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Journal ArticleDOI

A review of some charge transport properties of silicon

C. Jacoboni, +3 more
- 01 Feb 1977 - 
- Vol. 20, Iss: 2, pp 77-89
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TLDR
In this article, the present knowledge of charge transport properties in silicon, with special emphasis on their application in the design of solid-state devices, is reviewed, and most attention is devoted to experimental findings in the temperature range around 300 K and to high-field properties.
Abstract
This paper reviews the present knowledge of charge transport properties in silicon, with special emphasis on their application in the design of solid-state devices. Therefore, most attention is devoted to experimental findings in the temperature range around 300 K and to high-field properties. Phenomenological expressions are given, when possible, for the most important transport quantities as functions of temperature, field or impurity concentration. The discussion is limited to bulk properties, with only a few comments on surface transport.

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Journal ArticleDOI

Nanowire transistors without junctions

TL;DR: A new type of transistor in which there are no junctions and no doping concentration gradients is proposed and demonstrated, which has near-ideal subthreshold slope, extremely low leakage currents, and less degradation of mobility with gate voltage and temperature than classical transistors.
Journal ArticleDOI

Crystal Growth of the Perovskite Semiconductor CsPbBr3: A New Material for High-Energy Radiation Detection

TL;DR: The perovskite compound CsPbBr3 as mentioned in this paper is a direct band gap semiconductor which meets most of the requirements for successful detection of X and γ-ray radiation, such as high attenuation, high resistivity, and significant photoconductivity response, with detector resolution comparable to that of commercial, state-of-the-art materials.
Journal ArticleDOI

Comparison of 6H-SiC, 3C-SiC, and Si for power devices

TL;DR: In this paper, the drift region properties of 6H- and 3C-SiC-based Schottky rectifiers and power MOSFETs that result in breakdown voltages from 50 to 5000 V are defined.
Journal ArticleDOI

Electronic measurement and control of spin transport in Silicon

TL;DR: Conduction-band spin transport across 10 μm undoped Si is demonstrated in a device that operates by spin-dependent ballistic hot-electron filtering through ferromagnetic thin films for both spin injection and spin detection, and confirms spin coherent drift in the conduction band of silicon.
Journal ArticleDOI

ATLAS pixel detector electronics and sensors

Georges Aad, +267 more
TL;DR: In this article, the silicon pixel tracking system for the ATLAS experiment at the Large Hadron Collider is described and the performance requirements are summarized and detailed descriptions of the pixel detector electronics and the silicon sensors are given.
References
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Journal ArticleDOI

Monte Carlo determination of electron transport properties in gallium arsenide

TL;DR: In this article, a Monte Carlo technique was used to calculate the electron distribution functions in the (000) and (100) valleys of gallium arsenide, and the structure of the distribution function was interpreted in terms of the energy dependence of the scattering processes, particular reference being made to the prediction of a population inversion for fields in excess of about 10 kV cm.
Journal ArticleDOI

Resistivity of bulk silicon and of diffused layers in silicon

TL;DR: In this paper, the resistivity and impurity concentration in heavily doped silicon are reported and incorporated in a graph showing the resistivities (at T = 300°K) of n-and p-type silicon as a function of donor or acceptor concentration.
Journal ArticleDOI

Hot electrons in germanium and Ohm's law

TL;DR: In this article, the data of E. J. Ryder on the mobility of electrons in electric fields up to 40,000 volts per cm are analyzed and it is estimated that electron “temperatures as high as 4000°K have been produced in specimens having temperatures of atomic vibration of 300° K.
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