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Journal ArticleDOI

Atomic-Monolayer Two-Dimensional Lateral Quasi-Heterojunction Bipolar Transistors with Resonant Tunneling Phenomenon

TL;DR: The experimental observation of quasi-heterojunction bipolar transistors utilizing a monolayer of the lateral WSe2-MoS2 junctions as the conducting p-n channel is demonstrated, and the negative differential resistance in the electrical characteristics is observed.
Abstract: High-frequency operation with ultrathin, lightweight, and extremely flexible semiconducting electronics is highly desirable for the development of mobile devices, wearable electronic systems, and defense technologies. In this work, the experimental observation of quasi-heterojunction bipolar transistors utilizing a monolayer of the lateral WSe2–MoS2 junctions as the conducting p–n channel is demonstrated. Both lateral n–p–n and p–n–p heterojunction bipolar transistors are fabricated to exhibit the output characteristics and current gain. A maximum common-emitter current gain of around 3 is obtained in our prototype two-dimensional quasi-heterojunction bipolar transistors. Interestingly, we also observe the negative differential resistance in the electrical characteristics. A potential mechanism is that the negative differential resistance is induced by resonant tunneling phenomenon due to the formation of quantum well under applying high bias voltages. Our results open the door to two-dimensional material...

Summary (1 min read)

Introduction

  • “Just Accepted” manuscripts have been fully peer reviewed, but should not be considered the official version of record.
  • The heterojunction bipolar transistor (HBT) is very similar to the BJT, but uses different semiconductor materials with different bandgaps for the emitter and base regions instead.

RESULTS AND DISCUSSION

  • For the synthesis of WSe2-MoS2 lateral heterostructure, a monolayer MoS2 was grown using chemical vapor deposition (CVD) on top of sapphire substrates.
  • Fig. 1 shows the characterization of the lateral WSe2-MoS2 heterostructure in one of the ribbons.
  • Fig. 4(c) shows the common-emitter output characteristics of the lateral n-p-n quasi-heterojunction bipolar transistor.
  • Once the energy in the emitter region is higher than the energy in the quantum well (base region), the authors can observe the resonant tunneling behavior.
  • In addition, the authors also note that when the VBE is increased at relatively large bias, the current of the collector would not increase like common bipolar junction transistors.

CONCLUSION

  • The authors have demonstrated quasi-heterojunction bipolar transistors using a monolayer of the lateral heterojunction transition metal dichalcogenide materials, namely WSe2-MoS2.
  • Two types of the lateral quasiheterojunction bipolar transistor, n-p-n and p-n-p, are meticulously fabricated and studied in the same piece of a flake in order to compare the device performance between them.
  • Furthermore, the authors also observe that the negative differential resistance (NDR) in their devices.
  • The NDR behavior is caused by resonant tunneling phenomenon due to the formation of quantum well under applying high bias voltages in the base region and collector region.

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Atomic-Monolayer Two-Dimensional Lateral
Quasi-Heterojunction Bipolar Transistors
with Resonant Tunneling Phenomenon
Item Type Article
Authors Lin, Che-Yu; Zhu, Xiaodan; Tsai, Shin-Hung; Tsai, Shiao-Po; Lei,
Sidong; Li, Ming-yang; Shi, Yumeng; Li, Lain-Jong; Huang, Shyh-
Jer; Wu, Wen-Fa; Yeh, Wen-Kuan; Su, Yan-Kuin; Wang, Kang L.;
Lan, Yann-Wen
Citation Lin C-Y, Zhu X, Tsai S-H, Tsai S-P, Lei S, et al. (2017) Atomic-
Monolayer Two-Dimensional Lateral Quasi-Heterojunction
Bipolar Transistors with Resonant Tunneling Phenomenon. ACS
Nano. Available: http://dx.doi.org/10.1021/acsnano.7b05012.
Eprint version Post-print
DOI 10.1021/acsnano.7b05012
Publisher American Chemical Society (ACS)
Journal ACS Nano
Rights This document is the Accepted Manuscript version of a Published
Work that appeared in final form in ACS Nano, copyright ©
American Chemical Society after peer review and technical
editing by the publisher. To access the final edited and published
work see http://pubs.acs.org/doi/abs/10.1021/acsnano.7b05012.
Download date 09/08/2022 20:45:32
Link to Item http://hdl.handle.net/10754/625850

