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An improved image alignment procedure for high-resolution transmission electron microscopy.

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TLDR
It is shown that more accurate image alignment can be achieved by using an appropriate aperture to filter the high-frequency components of the images being aligned, especially for a crystalline specimen with little non-periodic information.
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This article is published in Micron.The article was published on 2010-06-01. It has received 8 citations till now. The article focuses on the topics: Image processing & Image resolution.

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CalAtom: A software for quantitatively analysing atomic columns in a transmission electron microscope image.

TL;DR: The CalAtom software is developed for quantitative analyses of atomic columns in (scanning) transmission electron microscopy, (S)TEM, images and offers several options for further analyses, such as in-plane scale local environments of the atomic columns, local elementary composition and real-space averaging of image motifs.
Journal ArticleDOI

Structure projection reconstruction from through-focus series of high-resolution transmission electron microscopy images

TL;DR: A structure projection reconstruction method based on contrast transfer function correction of through-focus series of high-resolution transmission electron microscopy images is presented and Influences of experimental parameters for imaging and effects of crystal thickness on reconstruction are discussed.
Journal ArticleDOI

Recombination of Shockley partial dislocations by electron beam irradiation in wurtzite GaN

TL;DR: In this article, the authors used high-resolution transmission electron microscopy (HRTEM) image simulations, in conjunction with density functional theory calculations, led to the identification of the core structures of the Shockley partials.
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Exit-wave phase retrieval from a single high-resolution transmission electron microscopy image of a weak-phase object.

TL;DR: A novel algorithm to numerically retrieve the phase of the exit-wave function from a high-resolution transmission electron microscopy (HRTEM) image of a weak-phase object material, e.g., graphene and hexagonal boron nitride monolayers is proposed.
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A quantitative method for measuring small residual beam tilts in high-resolution transmission electron microscopy.

TL;DR: A quantitative method for measuring small residual beam tilts, being independent of specimen thickness and taking specimen drifts into account in measurement, is reported, including its theoretical schemes, numerical simulation testing and experimental verification.
References
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Numerical recipes

Book

Transmission Electron Microscopy

Ludwig Reimer, +1 more
TL;DR: Particle Optics of Electrons as mentioned in this paper, wave and wave-optics of electrons, and wave and phase contrast of Electron Spectroscopy have been studied extensively in the literature.
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Direct Imaging of Lattice Atoms and Topological Defects in Graphene Membranes

TL;DR: Multiple five- and seven-membered rings appear exclusively in combinations that avoid dislocations and disclinations, in contrast to previous observations on highly curved (tube- or fullerene-like) graphene surfaces.
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Fabrication of a freestanding boron nitride single layer and its defect assignments.

TL;DR: A freestanding single layer of hexagonal boron nitride (h-BN) has been successfully fabricated by controlled energetic electron irradiation through a layer-by-layer sputtering process and the dominating zigzag-type edges are proved to be nitrogen terminated.
Journal ArticleDOI

Electron microscopy image enhanced

TL;DR: In this paper, the authors report a solution to this problem for a medium-voltage electron microscope which gives a stunning enhancement of image quality, which can be used to improve the resolution of the electron microscope.
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