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Digital Systems Testing and Testable Design
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TLDR
The new edition of Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems offers comprehensive and state-ofthe-art treatment of both testing and testable design.Abstract:
For many years, Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems was the most widely used textbook in digital system testing and testable design. Now, Computer Science Press makes available a new and greativ expanded edition. Incorporating a significant amount of new material related to recently developed technologies, the new edition offers comprehensive and state-ofthe-art treatment of both testing and testable design.read more
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Patent
Semiconductor and optoelectronic devices
Zvi Or-Bach,Deepak C. Sekar +1 more
TL;DR: An integrated device consisting of a first layer covered by an oxide layer, a second layer overlying the oxide layer and a third layer consisting of single crystal transistors is described in this paper.
Proceedings ArticleDOI
B-algorithm: a behavioral test generation algorithm
Chang Hyun Cho,J.R. Armstrong +1 more
TL;DR: A behavioral test generation algorithm (called the B-algorithm) is presented which generates tests directly from behavioral VHDL circuit descriptions using three types of behavioral faults (behavioral stuck-at faults, behavioral stuck-open faults, and micro-operation faults).
Journal ArticleDOI
Test vector decomposition-based static compaction algorithms for combinational circuits
Aiman H. El-Maleh,Yahya Osais +1 more
TL;DR: A new approach to static compaction for combinational circuits, referred to as test vector decomposition (TVD), is proposed and two new TVD basedstatic compaction algorithms are presented.
Proceedings ArticleDOI
Efficient spectral techniques for sequential ATPG
TL;DR: A new test generation procedure for sequential circuits using spectral techniques is presented, showing that very high fault coverages and small vector sets are consistently obtained in short execution times for sequential benchmark circuits.
Proceedings ArticleDOI
On improving the accuracy of multiple defect diagnosis
TL;DR: Experimental results on ISCAS85 benchmark circuits indicate that the proposed heuristic for diagnosing a full-scan design with multiple defects outperforms the conventional heuristics.