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of their duties.
Article
Atomic-Monolayer Two-Dimensional Lateral Quasi-Heterojunction
Bipolar Transistors with Resonant Tunneling Phenomenon
Che-Yu Lin, Xiaodan Zhu, Shin-Hung Tsai, Shiao-Po Tsai, Sidong Lei, Ming-Yang Li, Yumeng Shi, Lain-
Jong Li, Shyh-Jer Huang, Wen-Fa Wu, Wen-Kuan Yeh, Yan-Kuin Su, Kang L. Wang, and Yann-Wen Lan
ACS Nano, Just Accepted Manuscript • DOI: 10.1021/acsnano.7b05012 • Publication Date (Web): 04 Oct 2017
Downloaded from http://pubs.acs.org on October 10, 2017
Just Accepted
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or consequences arising from the use of information contained in these “Just Accepted” manuscripts.

1
Atomic-Monolayer Two-Dimensional Lateral Quasi-
Heterojunction Bipolar Transistors with Resonant Tunneling
Phenomenon
Che-Yu Lin
1
,Xiaodan Zhu
2
,Shin-Hung Tsai
2
,Shiao-Po Tsai
2
,Sidong Lei
2
,Ming-Yang Li
3
,Yumeng Shi
4
,
Lain-Jong Li
5
,Shyh-Jer Huang
6
,Wen-Fa Wu
7
,Wen-Kuan Yeh
7
, Yan-Kuin Su
1,8
,
Kang L.Wang
2
,Yann-Wen Lan
9,*
1
Institute of Microelectronics and Advanced Optoelectronic Technology Center, National Cheng Kung
University, Tainan 701, Taiwan.
2
Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, California,
United States.
3
Research Center for Applied Sciences, Academia Sinica, Taipei, Taiwan.
4
SZU-NUS Collaborative Innovation Center for Optoelectronic Science and Technology, Shenzhen University,
Shenzhen 518060, China
5
Physical Sciences and Engineering Division, King Abdullah University of Science and Technology (KAUST),
Thuwal, Kingdom of Saudi Arabia.
6
Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 701, Taiwan.
7
National Nano Device Laboratories, National Applied Research Laboratories, Hsinchu 30078, Taiwan.
8
Department of Electrical Engineering, Kun Shan University, Tainan 710, Taiwan.
9
Department of Physics, National Taiwan Normal University, Taipei 11677, Taiwan
Tel: +886-2-77346094, Fax: +886-2-29326408, Email: ywlanblue@gmail.com; ywlan@ntnu.edu.tw
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2
Abstract
High-frequency operation with ultra-thin, lightweight and extremely flexible semiconducting
electronics are highly desirable for the development of mobile devices, wearable electronic systems and defense
technologies. In this work, the experimental observation of quasi-heterojunction bipolar transistors utilizing a
monolayer of the lateral WSe
2
-MoS
2
junctions as the conducting p-n channel is demonstrated. Both lateral n-p-
n and p-n-p heterojunction bipolar transistors are fabricated to exhibit the output characteristics and current
gain. A maximum common-emitter current gain of around 3 is obtained in our prototype two-dimensional
quasi-heterojunction bipolar transistors. Interestingly, we also observe the negative differential resistance in the
electrical characteristics. A potential mechanism is that the negative differential resistance is induced by
resonant tunneling phenomenon due to the formation of quantum well under applying high bias voltages. Our
results open the door to two-dimensional materials for high-frequency, high-speed, high-density and flexible
electronics.
Keywords: 2D materials, heterojunction bipolar transistors, resonant tunneling phenomenon, lateral junction,
atomic layered,
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3
One of the major transistors is bipolar junction transistor (BJT) that is formed by connecting two opposite
junction diodes and utilizes both electron and hole charge carriers. It is a three-terminal device represented
separately by emitterbase and collector, and is a critical component in many analog, digital, and sensor
applications. BJTs are manufactured in two types, NPN and PNP, and the two complementary configuration
transistors could be fabricated in the same circuit which could make the circuit design more flexible. The
amplification of current is the basic function of a BJT.
1
This allows BJTs to be used as amplifiers or switches,
giving them wide applicability in consumer electronics, examples of applications including communication
products, computers, audio-visual and sound equipment, and various instruments. The heterojunction bipolar
transistor (HBT) is very similar to the BJT, but uses different semiconductor materials with different bandgaps
for the emitter and base regions instead.
2,3
Compared to BJT, HBT can be operated at very high frequencies, up
