scispace - formally typeset
Journal ArticleDOI

Academic and industry research progress in germanium nanodevices

Ravi Pillarisetty
- 17 Nov 2011 - 
- Vol. 479, Iss: 7373, pp 324-328
Reads0
Chats0
TLDR
Germanium-based transistors have the potential to operate at high speeds with low power requirements and might therefore be used in non-silicon-based semiconductor technology in the future.
Abstract
Silicon has enabled the rise of the semiconductor electronics industry, but it was not the first material used in such devices. During the 1950s, just after the birth of the transistor, solid-state devices were almost exclusively manufactured from germanium. Today, one of the key ways to improve transistor performance is to increase charge-carrier mobility within the device channel. Motivated by this, the solid-state device research community is returning to investigating the high-mobility material germanium. Germanium-based transistors have the potential to operate at high speeds with low power requirements and might therefore be used in non-silicon-based semiconductor technology in the future.

read more

Citations
More filters
Journal ArticleDOI

Formation of ultrathin Ni germanides: solid-phase reaction, morphology and texture

TL;DR: In this paper, the solid phase reaction of ultrathin Ni films with different Ge substrates (single-crystalline (100), poly-crystaline, and amorphous) was studied.
Journal ArticleDOI

p-type doping of Ge by Al ion implantation and pulsed laser melting

TL;DR: In this paper, p-type doping aluminum ion implantation followed by pulsed laser annealing in the melting regime has been investigated for the first time, in particular, two different regimes have been studied, in order to explore the limit of incorporation for such a method: 6.4
Journal ArticleDOI

Synthesis of visible light emitting self assembled Ge nanocrystals embedded within a SiO 2 matrix

TL;DR: In this article, as-grown light emitting self-assembled Ge nanocrystals (Ge-NCs) embedded in a SiO2 matrix were produced via a sequential deposition process of SiO 2/Ge/SiO2 layers employing a reactive radio frequency sputtering technique.
Journal ArticleDOI

Structural Evolution, Electronic Structures, and Vibrational Properties of Anionic LuGen (n = 5-17) Clusters: From Lu-Linked to Lu-Encapsulated Configurations.

TL;DR: In this paper, the structural evolution pattern and electronic properties of Lu-doped germanium anion clusters, LuGen- (n = 5-17), have been investigated using a global search method combined with a double hybrid density functional theory and by comparing the theoretical PES spectra with the experimental ones.
References
More filters
Proceedings ArticleDOI

A 90nm high volume manufacturing logic technology featuring novel 45nm gate length strained silicon CMOS transistors

TL;DR: In this article, the authors describe a novel strained transistor architecture which is incorporated into a 90nm logic technology on 300mm wafers, which features an epitaxially grown strained SiGe film embedded in the source drain regions.
Journal ArticleDOI

Controlling threading dislocation densities in Ge on Si using graded SiGe layers and chemical-mechanical polishing

TL;DR: In this paper, a method of controlling threading dislocation densities in Ge on Si involving graded SiGe layers and chemical-mechanical polishing (CMP) is presented.
Journal ArticleDOI

High-k/Ge MOSFETs for future nanoelectronics

TL;DR: In this article, the opportunities and challenges of high-k/Ge MOSFETs are discussed on the basis of the material properties of Ge oxide to provide insights for future progress.
Related Papers (5)