most likely candidates are kinks on {211} planes.

79 citations


Journal ArticleDOI
TL;DR: In this article, a detailed review is presented encompassing lifetime results for vacancy agglomerates, high-temperature equilibrium measurements (undoped and P-doped) and oxygen in silicon.
Abstract: During the last few years wide interest is generated in applying the positron annihilation techniques to defects in semiconductors. Since defects in semiconductors are, in many regards, dissimilar to defects in metals one must expect that new responses from positrons will emerge not normally associated with metals. One such important effect would be the charged state of a defect in a semiconductor. At the present time silicon is the semiconductor which has been investigated mostly, but the important III–V GaAs compound semiconductor is currently also under intensive investigations. For the case of silicon a detailed review will be presented encompassing lifetime results for vacancy agglomerates, high-temperature equilibrium measurements (undoped and P-doped) and oxygen in silicon. Furthermore, indications for the temperature variation of the bulk lifetime and its possible variation with doping levels will also be discussed. Wahrend der vergangenen Jahre konnte einiges Interesse an der Anwendung der Positronen-annihilationstechnik auf Defekte in Halbleitern geweckt werden. Da Defekte in Halbleitern in vielerlei Hinsicht unterschiedlich zu Defekten in Metallen sind, mus man erwarten, das man neue„Antworten” Von Positronen erhalt, die man mit Metallen nicht verbinden wurde. Einer jener wichtigen Effekte ist der Ladungszustand eines Defektes in einem Halbleiter. Zur Zeit ist Silizium der am haufigsten untersuchte Halbleiter, doch wird auch am wichtigen III–V-Verbindungshalb-leiter GaAs intensiv Forschung betrieben. Es wird em detaillierter Uberblick gegeben hinsichtlich des Silizium; er umfast Lebensdauerresultate fur Leerstellenagglomerate, Hochtemperaturmessungen im thermischen Gleichgewicht (fur undotiertes und P-dotiertes Si) und Sauerstoff in Silizium. Weiter werden Hinweise auf eine Abhangigkeit der Lebensdauer im defektfreien Kristall Von der Temperatur und moglicherweise vom Dotierungsgehalt diskutiert.

74 citations


Journal ArticleDOI
TL;DR: In this paper, triple crystal diffraction curves are obtained from each sample with the parallel (n, n, n) configuration by measuring the internsity of the main peak as a function of the angular position of the specimen.
Abstract: Interstitial perfect dislocation loops are generated in silicon by high dose silicon ion implantation and furnace annealing in the range 700 to 1000 °C. Triple crystal diffraction curves are obtained from each sample with the parallel (n,–n, n) configuration by measuring the internsity of the main peak as a function of the angular position of the specimen. This procedure allows to make the contribution of Huang diffuse scattering given by the loops to the dynamically diffracted intensity negligible and the sensitivity to lattice distortion higher than in double crystal diffraction case. The truple crystal diffraction curves are simlutatd by computer through application of the dynamical theory of diffraction frojm imperfect crystals. The depth profiles of lattice strain and static atomic disorder are determined. A simple model is used relating these two parameters to the mean radius and surface concentration of the loops. Tthe temperature evolution of size and density of these defects is therefore obtained and compared with the one directly derved by transmission electron microscopy images. The good agreement shown by this comparison ndicates the validity of the model applied and the effectiveness of triple crystal diffraction in the analysis of defects producing Huang scattering. Perfekte interstitielle Versetzungsloops werden in Silizium durch Hochdosisimplantation von Silizium und Ofentemperung im Bereich von 700 bis 1000 °C erzeugt. Drei-Kristall-Beugungs kurven werden von jeder Probe mit paraller(n,–n, n)-Konfiguration durch Messen der Intensitat des Hauptmaximums in Abhangigkeit von der Winkelposition der Probe erhalten. Dieses Verfahren erlaubt, den Beitrah der diffusen Hung-Streuung zur dynsmisch gestreuten Intensitat der Loops verachlassigbar und die Empfindlichkeit gegenuber Vitterverzerrungen hoher als bei Doppel-Kristallbeugung zu machen. Die Drei-Kristallbeugungskurven werden mittels Computer durch die Anwendung der dynamischen Theorie der Beugung von imperfekten Kristallen simulliert. Die Tiefenprofile der Gitterspannung und der statischen atomaren Fehlordnung werden bestimmt. Ein einfaches Modell wird benutzt, das diese beiden Parameter mit dem mittleren Rakius und der Flachenkonzentration der Loops verknupft. Die Tempeaturentwicklung der Grose und Dichte dieser Defekte wird so erhalten und mit den direkt aus Elektronentransmissionsmikroskopabbildungen a bageleiteten verglichen. Die bei diesem Vergleich erhaltene gute ubereinstimung zeigt die Zuverlassigkeit des benutzten Modells und die Effektivitat der Dreikristallbeungung bei der Analyse der Defekte, die starke Huangstreuung hervorrufen.