to several hundred GHz. It is commonly used in radio-frequency (RF) systems such as RF power amplifiers in
cellular phones.
4,5
Traditional materials used for epitaxial layers of HBT include silicon/silicon-germanium
alloys,
6
aluminum gallium arsenide/gallium arsenide, and indium phosphide/indium gallium arsenide.
The advent of atomically thin two-dimensional (2D) crystals has sparked a paradigm shift in
nanotechnology.
7,8
Since the last decade, we are capable of truly exploring and implementing device concepts at
the ultimate physical thickness limit in addition to having at our disposal a myriad of 2D materials, each of
which exhibits distinctive electronic and optical properties.
9
There exist many 2D materials with energy
bandgaps in the range between 1 and 2 eV. By carefully mixing and matching materials with different bandgap
values, it can provide the potential barriers needed to limit the injection of holes from the base into the emitter
region and thus enhance the operation frequency. Further, 2D materials are good candidates to replace
traditional semiconductors for resonant tunneling diodes (RTDs) since that realizing the negative differential
resistance (NDR) phenomenon in a resonant tunneling diode (RTD) at room temperature has been challenging
due to carrier scattering related to interfacial imperfections.
10-12
This is unavoidable in the study of conductive
semiconductor heterostructures using advanced epitaxial growth techniques. However, one of 2D material
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Abstract: Recent developments in synthesis and nanofabrication technologies offer the tantalizing prospect of realizing various applications from two-dimensional (2D) materials. A revolutionary development is to flexibly construct many different kinds of heterostructures with a diversity of 2D materials. These 2D heterostructures play an important role in semiconductor and condensed matter physics studies and are promising candidates for new device designs in the fields of integrated circuits and quantum sciences. Theoretical and experimental studies have focused on both vertical and lateral 2D heterostructures; the lateral heterostructures are considered to be easier for planner integration and exhibit unique electronic and photoelectronic properties. In this review, we give a summary of the properties of lateral heterostructures with homogeneous junction and heterogeneous junction, where the homogeneous junctions have the same host materials and the heterogeneous junctions are combined with different materials. Afterward, we discuss the applications and experimental synthesis of lateral 2D heterostructures. Moreover, a perspective on lateral 2D heterostructures is given at the end.

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TL;DR: The tunability of the BP work function with variation in flake thickness is exploited in order to demonstrate that a BP-based broken-gap heterojunction can manifest diverse current-transport characteristics such as gate tunable rectifying p-n junction diodes, Esaki diode, backward-rectifying diode, and nonrectifying devices as a consequence of diverse band-bending at the heteroj junction.
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Abstract: Electrostatic control of charge carrier concentration underlies the field-effect transistor (FET), which is among the most ubiquitous devices in the modern world. As transistors and related electronic devices have been miniaturized to the nanometer scale, electrostatics have become increasingly important, leading to progressively sophisticated device geometries such as the finFET. With the advent of atomically thin materials in which dielectric screening lengths are greater than device physical dimensions, qualitatively different opportunities emerge for electrostatic control. In this Review, recent demonstrations of unconventional electrostatic modulation in atomically thin materials and devices are discussed. By combining low dielectric screening with the other characteristics of atomically thin materials such as relaxed requirements for lattice matching, quantum confinement of charge carriers, and mechanical flexibility, high degrees of electrostatic spatial inhomogeneity can be achieved, which enables a diverse range of gate-tunable properties that are useful in logic, memory, neuromorphic, and optoelectronic technologies.

