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Digital Systems Testing and Testable Design
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TLDR
The new edition of Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems offers comprehensive and state-ofthe-art treatment of both testing and testable design.Abstract:
For many years, Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems was the most widely used textbook in digital system testing and testable design. Now, Computer Science Press makes available a new and greativ expanded edition. Incorporating a significant amount of new material related to recently developed technologies, the new edition offers comprehensive and state-ofthe-art treatment of both testing and testable design.read more
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Proceedings ArticleDOI
Sequential circuits with combinational test generation complexity
A. Balakrishnan,S.T. Chakradhar +1 more
TL;DR: A new design for testability (DFT) technique which guarantees that tests can be derived using a combinational test generator, and provides efficient methods to select scan flip-flops and/or test points to reduce any sequential circuit to a strongly balanced structure.
Journal ArticleDOI
Eliminating false positives in crosstalk noise analysis
TL;DR: A method to check the "true" noise impact on path delay is proposed, which uses four-variable Boolean logic to characterize signal transitions in a time interval, and formulates Boolean satisfiability between aggressors and a victim under the min-max delay model for gates.
Proceedings ArticleDOI
Interactive presentation: On power-profiling and pattern generation for power-safe scan tests
TL;DR: In this article, a timing-based, power and layout-aware pattern generation technique is proposed to minimize both global and localized switching activity in WSNs. But, the technique is not suitable for WSN-based applications.
Journal ArticleDOI
Fault Detection Structures of the S-boxes and the Inverse S-boxes for the Advanced Encryption Standard
TL;DR: This paper presents fault detection structures of the S-boxes and the inverse S- boxes for designing high performance architectures of the Advanced Encryption Standard and suggests new fault detection schemes for these structures.
Proceedings ArticleDOI
UltraScan: using time-division demultiplexing/multiplexing (TDDM/TDM) with VirtualScan for test cost reduction
Laung-Terng Wang,Khader S. Abdel-Hafez,Xiaoqing Wen,Boryau Sheu,Shianling Wu,Shyh-Horng Lin,Ming-Tung Chang +6 more
TL;DR: This paper describes time-division demultiplexing and multiplexing of high-data-rate scan patterns applied on I/O's into low- data-rate scans applied on VirtualScan compression circuitry to further reduce test application time and test pin-count without coverage loss.