65 citations


Journal ArticleDOI
TL;DR: In this paper, the adiabatic stiffness constants Cik of four nickel-base alloys are determined in the temperature range 90 to 360 K: stochimetrisches Ni3Al, γ′-105, Ni3-PE16, NIMONIC 105.
Abstract: The adiabatic stiffness constants Cik of four nickel-base alloys are determined in the temperature range 90 to 360 K: stoichiometric Ni3Al, γ′-105, γ′-PE16, NIMONIC 105. γ′-105 and γ′-PE16 are the γ-phases in the commercial superalloys NIMONIC 105 and NIMONIC PE16, respectively. The intermetallic compounds Ni3Al, γ′-105, and γ′-PE16 have the Ll2-crystal structure. The stiffness Cik is derived from the velocities at which ultrasonic pulses propagate along 〈110〉 directions in single crystals. The room-temperature stiffnes of Ni3Al is in excellent agreement with that published by Kayser and Stassis. For all four alloys the dislocation line energies and tensions of edge and screw dislocations are calculated within the framework of anisotropic theory of elasticity. Die adiabatischen elastischen Moduln Cik von vier Nickel-Basis-Legierungen werden im Temperaturbereich 90 bis 360 K bestimmt: stochimetrisches Ni3Al, γ′-105, γ′-PE16, NIMONIC 105. γ′-105 und γ′-PE16 sind die γ′-Phasen in den kommerziellen Superlegierungen NIMONIC 105 bzw. NIMONIC PE16. Die intermetallischen Verbindungen Ni3Al, γ′-105 und γ′-PE16 haben die Ll2-Kristallstruktur. Die Konstanten Cik werden aus den Geschwindigkeiten berechnet, mit denen sich Ultraschallimpulse langs 〈110〉-Richtungen ausbreiten. Bei Raumtemperatur stimmen die gefundenen Konstanten sehr gut mit den von Kayser und Stassis publizierten uberein. Fur alle vier Legierungen werden die Versetzungslinienenergien und -spannungen im Rahmen linearer, anisotroper Elastizitatstheorie berechnet.

64 citations


Journal ArticleDOI
TL;DR: In this paper, a theoretical approach in impurity solubility calculations for semiconductor crystals is developed and the steady-state solubilities of boron, phosphorus, arsenic, and antimony in silicon at 900 to 1200 °C are investigated and compared to the previously published values.
Abstract: A theoretical approach in impurity solubility calculations for semiconductor crystals is developed. The steady-state solubility of boron, phosphorus, arsenic, and antimony in silicon at 900 to 1200 °C is experimentally investigated and compared to the previously published values. Thermodynamic parameters related to impurity interaction in silicon matrix are derived from the correct experimental data. [Russian Text Ignored].

