Journal ArticleDOI
Electrical properties of 70wt.%Cr-30wt.%SiO thin films
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TLDR
In this article, the electrical and structural properties of flash-evaporated 70wt.%Cr-30wt.%.SiO cermet films were investigated and it was found that the electrical properties depend on the deposition conditions, thickness of the films, substrate roughness and post-deposition thermal treatment.About:
This article is published in Thin Solid Films.The article was published on 1983-03-11. It has received 7 citations till now. The article focuses on the topics: Carbon film & Thin film.read more
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SiCr THIN FILM RESISTORS HAVING IMPROVED TEMPERATURE COEFFICIENTS OF RESISTANCE AND SHEET RESISTANCE
TL;DR: In this article, a process for increasing the sheet resistance and lowering the temperature coefficient of resistance of a thin film resistor deposited on a wafer is described. But this process is restricted to a single wafer.
Journal ArticleDOI
Degradation of CrSi(W)O resistive films
TL;DR: In this paper, the aging behavior of resistive resistive films with film composition Cr 42 Si 56 W 2 O (W 2 O ) has been investigated as a function of the annealing conditions, aging time, storage temperature, film thickness, additional current flow, moist atmosphere and protective layer.
Journal ArticleDOI
Modelling and experimental studies of properties of TiN coatings
TL;DR: In this paper, a review of the area of theoretical modelling and experimental studies of the various properties of titanium nitride coatings is presented, including hardness, adhesion and residual stresses.
Journal ArticleDOI
Magnetic properties of FeSiO films
TL;DR: The results of an experimental investigation of the magnetic properties of Fe100−x(SiO)x cermet thin films (where x is the volume percentage of SiO in the film) in the concentration range 10 vol.% as mentioned in this paper are given.
Journal ArticleDOI
Growth of oxide layers on CrSiO films
TL;DR: In this paper, a detailed analysis of the dependence of thickness of the resistance R and the temperature coefficient of resistivity (TCR) of as-grown and annealed films was investigated.
References
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Journal ArticleDOI
Structural and electrical properties of granular metal films
TL;DR: In this article, the transition from the metallic regime to the dielectric regime (10−50 A size isolated metal particles in an insulator continuum) is associated with the breaking up of a metal, where the volume fraction of metal, x, was varied from x = 1 to x = 0.05.
Journal ArticleDOI
Electrical and structural properties of thin gold films obtained by vacuum evaporation and sputtering
TL;DR: In this article, the results of investigations of the electrical and structural properties of thin gold films deposited onto borosilicate glass and rocksalt single crystals by vacuum evaporation and sputtering are presented.
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Resistivity and Structure of Cr–SiO Cermet Films
TL;DR: In this paper, the structure, resistivity and temperature coefficient of resistance (TCR) of Cr-SiO films with controlled compositions from 0 to 50 at. % SiO have been investigated.
Journal ArticleDOI
Resistivity of cermet films containing oxides of silicon
TL;DR: In this paper, the resistivity of various metal-silicon oxide cermets and its variation with composition is reviewed and it is found that the resistivities of any cermet containing SiO or SiO 2 can be predicted with fair accuracy from the volume per cent SiO2 alone.
Journal ArticleDOI
Charge transfer in discontinuous thin and cermet films
Robert M. Hill,Timothy J. Coutts +1 more
TL;DR: In this paper, the influence of particle sizes and spacings on the electrical properties of discontinuous metal and cermet films is examined, and it is shown that a well-defined activation energy will only be observed at high temperatures, or in a highly regular array where charge transfer occurs between nearest spatial neighbours.