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Journal ArticleDOI

Academic and industry research progress in germanium nanodevices

Ravi Pillarisetty
- 17 Nov 2011 - 
- Vol. 479, Iss: 7373, pp 324-328
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TLDR
Germanium-based transistors have the potential to operate at high speeds with low power requirements and might therefore be used in non-silicon-based semiconductor technology in the future.
Abstract
Silicon has enabled the rise of the semiconductor electronics industry, but it was not the first material used in such devices. During the 1950s, just after the birth of the transistor, solid-state devices were almost exclusively manufactured from germanium. Today, one of the key ways to improve transistor performance is to increase charge-carrier mobility within the device channel. Motivated by this, the solid-state device research community is returning to investigating the high-mobility material germanium. Germanium-based transistors have the potential to operate at high speeds with low power requirements and might therefore be used in non-silicon-based semiconductor technology in the future.

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Citations
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Journal ArticleDOI

Tetragermacyclobutadiene: Energetically Disfavored with Respect to Its Structural Isomers

TL;DR: The results demonstrate that the cyclic isomers of (GeH)4 distort to maximize the mixing of the p’orbitals that are involved in the π system of tetragermacyclobutadiene and the lowest-energy isomers exhibit unusual bonding arrangements that maximize the nonbonding electron density at the Ge centers.
Journal ArticleDOI

Strain-induced phase variation and dielectric constant enhancement of epitaxial Gd2O3

TL;DR: In this article, it was shown that extreme structural changes can occur in ultra-thin epitaxial rare earth oxide films and modify their dielectric properties when the underlying substrate is altered.

Group IV epitaxy for advanced nano- and optoelectronic applications

TL;DR: A low temperature reduced pressure chemical vapour process using commercially available Geand Sn-precursors, namely Ge2H6 and SnCl4, is developed for the growth of GeSn and SiGeSn epilayers directly on Si(1) and on Ge-buffered Si(2).
Book ChapterDOI

Growth of Semiconductor Nanocrystals

TL;DR: In this paper, the growth of semiconductor nanocrystals, including quantum well, wire, nanowire, and quantum dot with selective area growth, is summarized and the position-controlled growth of nanocrystal by using faceting growth and mechanisms is described.
References
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Proceedings ArticleDOI

A 90nm high volume manufacturing logic technology featuring novel 45nm gate length strained silicon CMOS transistors

TL;DR: In this article, the authors describe a novel strained transistor architecture which is incorporated into a 90nm logic technology on 300mm wafers, which features an epitaxially grown strained SiGe film embedded in the source drain regions.
Journal ArticleDOI

Controlling threading dislocation densities in Ge on Si using graded SiGe layers and chemical-mechanical polishing

TL;DR: In this paper, a method of controlling threading dislocation densities in Ge on Si involving graded SiGe layers and chemical-mechanical polishing (CMP) is presented.
Journal ArticleDOI

High-k/Ge MOSFETs for future nanoelectronics

TL;DR: In this article, the opportunities and challenges of high-k/Ge MOSFETs are discussed on the basis of the material properties of Ge oxide to provide insights for future progress.
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