Journal ArticleDOI
TL;DR: Positron lifetime measurements in polyethylene were performed in the temperature range between −195 and +40 °C, and the lifetime spectra were resolved into four components, and corresponding annihilation mechanisms were discussed.
Abstract: Positron lifetime measurements are performed in branched polyethylene in the temperature range between −195 and +40 °C. The lifetime spectra are resolved into four components, and corresponding annihilation mechanisms are discussed. Within the temperature range mentioned above four different transitions at −145, −95, −58, and −13 °C can be observed. From the behaviour of the lifetime parameters of the longest-lived component it is possible to deduce a criterion for the glass transition, which is situated at −13 °C. Additionally, time effects of the lifetime parameters are detected. Positronen-Lebensdauermessungen in verzweigtem Polyathylen werden im Temperaturbereich von −195 bis +40 °C durchgefuhrt. Die Lebensdauerspektren werden in vier Komponenten aufgelost und entsprechenden Annihilationsmechanismen zugeordnet. Innerhalb des untersuchten Temperaturbereiches konnen vier verschiedene Ubergange bei −145, −95, −58 und −13 °C nachgewiesen werden. Aus dem Verhalten der Lebensdauerparameter der langsten Komponente ist es moglich ein Kriterium fur den Glasubergang, der in diesem Material bei −13 °C liegt, abzuleiten. Daruber hinaus werden zeitliche Effekte der Lebensdauerparameter nachgewiesen.

Journal ArticleDOI
TL;DR: In this article, a three-dimensional polymeric solid with interbonded layers was found to have unusual photoelectrochemical and solid state properties, and the methods of preparation of p- and n-type films of β-CuCNS and their photoelectroncysmochromatic and solid-state properties were discussed.
Abstract: β-CuCNS, a three-dimensional polymeric solid with interbonded layers is found to have unusual photoelectrochemical and solid state properties. The material becomes p- or n-type depending on whether CNS or Cu in stoichiometric excess. The n-type is found to be sensitive to the visible spectrum. The methods of preparation of p- and n-type films of β-CuCNS and their photoelectrochemical and solid state properties are discussed.


Journal ArticleDOI
TL;DR: Positron annihilation characteristics are used to find out the number and size of defects (elementary free volume) in some polymers considered as nonhomogeneous systems in this paper, and the results obtained enable to understand some physico-chemical proporties of these materials.
Abstract: Positron annihilation characteristics are used to find out the number and size of defects (elementary free volume) in some polymers considered as nonhomogeneous systems. The results obtained enable to understand some physico-chemical proporties of these materials.

Journal ArticleDOI
TL;DR: In this article, a general theory of this thermal fixing process is developed and applied to LiNbO3:Cu, where charge transport by the photovoltaic effect, by drift in a space charge field and by diffusion is taken into account.
Abstract: Volume phase holograms in an electrooptic crystal like LiNbO3 must be fixed so that they are not destroyed upon reading. By heating up the crystal mobilized ions may partially compensate the electronic space charge field, and a subsequent development procedure fixes the hologram. A general theory of this thermal fixing process is developed and applied to LiNbO3:Cu. Charge transport by the photovoltaic effect, by drift in a space charge field and by diffusion is taken into account. It is unlikely that mobile protons alone are responsible for the fixing effect. Volumenphasenhologramme in einem elektrooptischen Kristall wie LiNbO3 mussen fixiert werden, so das sie nach dem Lesen nicht zerstort werden. Die durch Aufheizen der Kristalle mobilisierten Ionen konnen partiell das elektronische Raumladungsfeld kompensieren und ein darauffolgendes Entwicklungsverfahren fixiert das Hologramm. Eine allgemeine Theorie dieses thermischen Fixierungsprozesses wird aufgestellt und auf LiNbO3:Cu angewendet. Ladungstransport durch den photovoltaischen Effekt, durch Drift in einem Raumladungsfeld und durch Diffusion werden berucksichtigt. Es ist unwahrscheinlich, das bewegliche Protonen allein fur den Fixierungseffekt verantwortlich sind.


Journal ArticleDOI
TL;DR: In this article, it is shown that the considerable majority of actually occurring dislocation structures are LEDS, i.e., structures in which the energy per unit length of participating dislocations is minimized through mutual stress screening.
Abstract: LEDS is the acronym for low-energy dislocation structures. LEDS are those structures in which the energy per unit length of participating dislocations is minimized through mutual stress-screening. They are characterized by the (virtual) absence of long-range stresses and by an alternation between areas with high and low dislocation densities. By means of a number of examples it is shown that the considerable majority of actually occurring dislocation structures are LEDS.


