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Crystalline Oxides on Silicon: The First Five Monolayers

Rodney A. McKee, +2 more
- 01 Oct 1998 - 
- Vol. 81, Iss: 14, pp 3014-3017
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TLDR
In this paper, a metaloxide-semiconductor capacitor using SrTiO{sub 3} as an alternative to SiOthinsp{sub 2} yields the extraordinary result of t{sub eqlt}10 {Angstrom}.
Abstract
The long-standing problem of growing a commensurate crystalline oxide interface with silicon has been solved. Alkaline earth and perovskite oxides can be grown in perfect registry on the (001) face of silicon, totally avoiding the amorphous silica phase that ordinarily forms when silicon is exposed to an oxygen containing environment. The physics of the heteroepitaxy lies in establishing a sequenced transition that uniquely addresses the thermodynamics of a layer-by-layer energy minimization at the interface. A metal-oxide-semiconductor capacitor using SrTiO{sub 3} as an alternative to SiOthinsp{sub 2} yields the extraordinary result of t{sub eq}{lt}10 {Angstrom} . {copyright} {ital 1998} {ital The American Physical Society}

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High-κ gate dielectrics: Current status and materials properties considerations

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Band offsets of wide-band-gap oxides and implications for future electronic devices

TL;DR: In this paper, the Schottky barrier heights and band offsets for high dielectric constant oxides on Pt and Si were calculated and good agreement with experiment is found for barrier heights.
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Physics of thin-film ferroelectric oxides

TL;DR: In this article, the authors introduce the current state of development in the application of ferroelectric thin films for electronic devices and discuss the physics relevant for the performance and failure of these devices.
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Ferroelectric thin films: Review of materials, properties, and applications

TL;DR: An overview of the state of the art in ferroelectric thin films is presented in this paper, where the authors review applications: micro-systems' applications, applications in high frequency electronics, and memories based on Ferroelectric materials.
Journal ArticleDOI

High dielectric constant gate oxides for metal oxide Si transistors

TL;DR: In this article, a review of the development of high-k gate oxides such as hafnium oxide (HFO) and high-K oxides is presented, with the focus on the work function control in metal gate electrodes.
References
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Book

Thermochemical properties of inorganic substances

Ihsan Barin, +1 more
TL;DR: In this paper, a volume of tables conveying the thermochemical parameters of more than 2000 substances, cover enthalpy, entropy, chemical potential and Planck's function, and commentaries on the chemical reactions of the relevant component and indications of stability/metastability.
BookDOI

Fundamental aspects of ultrathin dielectrics on si-based devices

TL;DR: In this paper, the SiO2/Si and SiOxNy/Si systems were discussed and discussed in terms of growth mechanism, processing, and analysis of (Oxy)nitridation.
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