Digital Systems Testing and Testable Design
Citations
38 citations
Cites methods from "Digital Systems Testing and Testabl..."
...This scheme results in large area overheads on the data paths from the TPG to the control points and from the observation points to the ORA....
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...The ORA is used to analyze the output response and .ag defective circuits....
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...The BILBO gives no .exibility to designers on the TPG and the ORA, but the B2IST does....
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...A multiple input signature register (MISR) is the most well known ORA....
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...A single data line makes it feasible to move the TPG and the ORA to other locations....
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38 citations
Cites background or methods from "Digital Systems Testing and Testabl..."
...Implementations of test points that support this view can be found in [26]....
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...The proposed method consists of placing test points [26] in...
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...A test point placed on a line is assumed to make both controllable and observable [26]....
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38 citations
Cites background from "Digital Systems Testing and Testabl..."
...Semiconductor manufacturing processes are yield processes: a significant fraction of manufactured microchips are defective [1]....
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37 citations
37 citations