Journal ArticleDOI
TL;DR: In this article, the authors investigated the properties of the main deep electron trapping center found in Si-doped In0.52Al0.48As grown on Sn-Doped InP substrates using molecular beam epitaxy and determined the thermal activation energy and photoionization energy of this center to be 0.54 and 0.95 eV, respectively.
Abstract: The properties are investigated of the main deep electron trapping center found in Si-doped In0.52Al0.48As grown on Sn-doped InP substrates using molecular beam epitaxy. Thermal activation energy and photoionization energy of this center are determined to be 0.54 and 0.95 eV, respectively. A correlation between trap concentration and Si doping concentration, the existence of weak persistent photoconductivity, and a small capture barrier height (far less than 0.1 eV) are revealed. These results suggest that this center can be regarded as a kind of DX center, which should be depicted as a state with large lattice relaxation using a configuration coordinate diagram. Es werden die Eigenschaften des in Si-dotiertem In0.52Al0.48As vorwiegend gefundenen tiefen Elektronenhaftzentrums untersucht, wobei die Proben mittels Molekularstrahlepitaxie auf Sndotierten InP-Substraten hergestellt werden. Thermische Aktivierungsenergie und Photoionisationsenergie dieses Zentrums werden zu 0,54 bzw. 0,95 eV bestimmt. Eine Korrelation zwischen Haftstellenkonzentration und Si-Dotierungskonzentration, die Existenz von schwacher, persistenter Photoleitung und eine geringe Einfangbarrierenhoe (weit unter 0,1 eV) werden gefunden. Diese Ergebnisse weisen darauf hin, das dieses Zentrum als eine Art von DX-Zentrum angesehen werden kann, das als Zustand mit groser Gitterrelaxation mit einem Konfigurationskoordinatendiagramm beschrieben werden kann.

Journal ArticleDOI
TL;DR: In this paper, the photovoltaic properties of InxSe1−x thin films obtained by flash evaporation are studied, and Hall measurements as function of the temperature show that the predominant scattering mechanism is the scattering by the grain boundaries.
Abstract: Electrical and photovoltaic properties of InxSe1−x thin films obtained by flash evaporation are studied. The annealing temperature effect is also investigated. Hall measurements as function of the temperature show that the predominant scattering mechanism is the scattering by the grain boundaries. Parameters for the photoexcited carriers are given, and the photovoltaic effect is observed on a SnO2/InxSe1−x/Ag structure in thin films. Les proprietes electriques et photovoltaiques de couches minces d'InxSe1−x obtenues par evaporation flash ont ete etudiees, ainsi que l'effet de la temperature de recuit. Les mesures d'effet Hall en fonction de la temperature ont montre que le mecanisme dominant est dǔ a la diffusion par les joints de grains. Les parametres des porteurs photoexcites sont donnes et l'effet photovoltaique a ete observe sur une structure en couches minces SnO2InxSe1−x/Ag.

