Journal ArticleDOI
A theoretical description of grain boundary electron scattering by an effective mean free path
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TLDR
A mathematical analysis based on the Mayadas-Shatzkes model indicates that an effective mean free path may be defined in order to describe electronic conduction in both thin polycrystalline and monocrystalline metallic films as discussed by the authors.About:
This article is published in Thin Solid Films.The article was published on 1978-06-15. It has received 123 citations till now. The article focuses on the topics: Mean free path & Grain boundary.read more
Citations
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Thermoelectric power of thin polycrystalline metal films in an effective mean free path model
TL;DR: In this paper, the theoretical expression for the thermoelectric power of polycrystalline metal films is derived from an effective Fuchs-Sondheimer conduction model, and a procedure is proposed to determine the variation in the electronic mean free path.
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Variations of energy gap, resistivity, and temperature coefficient of resistivity in annealed beta -Ag2Se thin films.
VD Das,D Karunakaran +1 more
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Temperature and size effects on electrical properties and thermoelectric power of Bismuth Telluride thin films deposited by co-sputtering
TL;DR: In this article, annealed N-type bismuth telluride thin films of different thicknesses were deposited on cleaned glass substrate at room temperature by co-sputtering technique.
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Single-Metal Nanoscale Thermocouples
TL;DR: In this article, a shape-engineered monometallic thermocouple was constructed from a lithographically defined nanowire having one abrupt variation in width along its length and tested at room temperature; these structures exploited a change in Seebeck coefficient that is present at these size scales.
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Electrical transport in metallic films
TL;DR: In this article, the authors proposed a model that includes scattering from both film surfaces and grain boundaries, and studied the quasiclassical electrical transport in metallic films, and the in-plane electric conductivity of metallic films is obtained, and theoretical results are shown to be in good agreement with experimental data.
References
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Journal ArticleDOI
The mean free path of electrons in metals
TL;DR: The mean free path of electrons in metals has been studied in this paper, where the authors show that electrons follow a straight line along the path of the electron in the metal atom.
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Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces
A. F. Mayadas,M. Shatzkes +1 more
TL;DR: In this paper, the total resistivity of a thin metal film is calculated from a model in which three types of electron scattering mechanisms are simultaneously operative: an isotropic background scattering (due to the combined effects of phonons and point defects), scattering due to a distribution of planar potentials (grain boundaries), and scattering by the external surfaces.
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Electrical resistivity model for polycrystalline films: the case of specular reflection at external surfaces
TL;DR: In this article, a model for estimating effects due to electron scattering from grain boundaries, occurring simultaneously with background scattering, was developed for polycrystalline metal films in which a very fine-grained structure is often found.
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Resistivity and Temperature Coefficient of Thin Metal Films with Rough Surface
TL;DR: In this paper, the surface roughness of thin metal films has been used to predict the thickness dependence of resistivity and its temperature coefficient of metal films, and the ratio of the roughness to the mean free path, h/λ, is introduced as a convenient parameter.