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Journal ArticleDOI

Academic and industry research progress in germanium nanodevices

Ravi Pillarisetty
- 17 Nov 2011 - 
- Vol. 479, Iss: 7373, pp 324-328
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TLDR
Germanium-based transistors have the potential to operate at high speeds with low power requirements and might therefore be used in non-silicon-based semiconductor technology in the future.
Abstract
Silicon has enabled the rise of the semiconductor electronics industry, but it was not the first material used in such devices. During the 1950s, just after the birth of the transistor, solid-state devices were almost exclusively manufactured from germanium. Today, one of the key ways to improve transistor performance is to increase charge-carrier mobility within the device channel. Motivated by this, the solid-state device research community is returning to investigating the high-mobility material germanium. Germanium-based transistors have the potential to operate at high speeds with low power requirements and might therefore be used in non-silicon-based semiconductor technology in the future.

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Citations
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Copper atomic-scale transistors

TL;DR: The copper atomic-scale transistor demonstrates volatile/non-volatile dual functionalities, and an optimal merging of the logic with memory may open a perspective for processor-in-memory and logic- in-memory architectures, using copper as an alternative working material besides silver for fully metallic atomic- scale transistors.
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Impact of Dummy Gate Removal and a Silicon Cap on the Low-Frequency Noise Performance of Germanium nFinFETs

TL;DR: In this article, the impact of different process options on the low-frequency noise performance and reliability of Ge nFinFETs was investigated, and it was shown that the LFN is mainly determined by carrier number fluctuations, and the density of traps in the high-kappa $ dielectric can be reduced by an extended dry clean.
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Quantum information memory based on reconfigurable topological insulators by piezotronic effect

TL;DR: In this article, the authors theoretically investigated the piezotronic effect on topological insulators based on GaAs/Ge/GaAs quantum well with two quantum point contacts (QPCs).
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Thickness-dependent elastic strain in Stranski–Krastanow growth

TL;DR: A new theory is constructed for calculating the parameters of the formed islands, generalizing previously used thermodynamic models, under the assumption that lattice mismatch depends on the thickness of the deposited material.
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Hole mobility degradation by remote Coulomb scattering and charge distribution in Al 2 O 3 /GeO x gate stacks in bulk Ge pMOSFET with GeO x grown by ozone oxidation

TL;DR: In this article, the authors investigated the effect of remote Coulomb scattering (RCS) on hole mobility degradation due to fixed charges in a gate stack of a metal-oxide-semiconductor field effect transistor (pMOSFET).
References
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Proceedings ArticleDOI

A 90nm high volume manufacturing logic technology featuring novel 45nm gate length strained silicon CMOS transistors

TL;DR: In this article, the authors describe a novel strained transistor architecture which is incorporated into a 90nm logic technology on 300mm wafers, which features an epitaxially grown strained SiGe film embedded in the source drain regions.
Journal ArticleDOI

Controlling threading dislocation densities in Ge on Si using graded SiGe layers and chemical-mechanical polishing

TL;DR: In this paper, a method of controlling threading dislocation densities in Ge on Si involving graded SiGe layers and chemical-mechanical polishing (CMP) is presented.
Journal ArticleDOI

High-k/Ge MOSFETs for future nanoelectronics

TL;DR: In this article, the opportunities and challenges of high-k/Ge MOSFETs are discussed on the basis of the material properties of Ge oxide to provide insights for future progress.
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