Journal ArticleDOI
Wang Yening1, Sun Wenyuan1, Chen Xiaohua1, Shen Huimin1, Lu Baosheng1 
TL;DR: In this article, an internal friction peak (P1) is measured at 5 and 50 kHz without thermal hysteresis near the ferroelastic transition temperature Tc of LNPP single crystal.
Abstract: An internal friction peak (P1) is measured at 5 and 50 kHz without thermal hysteresis near the ferroelastic transition temperature Tc of LNPP single crystal. The mechanism of internal friction due to a second-order transition is suggested. Experimental results show that the density of domain walls, N, in the ferroic phase is proportional approximately to (Tc - T)−1 with a remarkable hysteresis during heating and cooling. The peak P2, which appears at N = (50 ± 10) mm−1 obtained by in situ observation, is attributed to the static hysteresis loss due to the motion of newly appearing domain walls. Applying a small stress during cooling below Tc can freeze domains down to room temperature; as a result, P2 is suppressed and another broad peak (P3) appears at a lower temperature without thermal hysteresis. The peak is ascribed to the “frozen” domain walls. In der Nahe der ferroelastischen Ubergangstemperatur Tc von LNPP-Einkristallen wird ein Maximum der inneren Reibung (P1) bei 5 und 50 kHz ohne thermische Hysteresis gemessen. Ein Mechanismus der inneren Reibung, der auf einem Ubergang zweiter Ordnung beruht, wird angenommen. Die experimentellen Ergebnisse zeigen, das die Dichte der Domanenwande, N in der Ferro-Phase naherungsweise proportional (Tc - T)−1 ist, mit einer betrachtlichen Hysterese wahrend des Heizens und Kuhlens. Das P2-Maximum, das bei N = (50 ± 10) mm−1 auftritt, wie durch in-situ-Beobachtungen festgestellt wird, wird den statischen Hystereseverlusten infolge der Bewegung von neuauftretenden Domanenwanden zugeordnet. Durch Anlegen einer kleinen Spannung wahrend des Abkuhlens unter Tc konnen Domanen bis zu Zimmertemperatur eingefroren werden, im Ergebnis wird P2 unterdruckt und ein anderes breites Maximum P3 tritt bei einer tieferen Temperatur ohne thermische Hysterese auf. Das Maximum wird den „eingefrorenen” Domanenwanden zugeschrieben.

Journal ArticleDOI
TL;DR: In this paper, the Czochralski method was used to grow LaGaGe2O7: Nd3+ single crystals and the full concentration series of Gd1−xNdxGaGe 2O7 crystals.
Abstract: New germanates with the NdAlGe2O7-type structure are synthesized. The Czochralski method is used to grow LaGaGe2O7: Nd3+ single crystals and the full concentration series of Gd1−xNdxGaGe2O7 crystals. The GdGaGe2O7 crystal structure is refined. The absorption–luminescence properties of the grown crystals have been studied. The main intensity parameters of luminescence are determined. The stimulated emission of the crystals including that of self-activated NdGaGe2O7, are excited for two lasing 4F3/2 4I11/2 and 4F3/2 4I13/2 channels, using the conventional lamppumping technique at 300 K. All the observed induced transitions are identified. [Russian Text Ignored].

Journal ArticleDOI
TL;DR: In this article, the problem of deriving hardness from load versus penetration depth curves by the tentative assumption of constant hardness, combined with a simple theoretical mode (evenly loaded square on elastic half-space).
Abstract: It is proposed to approach the problem of deriving hardness from load versus penetration depth curves by the tentative assumption of constant hardness, combined with a simple theoretical mode (evenly loaded square on elastic half-space). This suggests to do three corrections: separating the elastic displacement from the recorded depth, redefining the zero of depth, and discarding an initial section of the penetration curve. Comparison with experiment seems to indicate that the hardness numbers obtained in this way get close to the conventional Vickers (micro)-hardness.

Journal ArticleDOI
TL;DR: The exact origin of the defect levels present in cadmium telluride in the 0.15 to 0.20 eV energy band is under discussion since the beginning of the microscopic characterization of this II-VI semiconductor.
Abstract: The exact origin of the defect levels present in cadmium telluride in the 0.15 to 0.20 eV energy band is under discussion since the beginning of the microscopic characterization of this II–VI semiconductor. Physical defects, residual chemical impurities, and complexes have been successively considered. In this paper, the results are presented of investigations on a large number of crystals grown by THM which are characterized both, by thermally stimulated current (TSC) and photoinduced current transient spectroscopy (PICTS). These materials are grown either undoped, chlorine and copper doped, and some are irradiated by a strong γ-ray source. The concentration of chemical residuals is determined in each case by atomic absorption measurements. It appears that the defects origin is more complicated than generally considered, as will be discussed. Die genaue Ursache der Defektniveaus in Kadmiumtellurid im Energiebereich von 0,15 bis 0,20 eV wird seit Beginn der mikroskopischen Charakterisierung dieses II–VI-Halbleiters diskutiert. Physikalische Defekte, chemische Restverunreinigungen und Komplexe wurden dabei in Betracht gezogen. Es werden die Ergebnisse von Untersuchungen an einer gros en Zahl von THM-gezogenen Kristallen mitgeteilt, die sowohl mittels thermisch stimulierter Strome (TSC) als auch mittels Spektroskopie transienter Photostrome (PICTS) charakterisiert werden. Diese Materialien sind entweder undotiert oder mit Chlor und Kupfer dotiert, und einige werden durch eine starke γ-Strahlenquelle angeregt. Die Konzentration der chemischen Restverunreinigungen wird fur jeden Fall mittels Atomabsorptionsmessungen bestimmt. Es scheint, das der Ursprung der Defekte, wie diskutiert wird, komplizierter ist, als allgemein angenommen wird.

