Elastic analysis of some punch problems for a layered medium
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...Micro-Raman spectroscopy has evolved as a possible experimental method for estimating local stress in nonplanar, submicron scale structures of interest in very large scale integration (VLSI) devices and MEMS; see, for example, Kobayashi et al. (1990) and DeWolf et al....
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...where E∗ is the reduced elastic modulus of the indenter{material system, E and o represent, as before, the elastic modulus and Poisson ratio, respectively, with the subscripts `s' and `in' denoting the specimen and the indenter, respectively, Ac is the projected contact area of the impression produced on the indented surface at the maximum load Pm, and the non-dimensional constant ®∗, which is on the order of unity, represents a correction factor which accounts for the shape of the indenter tip (King 1987); (Doerner and Nix 1988); (Oliver and Pharr 1992); (Dao et al....
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