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Journal ArticleDOI

Degradations of silicon photovoltaic modules: A literature review

01 Oct 2013-Solar Energy (Pergamon)-Vol. 96, pp 140-151
TL;DR: A review of different types of degradation found in literature in recent years is presented, according to literature, corrosion and discoloration of PV modules encapsulant are predominant degradation modes.
About: This article is published in Solar Energy.The article was published on 2013-10-01. It has received 369 citations till now. The article focuses on the topics: Photovoltaic system.
Citations
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Journal ArticleDOI
TL;DR: Recommendations are made on how accelerated testing should be performed to rapidly develop solar cells that are both extraordinarily efficient and stable.
Abstract: This review article examines the current state of understanding in how metal halide perovskite solar cells can degrade when exposed to moisture, oxygen, heat, light, mechanical stress, and reverse bias. It also highlights strategies for improving stability, such as tuning the composition of the perovskite, introducing hydrophobic coatings, replacing metal electrodes with carbon or transparent conducting oxides, and packaging. The article concludes with recommendations on how accelerated testing should be performed to rapidly develop solar cells that are both extraordinarily efficient and stable.

962 citations

Journal ArticleDOI
TL;DR: The types and causes of PV systems (PVS) failures are presented, then different methods proposed in literature for FDD of PVS are reviewed and discussed; particularly faults occurring in PV arrays (PVA).
Abstract: Faults in any components (modules, connection lines, converters, inverters, etc.) of photovoltaic (PV) systems (stand-alone, grid-connected or hybrid PV systems) can seriously affect the efficiency, energy yield as well as the security and reliability of the entire PV plant, if not detected and corrected quickly. In addition, if some faults persist (e.g. arc fault, ground fault and line-to-line fault) they can lead to risk of fire. Fault detection and diagnosis (FDD) methods are indispensable for the system reliability, operation at high efficiency, and safety of the PV plant. In this paper, the types and causes of PV systems (PVS) failures are presented, then different methods proposed in literature for FDD of PVS are reviewed and discussed; particularly faults occurring in PV arrays (PVA). Special attention is paid to methods that can accurately detect, localise and classify possible faults occurring in a PVA. The advantages and limits of FDD methods in terms of feasibility, complexity, cost-effectiveness and generalisation capability for large-scale integration are highlighted. Based on the reviewed papers, challenges and recommendations for future research direction are also provided.

308 citations

Journal ArticleDOI
TL;DR: In this paper, a critical review of the available literature is given to serve as a one-stop source for understanding the current status of potential-induced degradation (PID) research.
Abstract: Potential-induced degradation (PID) has received considerable attention in recent years due to its detrimental impact on photovoltaic (PV) module performance under field conditions. Both crystalline silicon (c-Si) and thin-film PV modules are susceptible to PID. While extensive studies have already been conducted in this area, the understanding of the PID phenomena is still incomplete and it remains a major problem in the PV industry. Herein, a critical review of the available literature is given to serve as a one-stop source for understanding the current status of PID research. This paper also aims to provide an overview of future research paths to address PID-related issues. This paper consists of three parts. In the first part, the modelling of leakage current paths in the module package is discussed. The PID mechanisms in both c-Si and thin-film PV modules are also comprehensively reviewed. The second part summarizes various test methods to evaluate PV modules for PID. The last part focuses on studies related to PID in the omnipresent p-type c-Si PV modules. The dependence of temperature, humidity and voltage on the progression of PID is examined. Preventive measures against PID at the cell, module and system levels are illustrated. Moreover, PID recovery in standard p-type c-Si PV modules is also studied. Most of the findings from p-type c-Si PV modules are also applicable to other PV module technologies.

288 citations

Journal ArticleDOI
TL;DR: In this paper, the integration of the diverse factors that affect the performance of photovoltaic panels and how those factors affect performance of the system was introduced. But, the authors did not consider the impact of the different factors on the performance.
Abstract: The objective of this paper is to introduce the integration of the diverse factors that affect the performance of Photovoltaic panels and how those factors affect the performance of the system. Those factors include: environmental, PV system, installation, cost factors as well as other miscellaneous factors. Each of these factors is further classified into novel subcategories along with the reduction/increase effects of some factors on the system output. Solar irradiance, module temperature, dust accumulation, shading and soiling factors are some of the environmental concerns that have major effects. Panel's I-V characteristics, inverter, battery and panel efficiencies, panel material, atomic structure and band-gap energy are some of the system factors. As for the installation factors, cable characteristics, angle of inclination, mismatch effects, fixed/tracking PV mechanisms as well as MPPT are crucial to consider. Concerning the cost factors, the cables and the overall system costs are to be taken into consideration especially during payback period calculations. Other miscellaneous factors have a role in affecting the performance of the system such as degradations in the PV panel, panel resistances, performance ratio, maintenance and cleaning, sizing of the system as well as the surface area of the panel. The study results shall help both practitioners and researchers in having an inclusive overview about the several factors that can have an effect on the performance of the PV panels by removing the burden of having to search several studies under each category of factors. Moreover, researchers can build on this study by researching new ways to decrease the effect of certain factors which can further enhance the performance of the system. On the other hand, practitioners can introduce new systems that can be physically implemented in our daily lives to hinder the effect of factors negatively affecting PV panels’ performance.