Journal ArticleDOI
D. Brunner1, J. Diehl1
TL;DR: In this article, a method for determining the stress dependence of the activation enthalpy and the preexponential factor in the Arrhenius equation rather directly was developed for high purity α-iron single crystals, where the temperature dependence of flow stress is measured between ≈ 30 and ≈ 380 K by successive tensile deformation steps at different temperatures.
Abstract: On high purity α-iron single crystals the temperature dependence of the flow stress is measured between ≈ 30 and ≈ 380 K by successive (small) tensile deformation steps at different temperatures. Stress-relaxation measurements are carried out in each deformation step. In analysing these measurements a method is developed for determining the stress dependence of the activation enthalpy and the preexponential factor in the Arrhenius equation rather directly. Characteristic differences for three temperature/stress regimes are observed. An hochreinen α-Eisen-Einkristallen wird die Temperaturabhangigkeit der Eliesspannung zwischen ≈ 30 und ≈ 380 K durch (kleine) sukzessive Zugverformungsschritte bei verschiedenen Temperaturen gemessen. Bei jedem Verformungsschritt erfolgt eine Spannungsrelaxationsmessung. Fur die Auswertung dieser Messungen wird ein Verfahren zur direkten Bestimmung der Spannungsabhangigkeit der Aktivierungsenthalpie und des praexponentiellen Faktors der Arrheniusgleichung entwickelt. Charakteristische Unterschiede fur drei verschiedene Temperatur- bzw. Spannungsbereiche werden festgestellt.

Journal ArticleDOI
TL;DR: In this article, the rosette dislocations generated by micro-indentation of the (001) surface of semi-insulating or n-doped GaAs are studied by TEM.
Abstract: The rosette dislocations generated, at room temperature, by micro-indentation of the (001) surface of semi-insulating or n-doped GaAs are studied by TEM. The [110] rosette arms contain perfect α-dislocations: they are prismatic dislocation half-loops moving on the glide prisms formed by the (111) and (111) planes. The [110] rosette arms correspond to the propagation of partial β-dislocations, leading to the formation of mechanical microtwins on the (111) and (111) planes. All the twinning dislocations are of the 30° (β) type and this is consistent with the lower mobility of this type of partial dislocation. Des cristaux de GaAs semi-isolant ou dope n ont ete indentes a temperature ambiante sur une face (001). Les rosettes de dislocations ainsi creees ont ete etudiees par microscopie electronique en transmission. Les branches de rosette paralleles a la direction [110] sont composees de dislocations parfaites α: il s'agit de demi-boucles de dislocations prismatiques qui ont glisse sur les plans (111) et (111). Les branches de rosette paralleles a la direction [110] correspondent au glissement de dislocations partielles β, glissement qui conduit a la formation de macles mecaniques sur les plans (111) et (111). Toutes les dislocations de macle observees sont du type 30° (β) et ceci est bien en accord avec une mobilite plus faibie des dislocations partielles de ce type.

