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Journal ArticleDOI

A 1500 fps Highly Sensitive 256 $\,\times\,$ 256 CMOS Imaging Sensor With In-Pixel Calibration

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TLDR
A new capacitive transimpedance amplifier (CTIA) pixel with a tiny metal-oxide-metal capacitor is designed with high sensitivity and low noise for high-speed CIS, and the sensitivity improves dramatically.
Abstract
High-speed CMOS imaging sensors (CIS) normally have low sensitivity because of the large integration capacitance. They also have high noise because pixel circuits cannot implement correlated double sampling (CDS) to remove the pixel reset noise. For applications, such as micro-computed tomography (micro-CT), this is a major limitation. In this work, we developed a technique to achieve high sensitivity and low noise for high-speed CIS. To maximize the sensitivity, we designed a new capacitive transimpedance amplifier (CTIA) pixel with a tiny metal-oxide-metal capacitor. The pixel circuit also implements CDS. As a result, the temporal noise is greatly reduced, and the sensitivity improves dramatically. To compensate the mismatch of small integration capacitors across the pixel array, an on-chip calibration scheme with in-pixel circuits is developed. Fully differential column circuits are designed to suppress the power supply injection in the large array of high-speed column circuits. A successive-approximation analog-to-digital (SAR ADC) is designed to achieve 10-bit resolution and to fit in the 15-μm column pitch. For testing modes, column circuits are configured into a two-step ADC to provide 13-bit dynamic range. The 256 × 256 CIS design is fabricated in a 0.18-μm CMOS process. The imager samples up to 1500 fps. The pixel integration capacitor is 0.7 fF, which enables 68.5 V/lux · s sensitivity under the white illumination. The CIS temporal noise is 13.6e-. This sensitivity and noise performances are much better than previous high-speed CIS benchmark designs. Running at 1500 fps, the CIS can capture recognizable images with illumination down to 1 lux. The on-chip calibration suppresses the fixed-pattern noise lower than 0.52%. The prototype chip consumes 390 mW of power.

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Citations
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Journal ArticleDOI

Digitally Calibrated 768-kS/s 10-b Minimum-Size SAR ADC Array With Dithering

TL;DR: A novel digital calibration method is developed for SAR ADC based on dithering so that very small capacitors can be used in the SAR ADC due to the relaxed matching requirement and this design is the most area-efficient design.
Journal ArticleDOI

A Low-Power Pilot-DAC Based Column Parallel 8b SAR ADC With Forward Error Correction for CMOS Image Sensors

TL;DR: A compact 8b SAR ADC measuring only 348 μm×7 μm is described, which uses a new pilot-DAC (pDAC) technique to reduce the power consumption in its capacitor array and the accuracy of the pDAC scheme is protected by a novel mixed-signal Forward Error Correction (FEC) algorithm with minimal circuit overhead.
Journal ArticleDOI

CMOS-3D Smart Imager Architectures for Feature Detection

TL;DR: The paper describes the different kind of algorithms featured and the circuitry employed at top and bottom tiers, and the Gaussian pyramid is implemented with a switched-capacitor network in less than 50 μs, outperforming more conventional solutions.
Journal ArticleDOI

A 64 fJ/step 9-bit SAR ADC Array With Forward Error Correction and Mixed-Signal CDS for CMOS Image Sensors

TL;DR: The Forward Error Correction (FEC) of the pDAC improves its robustness against device mismatch and performs mixed-signal Correlated-Double-Sampling (CDS) using only the ADC's built-in capacitor array without any additional amplifier or memory.
Journal ArticleDOI

Low-Power CMOS Image Sensor Based on Column-Parallel Single-Slope/SAR Quantization Scheme

TL;DR: The power consumption of the column-parallel 11-bit two-step quantization scheme is significantly reduced when compared with the traditional single-slope ADC and other low-power ADC schemes because smaller SAR ADC reference voltages are selected after quantizing the first three most significant bits.
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Computed Tomography: Principles, Design, Artifacts, and Recent Advances

Jiang Hsieh
TL;DR: Introduction Preliminaries Image Reconstruction Image Presentation Key Performance Parameters of a CT Scanner Major Components of CT scanner Image Artifacts: Appearances, Causes, and Corrections Computer Simulation and Analysis.

Computed Tomography: Principles, Design, Artifacts, and Recent Advances, Fourth Edition

Jiang Hsieh
TL;DR: Introduction Preliminaries Image Reconstruction Image Presentation Key Performance Parameters of a CT Scanner Major Components of CT scanner Image Artifacts: Appearances, Causes, and Corrections Computer Simulation and Analysis.
Journal ArticleDOI

CMOS image sensors

TL;DR: This article provides a basic introduction to CMOS image-sensor technology, design and performance limits and presents recent developments and future research directions enabled by pixel-level processing, which promise to further improveCMOS image sensor performance and broaden their applicability beyond current markets.
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