Digital Systems Testing and Testable Design
Citations
53 citations
52 citations
Cites methods from "Digital Systems Testing and Testabl..."
...Design-for-test (DFT) methods to reduce test cost include scan ([2], [3]) and, increasingly, BIST [4], [5]....
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52 citations
Cites background or methods from "Digital Systems Testing and Testabl..."
...Th e results from the applied test vectors are collected from the function outputf and from the extra observable outputs o1 ando2; then compressed in the signature register, which can simply be an LFSR based Multiple Input Signature Register (MISR) [1]....
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...The large increase in the complexity of ASICs has led to a much greater need for circuit testability and Built-In-Sel f-Test (BIST) [1]....
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52 citations
52 citations
Cites methods from "Digital Systems Testing and Testabl..."
...ATPG is used primarily for manufacturing-fault test-vector generation, but has found applications in logic synthesis and bounded model checking [3, 12]....
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