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Journal ArticleDOI

An Accumulating Pixel Array Detector for Single-Bunch Synchrotron Experiments

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TLDR
In this article, the authors describe the development of a CMOS read-out chip for an X-ray pixel array detector that accumulates into analog storage elements with time resolution typical of synchrotron bunch spacings.
Abstract
We describe the development of a CMOS read-out chip for an X-ray pixel array detector that accumulates into analog storage elements with time resolution typical of synchrotron bunch spacings. Each pixel contains multiple analog storage elements to allow capture of full-frame images at submicrosecond separation. Additionally, each storage element is re-addressable, which allows accumulation of signal from temporally distinct acquisition windows. Test results show the ability to slew and settle the equivalent of 650 8-keV x-rays (1.21 Me-) in less than 100 ns. The detector RMS read-noise was measured to be 2350 e- and grows with the square-root of the number of accumulations with a coefficient of 415 e- (equivalent to 1.07 and 0.19 8-keV x-rays respectively). The saturation value for each storage element, in terms of 8 keV x-rays, was measured to exceed 1880 x-rays (6.42 Me-). The complete detector is anticipated to contain around 400 times 200 pixels with pixel size near 150 mum times 150 mum. Possible experimental applications include study of material failures, transient phase transformations, and high-speed X-radiography.

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Journal ArticleDOI

X-ray analog pixel array detector for single synchrotron bunch time-resolved imaging

TL;DR: In this paper, an analog integrating pixel array detector with in-pixel storage and temporal resolution of around 150 ns, sufficient to isolate pulses, is presented, and the detector resolved individual bunch trains at the Cornell High Energy Synchrotron Source at levels of up to 3.7 × 103
Proceedings ArticleDOI

Future of ePix detectors for high repetition rate FELs

TL;DR: The ePix platform for x-ray detectors is presented in this paper, where the current status of the ePIX detectors are compared with the requirements of currently planned high repetition rate FELs (mainly readout speed and energy range).
Journal ArticleDOI

Characterization of CdTe Sensors with Schottky Contacts Coupled to Charge-Integrating Pixel Array Detectors for X-Ray Science

TL;DR: In this article, the authors presented characterizations of CdTe sensors hybridized with two different charge-integrating readout chips, the Keck PAD and the Mixed-Mode PAD (MM-PAD), both developed previously in our laboratory.
Journal ArticleDOI

High-speed X-ray imaging pixel array detector for synchrotron bunch isolation.

TL;DR: A high-speed pixel array detector for time-resolved X-ray imaging at synchrotrons has been developed with the ability to isolate single synchrotron bunches.
References
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Book

Operation and modeling of the MOS transistor

TL;DR: In this article, the MOS transistors with ION-IMPLANTED CHANNELS were used for CIRCUIT SIMULATION in a two-and three-tier MOS structure.
Journal ArticleDOI

High-Resolution Scanning X-ray Diffraction Microscopy

TL;DR: A ptychographic imaging method is demonstrated that bridges the gap between CDI and STXM by measuring complete diffraction patterns at each point of a STXM scan.
Journal ArticleDOI

A 1.5-V, 10-bit, 14.3-MS/s CMOS pipeline analog-to-digital converter

TL;DR: In this paper, a 1.5-V, 10-bit, 14.3-MS/s pipeline analog-to-digital converter was implemented in a 0.6/spl mu/m CMOS technology.
Journal ArticleDOI

The flipped voltage follower: a useful cell for low-voltage low-power circuit design

TL;DR: A design example showing the application of the FVF to build systems based on translinear loops is described which shows the potential of this cell for the design of high-performance low-power/low-voltage analog and mixed-signal circuits.
Book

Semiconductor Detector Systems

TL;DR: In this paper, the authors present a comprehensive overview of detector systems and why things don't work, including the diode equation, electromagnetic effects of impurities and defects, and Bipolar transistor equations.
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