An X-ray photoelectron study of the dependence of HF concentration on an etched silicon surface
01 Jun 1992-Journal of Electron Spectroscopy and Related Phenomena (Elsevier)-Vol. 58, Iss: 4, pp 261-270
TL;DR: Using X-ray photoelectron spectroscopy, the chemical state of a silicon surface treated with hydrofluoric acid and the resulting contaminant species (fluorine, carbon and oxygen) were studied as a function of the etchant concentration.
About: This article is published in Journal of Electron Spectroscopy and Related Phenomena.The article was published on 1992-06-01. It has received 12 citations till now. The article focuses on the topics: Isotropic etching & Silicon.
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TL;DR: In this paper, the surface films formed under these dynamic heat-transfer conditions are characterized with the use of X-ray photoelectron spectroscopy (XPS) and Fourier transform infrared (FT-IR) is also used for the study and characterization of the surface film formed.
Abstract: Carboxylic acids are found to adsorb weakly to the native oxide surface of aluminum. Under heat exchange conditions, synergistic carboxylate combinations provide superior high-temperature aluminum corrosion protection and show excellent heat-transfer characteristics. The surface films formed under these dynamic heat-transfer conditions are characterized with the use of X-ray photoelectron spectroscopy (XPS). Fourier transform infrared (FT-IR) is also used for the study and characterization of the surface films formed. The results are compared with the FT-IR data of the pure Al-carboxylate complexes. The combination of these results reveals that, under heat transfer conditions, carboxylates are chemically bonded to the aluminum surface. This molecular film shows excellent inhibition properties for aluminum.
46 citations
Patent•
11 Sep 1984TL;DR: In this article, a catalyst comprising an inorganic refractory oxide support containing at least one of tungsten oxide and molybdenum oxide and a promoting amount of at least a methylating agent under conditions suitable for the methylating agents to promote the activity of the oxides for the disproportionation reaction.
Abstract: Olefins are converted into other olefins having different numbers of carbon atoms by contact with a catalyst comprising an inorganic refractory oxide support containing at least one of tungsten oxide and molybdenum oxide and a promoting amount of at least one methylating agent under conditions suitable for the methylating agent compounds to promote the activity of tungsten and molybdenum oxides for the disproportionation reaction.
26 citations
TL;DR: In this paper, a combination of conventional, angle-resolved and depth profiling X-ray photoelectron spectroscopy (XPS) was used to characterize the Niobic acid monolayer.
21 citations
TL;DR: In this paper, a model support consisting of a thin layer of SiO2 on a Silicon single crystal has been used to study the [W]n+/SiO2/Si (100) model catalyst precursor prepared by a controlled reaction of π-C5H5W(CO)3Cl with the SiO 2 surface.
11 citations
TL;DR: In this article, X-ray photoelectron spectroscopy valence band measurements have evidenced a structure near the Fermi level, which has been assigned to a structural oxygen deficiency of the deposited films, which is also observed in the conductance curve of some samples.
Abstract: Scanning tunneling spectroscopy and microscopy investigations have been carried out in air on thermally evaporated tungsten oxide thin films deposited onto silicon substrates. The films have been submitted to thermal annealing at different temperatures and for different times. The microscopy images show strong effects of recrystallization and different grain sizes depending on the thermal treatment. The spectroscopic data exhibit a rectifying characteristics and the comparison between the topographic and current images allows a better understanding of the sample morphology in relation to the electrical behavior. X-ray photoelectron spectroscopy valence band measurements have evidenced a structure near the Fermi level, which has been assigned to a structural oxygen deficiency of the deposited films, which is also observed in the conductance curve of some samples.
11 citations
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9 citations
TL;DR: In this article, the authors used variable illumination current-voltage measurements on semi-transparent metal gate metal-insulator-semiconductor diodes to study the open-circuit voltage, shortcircuit current, ideality factor and reverse saturation current.
3 citations