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Digital Systems Testing and Testable Design
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TLDR
The new edition of Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems offers comprehensive and state-ofthe-art treatment of both testing and testable design.Abstract:
For many years, Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems was the most widely used textbook in digital system testing and testable design. Now, Computer Science Press makes available a new and greativ expanded edition. Incorporating a significant amount of new material related to recently developed technologies, the new edition offers comprehensive and state-ofthe-art treatment of both testing and testable design.read more
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Proceedings ArticleDOI
Systematic validation of pipeline interlock for superscalar microarchitectures
T.A. Diep,J.P. Shen +1 more
TL;DR: A new approach to microarchitecture validation that adopts a paradigm analogous to that of automatic test pattern generation (ATPG) for digital logic testing is presented, which can achieve higher sequences coverage in fewer cycles than adhoc approaches.
Journal ArticleDOI
On-Line Techniques for Error Detection and Correction in Processor Registers with Cross-Parity Check
TL;DR: The Cross-Parity check is proposed as a method for an on-line detection of multiple bit-errors in registers or register files of microprocessors and an easy implementable error correction method is proposed, which can be implemented by software routines or additional hardware.
Journal ArticleDOI
Novel test pattern generators for pseudoexhaustive testing
TL;DR: Hardware efficient test pattern generators that employ knowledge of the circuit output cone structures for generating minimal test sets are described and designed that generate minimum size test sets for the ISCAS benchmark circuits.
Posted Content
Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown
TL;DR: A model for operational OBD defects is developed, and how to test for faults due to OBD is explored, so that these test patterns can be propagated and justified for a combinational circuit in a manner similar to traditional ATPG.
Proceedings ArticleDOI
Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models
Huaxing Tang,Brady Benware,M. Reese,Joseph Caroselli,Thomas Herrmann,Friedrich Hapke,Robert Tao,Wu-Tung Cheng,Manish Sharma +8 more
TL;DR: A new cell-aware diagnosis algorithm, based on accurate fault models derived by analog simulation, that can pinpoint the defect location within a cell for various cell internal defects is proposed.