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Digital Systems Testing and Testable Design
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TLDR
The new edition of Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems offers comprehensive and state-ofthe-art treatment of both testing and testable design.Abstract:
For many years, Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems was the most widely used textbook in digital system testing and testable design. Now, Computer Science Press makes available a new and greativ expanded edition. Incorporating a significant amount of new material related to recently developed technologies, the new edition offers comprehensive and state-ofthe-art treatment of both testing and testable design.read more
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Journal ArticleDOI
Procedures for static compaction of test sequences for synchronous sequential circuits
Irith Pomeranz,Sudhakar M. Reddy +1 more
TL;DR: Several compaction procedures for synchronous sequential circuits based on test vector restoration are proposed, including limiting the test vectors initially omitted from the test sequence, consideration of several faults in parallel during restoration, and the use of a parallel fault simulator.
Proceedings ArticleDOI
Exploiting the selfish gene algorithm for evolving cellular automata
TL;DR: This paper shows an application in the field of Electronic CAD of the Selfish Gene algorithm, an evolutionary algorithm based on a recent interpretation of the Darwinian theory for determining the logic for a BIST architecture based on Cellular Automata (CA).
Proceedings ArticleDOI
Real time fault injection using logic emulators
R. Sedaghat-Maman,E. Barke +1 more
TL;DR: A hardware based approach to Fault Emulation independent of the logic emulation system in use has been developed and is presented, allowing for system testing at real time speed.
Proceedings ArticleDOI
Diagnosis of Cell Internal Defects with Multi-cycle Test Patterns
TL;DR: In this paper, a methodology to accurately diagnose cell internal defects when test patterns with multiple capture cycles are used is presented and a new method is proposed to locate defective cell locations without using stuck-at fault model.
Proceedings ArticleDOI
Investigation into voltage and process variation-aware manufacturing test
TL;DR: This paper addresses two important defect types, resistive bridge defects and full open defects, and presents foundational work on variation-aware test methods, and implemented the test methods and integrated them into a flow of commercial EDA tools.