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Digital Systems Testing and Testable Design
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TLDR
The new edition of Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems offers comprehensive and state-ofthe-art treatment of both testing and testable design.Abstract:
For many years, Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems was the most widely used textbook in digital system testing and testable design. Now, Computer Science Press makes available a new and greativ expanded edition. Incorporating a significant amount of new material related to recently developed technologies, the new edition offers comprehensive and state-ofthe-art treatment of both testing and testable design.read more
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Proceedings ArticleDOI
Integer programming models for optimization problems in test generation
TL;DR: It is shown that finding the optimally compacted test set can be cast as an integer linear programming (ILP) optimization problem, thus providing a formal framework for characterizing this optimization problem as well as the heuristics commonly used in its solution.
Journal ArticleDOI
Reconfigurable logic blocks based on a chaotic Chua circuit
TL;DR: In this article, a chaotic logic block that can morph between two input, one output logic gates was constructed, out of discrete circuitry, and the sensitivity of such a block to noise was investigated.
Proceedings ArticleDOI
Fault escapes in duplex systems
TL;DR: It is shown that the algorithm for identifying non-self-testable faults runs orders of magnitude faster than exact techniques with minimal loss of accuracy, and there is a significant reduction in the number of test points required for duplex systems with diverse implementations compared to duplex system with identical implementations.
Book ChapterDOI
Test Set Embedding Based on Phase Shifters
TL;DR: This paper presents a new method for designing test pattern generators (TPG) for the embedding of precomputed test sets based on the use of an LFSR and phase shifters and produces the exact test set.
Proceedings ArticleDOI
Diagnostic Test Generation Based on Subsets of Faults
Irith Pomeranz,Sudhakar M. Reddy +1 more
TL;DR: A diagnostic test generation procedure that deals with the large numbers of target fault pairs by considering subsets of faults, which are defined based on structural analysis of the circuit.