Journal ArticleDOI
Digital Speckle Pattern Interferometry & Related Techniques
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TLDR
Digital Speckle Pattern Interference (DSPI) is a class of important interferometric techniques such as TV holography or phase shifting pattern interferometry, all of which involve similar optical and electronic principles as discussed by the authors.Citations
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Fringe pattern analysis using deep learning
TL;DR: Inspired by recent successes of deep learning techniques for computer vision and other applications, it is demonstrated for the first time that the deep neural networks can be trained to perform fringe analysis, which substantially enhances the accuracy of phase demodulation from a single fringe pattern.
Journal ArticleDOI
Reduction of speckle in digital holography by discrete Fourier filtering.
Jonathan Maycock,Bryan M. Hennelly,John McDonald,Yann Frauel,Albertina Castro,Bahram Javidi,Thomas J. Naughton +6 more
TL;DR: A digital signal processing technique that reduces the speckle content in reconstructed digital holograms based on sequential sampling of the discrete Fourier transform of the reconstructed image field is presented.
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Interferometric technique to measure biomechanical changes in the cornea induced by refractive surgery.
TL;DR: Results show that in the formation of the microkeratome flap, collagen fibers are severed and minimal biomechanical loading is distributed through the flap, which shows that corneal biomechanicals integrity is compromised after microker atome incisions.
Journal ArticleDOI
Fringe pattern analysis using deep learning
TL;DR: In this article, the authors demonstrate that deep neural networks can be trained to perform fringe analysis, which substantially enhances the accuracy of phase demodulation from a single fringe pattern, using carrier fringe patterns under the scenario of fringe projection profilometry.
Journal ArticleDOI
Two-wavelength micro-interferometry for 3-D surface profiling
TL;DR: In this article, a two-wavelength micro-interferometric setup for 3D surface profile characterization of smooth as well as rough micro-specimens is described. But the method cannot handle smooth profiles and step heights less than half a wavelength.