228 citations

Journal ArticleDOI
TL;DR: In this paper, the degradation mechanisms of the prominent polymer encapsulant, ethylene-vinyl-acetate copolymer (EVA), and the relationship of the stability of this material to the overall reliability of Si-based PV modules were addressed.
Abstract: Photovoltaic (PV) modules are subject to climate-induced degradation that can affect their efficiency, stability, and operating lifetime. Among the weather and environment related mechanisms, the degradation mechanisms of the prominent polymer encapsulant, ethylene-vinyl-acetate copolymer (EVA), and the relationships of the stability of this material to the overall reliability of Si-based PV modules were addressed. The EVA function and properties correlated to its deterioration factors as temperature, moisture, and ultraviolet radiation (UV) were discussed in this work. The main objective of this study is to review the literature on EVA encapsulation and its degradation, which promotes the loss in performance of the PV module. The deleterious effects on EVA such as photodegradation, moisture, delamination, bubble formation and potential induced degradation (PID), their relationship with the polymer structure, chemical, mechanical, optical and electrical properties are approaches carried out in this review. This paper also provides a brief review of the developing field of EVA composites technology aiming at higher performance materials.

223 citations

References
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Journal ArticleDOI
TL;DR: In this paper, the degradation rates of flat-plate terrestrial modules and systems reported in published literature from field testing throughout the last 40 years have been analyzed, showing a median value of 0·5%/year.
Abstract: As photovoltaic penetration of the power grid increases, accurate predictions of return on investment require accurate prediction of decreased power output over time. Degradation rates must be known in order to predict power delivery. This article reviews degradation rates of flat-plate terrestrial modules and systems reported in published literature from field testing throughout the last 40 years. Nearly 2000 degradation rates, measured on individual modules or entire systems, have been assembled from the literature, showing a median value of 0·5%/year. The review consists of three parts: a brief historical outline, an analytical summary of degradation rates, and a detailed bibliography partitioned by technology. Copyright © 2011 John Wiley & Sons, Ltd.

1,202 citations

ReportDOI
01 Mar 1995
TL;DR: In this article, the authors present a guide for analyzing the economics of energy efficiency and renewable energy (EE) technologies and projects, which is intended to help analysts determine the appropriate approach or type of analysis and the appropriate level of detail.
Abstract: This manual is a guide for analyzing the economics of energy efficiency and renewable energy (EE) technologies and projects. It is intended (1) to help analysts determine the appropriate approach or type of analysis and the appropriate level of detail and (2) to assist EE analysts in completing consistent analyses using standard assumptions and bases, when appropriate. Included are analytical techniques that are commonly required for the economic analysis of EE technologies and projects. The manual consists of six sections: Introduction, Fundamentals, Selection Criteria Guide, Economic Measures, Special Considerations for Conservation and Renewable Energy Systems, and References. A glossary and eight appendices are also included. Each section has a brief introductory statement, a presentation of necessary formulae, a discussion, and when appropriate, examples and descriptions of data and data availability. The objective of an economic analysis is to provide the information needed to make a judgment or a decision. The most complete analysis of an investment in a technology or a project requires the analysis of each year of the life of the investment, taking into account relevant direct costs, indirect and overhead costs, taxes, and returns on investment, plus any externalities, such as environmental impacts, that are relevant to the decision to be made. However, it is important to consider the purpose and scope of a particular analysis at the outset because this will prescribe the course to follow. The perspective of the analysis is important, often dictating the approach to be used. Also, the ultimate use of the results of an analysis will influence the level of detail undertaken. The decision-making criteria of the potential investor must also be considered.

835 citations

Journal ArticleDOI
TL;DR: This paper provides a review of many of the AT models that have been use successfully in this area and makes important contributions in the development of appropriate stochastic models for AT data.
Abstract: Engineers in the manufacturing industries have used accelerated test (AT) experiments for many decades. The purpose of AT experiments is to acquire reliability information quickly. Test units of a material, component, subsystem, or entire systems are subjected to higher-than-usual levels of one or more accelerating variables such as temperature or stress. Then the AT results are used to predict life of the units at use conditions. The extrapolation is typically justified (correctly or incorrectly) on the basis of physically motivated models or a combination of empirical model fitting with a sufficient amount of previous experience in testing similar units. The need to extrapolate in both time and the accelerating variables generally necessitates the use of fully parametric models. Statisticians have made important contributions in the development of appropriate stochastic models for AT data (typically a distribution for the response and regression relationships between the parameters of this distribution and the accelerating variable(s)), statistical methods for AT planning (choice of accelerating variable levels and allocation of available test units to those levels), and methods of estimation of suitable reliability metrics. This paper provides a review of many of the AT models that have been use successfully in this area.

622 citations

Proceedings ArticleDOI
20 Jun 2010
TL;DR: In this paper, a test setup is presented for simulation of the potential induced degradation (PID) in the lab and the influence of cell properties on PID is demonstrated in order to reveal the cell being the precondition for the PID.
Abstract: Since solar energy generation is getting more and more important worldwide PV systems and solar parks are becoming larger consisting of an increasing number of solar panels being serially interconnected. As a consequence panels are frequently exposed to high relative potentials towards ground causing High Voltage Stress (HVS). The effect of HVS on long term stability of solar panels depending on the leakage current between solar cells and ground has been first addressed by NREL in 2005 [1]. This potential degradation mechanism is not monitored by the typical PV tests listed in IEC 61215 [2]. Depending on the technology different types of Potential Induced Degradation (PID) occur. This paper is focusing on PID of wafer based standard p-type silicon technology aiming on increasing life times for solar panels once exposed to external potentials in the field. A test setup is presented for simulation of the PID in the lab and the influence of cell properties on PID is demonstrated in order to reveal the cell being the precondition for the PID. However, PID can also be stopped or minimized on panel and system level as shown in the paper.

346 citations