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Abstract: Two-dimensional (2D) transition metal dichalcogenides (TMDs) have very versatile chemical, electrical and optical properties. In particular, they exhibit rich and highly tunable electronic properties, with a bandgap that spans from semi-metallic up to 2 eV depending on the crystal phase, material composition, number of layers and even external stimulus. This paper provides an overview of the electronic devices and circuits based on 2D TMDs, such as Esaki diodes, resonant tunneling diodes (RTDs), logic and RF transistors, tunneling field-effect transistors (TFETs), static random access memories (SRAMs), dynamic RAM (DRAMs), flash memory, ferroelectric memories, resistitive memories and phase-change memories. We address the basic device principles, the advantages and limitations of these 2D electronic devices, and our perspectives on future developments. TOPICAL REVIEW 2019

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28 Jan 2015-ACS Nano
TL;DR: A controllable p-doping technique on tungsten diselenide (WSe2) for p-channel 2D transistors by adjusting the concentration of octadecyltrichlorosilane (OTS) is demonstrated, which is expected to make it possible to successfully integrate future layered semiconductor devices.
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TL;DR: It is shown that a nonresonant beam can be used as an optical gate and can control the device transmission, and distortion of the transmission profile when going to the high-density regime, signature of polariton-polariton interactions.
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TL;DR: In this paper, a 1000 V, 30A bipolar junction transistor (BJT) with high dc current gain in 4H-SiC was presented, which corresponds to a current density of 333 A/cm/sup 2/, at a forward voltage drop of 2 V.
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TL;DR: Bipolar transistors with phosphorus-doped emitters and sub-50 nm epitaxial bases have been fabricated in a low thermal-cycle process to explore the trade-offs between cutoff frequency, breakdown voltage and early voltage as discussed by the authors.
Abstract: Bipolar transistors with phosphorus-doped emitters and sub-50 nm epitaxial bases have been fabricated in a low thermal-cycle process to explore the trade-offs between cutoff frequency, breakdown voltage and Early voltage Record peak f/sub T/s of 73 GHz for a Si BJT and 113 GHz for a SiGe HBT with respective /spl beta/V/sub A/ products of 630 and 48,400 V were obtained for intrinsic base sheet resistances of 26 and 7 k/spl Omega/spl square/ >

82 citations

Journal ArticleDOI
TL;DR: A BJT device is demonstrated in exfoliated TMD semiconductor WSe2 using buried gates to electrostatically create doped regions with back-to-back p-n junctions and a current gain of 1000 and photocurrent gain of 40 are demonstrated.
Abstract: In the development of semiconductor devices, the bipolar junction transistor (BJT) features prominently as being the first solid state transistor that helped to usher in the digital revolution. For any new semiconductor, therefore, the fabrication and characterization of the BJT are important for both technological importance and historical significance. Here, we demonstrate a BJT device in exfoliated TMD semiconductor WSe2. We use buried gates to electrostatically create doped regions with back-to-back p–n junctions. We demonstrate two central characteristics of a bipolar device: current gain when operated as a BJT and a photocurrent gain when operated as a phototransistor. We demonstrate a current gain of 1000 and photocurrent gain of 40 and describe features that enhance these properties due to the doping technique that we employ.

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Frequently Asked Questions (2)
Q1. What are the contributions in "Atomic-monolayer two-dimensional lateral quasi-heterojunction bipolar transistors with resonant tunneling phenomenon" ?

In this paper, two types of the lateral quasiheterojunction bipolar transistor, n-p-n and p-n-p, are meticulously fabricated and studied in the same piece of a tabletop, in order to compare the device performance between them. 

The results are fascinating and promising for the future development of electronics based on the concept of quasi- heterojunction bipolar transistor using a monolayer 2D lateral heterojunctions.