FIG. 2. Capacitance temperature scans for ZnO samples annealed in different ambient conditions at a temperature of 700 C. These were recorded at a reverse bias of 2.0 V scanning up in temperature. Figure 2(b) Capacitance temperature scans for ZnO samples annealed in oxygen ambient at different temperatures. These scans were recorded at a reverse bias of 2.0 V scanning up in temperature. The inset shows the variation of capacitance with annealing temperature at 75 K.
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