Book•
Digital Systems Testing and Testable Design
01 Jan 1990-
TL;DR: The new edition of Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems offers comprehensive and state-ofthe-art treatment of both testing and testable design.
Abstract: For many years, Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems was the most widely used textbook in digital system testing and testable design. Now, Computer Science Press makes available a new and greativ expanded edition. Incorporating a significant amount of new material related to recently developed technologies, the new edition offers comprehensive and state-ofthe-art treatment of both testing and testable design.
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TL;DR: Experimental results obtained from a large number of benchmarks indicate that application of the proposed conflict analysis techniques to SAT algorithms can be extremely effective for aLarge number of representative classes of SAT instances.
Abstract: This paper introduces GRASP (Generic seaRch Algorithm for the Satisfiability Problem), a new search algorithm for Propositional Satisfiability (SAT). GRASP incorporates several search-pruning techniques that proved to be quite powerful on a wide variety of SAT problems. Some of these techniques are specific to SAT, whereas others are similar in spirit to approaches in other fields of Artificial Intelligence. GRASP is premised on the inevitability of conflicts during the search and its most distinguishing feature is the augmentation of basic backtracking search with a powerful conflict analysis procedure. Analyzing conflicts to determine their causes enables GRASP to backtrack nonchronologically to earlier levels in the search tree, potentially pruning large portions of the search space. In addition, by "recording" the causes of conflicts, GRASP can recognize and preempt the occurrence of similar conflicts later on in the search. Finally, straightforward bookkeeping of the causality chains leading up to conflicts allows GRASP to identify assignments that are necessary for a solution to be found. Experimental results obtained from a large number of benchmarks indicate that application of the proposed conflict analysis techniques to SAT algorithms can be extremely effective for a large number of representative classes of SAT instances.
1,414 citations
Cites methods from "Digital Systems Testing and Testabl..."
...Iterated application of the unit clause rule is commonly referred to as Boolean Constraint Propagation (BCP) [39] or as derivation of implications in the electronic CAD literature [1]....
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10 Nov 1996
TL;DR: Experimental results obtained from a large number of benchmarks, including many from the field of test pattern generation, indicate that application of the proposed conflict analysis techniques to SAT algorithms can be extremely effective for aLarge number of representative classes of SAT instances.
Abstract: This paper introduces GRASP (Generic seaRch Algorithm for the Satisfiability Problem), an integrated algorithmic framework for SAT that unifies several previously proposed search-pruning techniques and facilitates identification of additional ones. GRASP is premised on the inevitability of conflicts during search and its most distinguishing feature is the augmentation of basic backtracking search with a powerful conflict analysis procedure. Analyzing conflicts to determine their causes enables GRASP to backtrack non-chronologically to earlier levels in the search tree, potentially pruning large portions of the search space. In addition, by "recording" the causes of conflicts, GRASP can recognize and preempt the occurrence of similar conflicts later on in the search. Finally, straightforward bookkeeping of the causality chains leading up to conflicts allows GRASP to identify assignments that are necessary for a solution to be found. Experimental results obtained from a large number of benchmarks, including many from the field of test pattern generation, indicate that application of the proposed conflict analysis techniques to SAT algorithms can be extremely effective for a large number of representative classes of SAT instances.
910 citations
Cites methods from "Digital Systems Testing and Testabl..."
...Iterated application of the unit clause rule is commonly referred to as Boolean Constraint Propagation (BCP) [30] or as derivation of implications in the electronic CAD literature [1]....
[...]
01 Jan 1995
TL;DR: This work examines the benefits and problems inherent in asynchronous computations, and in some of the more notable design methodologies, which include Huffman asynchronous circuits, burst-mode circuits, micropipelines, template-based and trace theory-based delay-insensitive circuits, signal transition graphs, change diagrams, and complication-based quasi-delay-insensitivity circuits.
Abstract: Asynchronous design has been an active area of research since at least the mid 1950's, but has yet to achieve widespread use. We examine the benefits and problems inherent in asynchronous computations, and in some of the more notable design methodologies. These include Huffman asynchronous circuits, burst-mode circuits, micropipelines, template-based and trace theory-based delay-insensitive circuits, signal transition graphs, change diagrams, and complication-based quasi-delay-insensitive circuits. >
612 citations
Cites methods from "Digital Systems Testing and Testabl..."
...First, the technique of adding redundant terms to functions to eliminate hazards is in direct conflict with the fault testing technique of avoiding redundant terms to make faults visible ([14] pp....
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Book•
01 Jul 2006
TL;DR: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time- to-volume.
509 citations
Patent•
19 Aug 2010
TL;DR: In this article, a system includes a semiconductor device consisting of a first single crystal silicon layer comprising first transistors, first alignment marks, and at least one metal layer overlying the first single-crystalline silicon layer.
Abstract: A system includes a semiconductor device. The semiconductor device includes a first single crystal silicon layer comprising first transistors, first alignment marks, and at least one metal layer overlying the first single crystal silicon layer, wherein the at least one metal layer comprises copper or aluminum more than other materials; and a second single crystal silicon layer overlying the at least one metal layer. The second single crystal silicon layer comprises a plurality of second transistors arranged in substantially parallel bands. Each of a plurality of the bands comprises a portion of the second transistors along an axis in a repeating pattern.
417 citations