Showing papers in "Ultramicroscopy in 1998"

TL;DR: In this paper, a method for measuring and mapping displacement fields and strain fields from high-resolution electron microscope (HREM) images is developed based upon centring a small aperture around a strong reflection in the Fourier transform of an HREM lattice image and performing an inverse Fourier transformation.

TL;DR: In this paper, a hexapole corrector system was constructed for compensation of the spherical aberration of the objective lens of a transmission electron microscope, and an improvement of the point resolution from 0.24nm to better than 0.14nm was realized.

TL;DR: Tory and experiments presented here show that this resolution can be obtained in radiation sensitive hydrated biological material by using shock frozen samples and optimized phase contrast shows structures inside the frozen-hydrated objects with high contrast.

TL;DR: In this article, the authors proposed a method for high-resolution near-field optical imaging that relies on the highly enhanced fields at sharp metal tips under laser illumination, which are laterally confined to the tip size and can be used to locally excite the sample surface.

TL;DR: In this paper, the authors investigated the field emission properties of multiwalled carbon nanotubes, in the form of both single tips and films, and found that they show low operating voltages and produce high current densities.

TL;DR: In this article, the optical properties of a spherical aberration corrected transmission electron microscope by means of beam tilt series are demonstrated by measuring residual wave aberrations up to the fifth order.

TL;DR: The conclusion is that ART with blobs produces high-quality reconstructions and is, in particular, superior to weighted backprojection in recovering features along the "vertical" direction.

TL;DR: In this article, the authors focus on the analysis of profile view images with reference to the fine details of the contrasts both in the metal particles and in the outer support layers, and prove that complex contrasts which very often appear in the images can be interpreted on the grounds of the structural features of the catalysts and on the recording conditions in the microscope.

TL;DR: In this article, a novel ion milling unit was proposed and the thickness of the amorphised layer is about 1 nm for Si/0.25 keV, and not observed for GaAs/ 0.12 keV.

TL;DR: In this article, a semi-automatic specimen selection and data acquisition for protein electron crystallography is presented, based on a slow-scan CCD camera connected to a transmission electron microscope and control from an external computer.

TL;DR: In this article, the detection properties of scintillators used in charge-coupled device cameras suitable for electron microscopy are examined with particular emphasis on the statistics of electron scattering and photon generation in the scintilator.

TL;DR: In this article, the amplitude-phase-distance curves and amplitude-energy loss distance curves were used to investigate contrast mechanisms in tapping mode atomic force microscopy. But they are not applicable in general to tapping mode imaging, and are discussed in the context of previously proposed theoretical models, i.e., those based on solution of equations of motion or on energy conservation.

TL;DR: Focused ion-beam milling has been used to fabricate field-ion specimens from a pure metal, a metal alloy, an intermetallic alloy and a multilayer film device as discussed by the authors.

TL;DR: In this paper, an approach based on off-axis electron holography has been developed for quantifying the magnetization in a sample of unknown local thickness with lateral variations in composition.

TL;DR: In this article, the authors describe procedures to assess charging of biological specimens under electron irradiation in an electron cryomicroscope and investigate the influence of a variety of factors on the magnitude and visibility of charging.

TL;DR: In this article, field emission microscopy of single-walled nanotubes (SWNTs) and multi-walled nano-tubes (MWNTs), which were obtained after purification processes of carbon soot containing respective nanotsubes, was performed as an electron emitter.

TL;DR: In this article, a sacrificial layer that consists of a biopolymer, i.e. glutaraldehyde cross-linked gelatin, is used to remove a proteinase reaction as a tool in microsystems technology.

TL;DR: In this paper, a focused ion beam (FIB) was used to improve the quality of the apertures of metal-coated fiber probes for near field optical microscopy (SNOM) measurements.

TL;DR: In this article, the effects of several etching parameters on the tip quality are discussed: acid concentration, solvent type, etching temperature, and etching speed are considered, and a solution is proposed to obtain tips with large cone angles, resulting in optical transmission as high as 10 −3 measured through a metallized tip.

TL;DR: In this article, the authors describe some artefact and unforeseen phenomena that can occur when a photon flux with high intensity is focused onto a microspot, such as photon-assisted carbon deposition, heat dissipation, charging and photon-induced reduction of the sample.

TL;DR: In this article, a quantitative analysis of core level electron energy loss spectra for uniaxial anisotropic materials is presented, taking into account the presence of a convergent electron probe as is the case in a scanning transmission electron microscope (STEM) or transmission electron microscopy (TEM) in convergent probe mode.

TL;DR: In this article, a compositional analysis of high-resolution transmission electron microscopy of a 2-nm InxGa1−xAs layer (nominal In-content 60%) which was deposited on GaAs ( 0 0 1 ) and capped with 10-nm GaAs is presented.

TL;DR: Investigations have been performed on the dynamics of a distance regulation system based on an oscillating probe at resonance at a tuning fork shear-force feedback system, revealing that the resonance frequency of the tuning fork changes upon approaching the sample.

TL;DR: In this paper, the FIM Group of the University of Rouen developed a new type of detector that can be used in atom probe and 3D atom probe applications, which consists of an array of conductive and transparent strips covered with a phosphorescent material.

TL;DR: In this article, an analytical expression for the sensor response vs. z-piezo displacement based on the Hertz model of mechanical contact is derived. And this model is fitted to data obtained on a silica aerogel sample using a least-squares method.

TL;DR: Tapping mode atomic force microscopy operated in the phase shift mode is used to directly visualize the surface charge on biological macromolecules under solution, which is qualitatively consistent with experimental observations.

TL;DR: In this paper, a wave-optical model for surface step-phase contrast in low energy electron microscopy (LEEM) is presented, where step contrast is calculated as the interference of the Fresnel diffracted waves from terrace edges which meet at a step.

TL;DR: The surface sensitivity of near-field scanning optical microscopy by fluorescence imaging of membrane and bulk proteins in cells is demonstrated and it is shown that the technique is most suited for studying membrane proteins.

TL;DR: In this article, a new set-up for cathodoluminescence (CL) studies is described, which combines a scanning near-field optical/force microscopy (SNOM/SFM) with a scanning electron microscopy.

TL;DR: In this article, Vincent and Midgley used the precession technique to acquire three-dimensional intensity data of sufficient quality for structure determination of the intermetallic phase Al m Fe. The quality of the quantitative data and the factors affecting the methods and calculations are discussed.