Journal ArticleDOI
TL;DR: In this article, X-ray rocking curves of the Bragg reflexion g = {200} are measured on [001]-orientated Cu single crystals deformed in tension at room temperature up to resolved shear stresses between 26.2 and 75.6 MPa.
Abstract: X-ray rocking curves of the Bragg reflexion g = {200} are measured on [001]-orientated Cu single crystals deformed in tension at room temperature up to resolved shear stresses between 26.2 and 75.6 MPa. Forg= (200) and (020) the rocking-curve half widths δβ(ϕ) (the azimuth ϕ denotes the state of rotation of the specimen around g) revealed a strong ϕ-dependence, whereas for g = (002) the half width δβ(ϕ) is constant and is equal to the maximum of δβ(ϕ) in the case of g = (200) or (020), respectively. It is shown that this ϕ-dependence of δβ and the fact that the tensile axis [001] remains remarkably stable under deformation can only be understood in terms of local violations of the fourfold symmetry of the slip geometry on a microscopic scale but pre- serving the fourfold symmetry on a macroscopic scale. Dislocation reaction models are presented by which the experimental data can be explained and which lead to the conclusion that the resolved shear strain in the eight slip systems with Schmid factor ≠ 0 may deviate locally from the average by not more than about 1%. Es werden die Rontgen-Rockingkurven der Bragg-Reflexe g = {200} an [001]-orientierten Cu-Einkristallen gemessen, die im Zugversuch bei Raumtemperatur bis zu Fliesspannungen zwischen 26,2 und 75,6 MPa verformt wurden. Fur g = (200) und (020) zeigen die Halbwertsbreiten δβ(ϕ) der Rockingkurven eine starke Abhangigkeit von ϕ (wobei der Azimuthwinkel ϕ die jeweilige Drehung der Probe um den Beugungsvektor g bezeichnet), wuhrend fur g = (002) die Halbwertsbreite δβ(ϕ) konstant ist und mit dessen Maximalwert fur g = (200) bzw. (020) ubereinstimmt. Es wird gezeigt, das diese ϕ-Abhangigkeit von δβ und der Umstand, das die [001]-Zugachse bemerkenswert stabil bei der Zugverformung ist, nur verstanden werden kann unter der Annahme, das die vierzahlige Symmetrie der Gleitgeometrie auf einer mikroskopischen Skala verletzt wird, jedoch auf einer makroskopischen Skala erhalten bleibt. Es werden Versetzungsreaktionsmodelle dargestellt, die die experimentellen Befunde richtig wiedergeben und die zu der Schlusfolgerung fuhren, das die Abgleitung in den acht Gleitsystemen mit Schmid-Faktor = 0 lokal vom Mittelwert nicht mehr als ungefahr 1% abweicht.


Journal ArticleDOI
TL;DR: In this article, the kinetic parameters and emission spectra of TL induced by X-irradiation at RT are studied in two feldspars: albite (Naalsi3O8) and microcline (KAlsi 3O8).
Abstract: The kinetic parameters and emission spectra of TL induced by X-irradiation at RT are studied in two feldspars: albite (Naalsi3O8) and microcline (KAlsi3O8). Peaks with activation energies of ≈ 0.70, 0.82, ≈ 1.05, 1.17, and 1.24 eV are found for both crystals while in albite there are three additional peaks (of 0.60, 0.90, and 1.39 eV). Six emission bands at 425, 450, ≈ 480, 515, 535, and 560 nm are ascribed to electron-hole recombinations at various hole centres. An intense band at 738 nm can be attributed either to the excitation of Fe3+ ions by the blue emission or to charge conversion processes which involve the Fe3+ ions. Die in Albite (Naalsi3O8) und in Microcline (Kaalsi3O8) durch Rontgenstrahlung bei Zimmertemperatur angeregte Thermolumineszenz wird gemessen und die kinetischen Parameter werden berechnet. Fur beide Kristalle ergeben sich Aktivierungsenergien von ≈ 0,70; 0,82; ≈ 1,05; 1,17 und 1,24 eV. In Albite erscheinen drei zusatzliche Glow-Peaks mit Aktivierungsenergien von 0,60; 0,90 und 1,39 eV. Die Emission der Thermolumineszenz wird ebenfalls gemessen und zeigt Maxima bei 425, 450, ≈ 480, 515, 535 und 560 nm. Diese Spektralbanden sind einer Rekombination von Elektronen mit Defektelektronen-Zentren zuzuschreiben. Eine weitere starke 738 nm-Spektralbande konnte entweder von der Anregung eines Fe3+ Ions durch die blaue Lumineszenz oder von einem Ladungstransfer-Prozes herruhren.