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Arsenic precipitates and the semi‐insulating properties of GaAs buffer layers grown by low‐temperature molecular beam epitaxy

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TLDR
Arsenic precipitates have been observed in GaAs low-temperature buffer layers (LTBLs) used as "substrates" for normal molecular beam epitaxy growth as mentioned in this paper.
Abstract
Arsenic precipitates have been observed in GaAs low‐temperature buffer layers (LTBLs) used as ‘‘substrates’’ for normal molecular beam epitaxy growth. Transmission electron microscopy has shown the arsenic precipitates to be hexagonal phase single crystals. The precipitates are about 6±4 nm in diameter with a density on the order of 1017 precipitates per cm3. The semi‐insulating properties of the LTBL can be explained in terms of these arsenic precipitates acting as ‘‘buried’’ Schottky barriers with overlapping spherical depletion regions. The implications of these results on LTBL resistivity stability with respect to doping and anneal temperature will be discussed as will the possible role of arsenic precipitates in semi‐insulating liquid‐encapsulated Czochralski‐grown bulk GaAs.

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Citations
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Terahertz spectroscopy and imaging – Modern techniques and applications

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Subpicosecond carrier lifetime in GaAs grown by molecular beam epitaxy at low temperatures

TL;DR: In this article, a femtosecond time-resolved reflectance (FRS) technique was used to measure the lifetime of a photoconductive switch with a full width at half-maximum of 0.6 ps.
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Formation of arsenic precipitates in GaAs buffer layers grown by molecular beam epitaxy at low substrate temperatures

TL;DR: In this paper, a GaAs buffer layer was grown at low substrate temperatures (250 °C) and the film structures were examined using transmission electron microscopy, showing that the GaAs layer was free of defects or clusters.
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Nanoscale tera-hertz metal-semiconductor-metal photodetectors

TL;DR: In this article, a high-speed metal-semiconductor-metal photodetectors (MSM PDs) with finger spacing and width as small as 25 nm were fabricated on bulk and low-temperature (LT) grown GaAs and crystalline Si using ultra-high-resolution electron-beam lithography.
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Semi-insulating semiconductor heterostructures: Optoelectronic properties and applications

TL;DR: In this article, a spectrum of optoelectronic properties of and uses for semi-insulating semiconductor heterostructures and thin films, including epilayers and quantum wells, are discussed.
References
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Journal ArticleDOI

Schottky Barrier Heights and the Continuum of Gap States

TL;DR: In this paper, the Schottky barrier heights for metal-semiconductor interfaces with a variety of metals have been calculated, and they are in excellent agreement with experiment for interfaces with various metals.
Journal ArticleDOI

New and unified model for Schottky barrier and III–V insulator interface states formation

TL;DR: In this article, Fermi level stabilizes after a small fraction of a monolayer of either metal or oxygen atoms have been placed on the surface of the semiconductor.
Journal ArticleDOI

New MBE buffer used to eliminate backgating in GaAs MESFETs

TL;DR: In this paper, a buffer is grown by molecular beam epitaxy (MBE) at low substrate temperatures (150-300 degrees C) using Ga and As/sub 4/beam fluxes.
Journal ArticleDOI

Structural properties of As‐rich GaAs grown by molecular beam epitaxy at low temperatures

TL;DR: In this article, electron paramagnetic resonance (EPR) was used to detect arsenic antisite defects in molecular beam epitaxy (MBE) grown GaAs at substrate temperatures between 200 and 300°C.
Journal ArticleDOI

High‐brightness terahertz beams characterized with an ultrafast detector

TL;DR: In this paper, a dipolar antenna structure was proposed to improve the emission and detection of electromagnetic beams of single-cycle 0.5 THz pulses, and the frequency response was extended to well beyond 1 THz and the beam power was increased by 15 times.
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