scispace - formally typeset
Search or ask a question
Journal ArticleDOI

Elements of X‐Ray Diffraction

01 Mar 1957-Physics Today (American Institute of Physics)-Vol. 10, Iss: 3, pp 50-50
About: This article is published in Physics Today.The article was published on 1957-03-01. It has received 2605 citations till now. The article focuses on the topics: Electron backscatter diffraction & Selected area diffraction.
Citations
More filters
Journal ArticleDOI
TL;DR: In this paper, the fabrication, properties, and solar energy applications of highly ordered TiO 2 nanotube arrays made by anodic oxidation of titanium in fluoride-based electrolytes are reviewed.

1,905 citations

Journal ArticleDOI
TL;DR: The influences of annealing time on the densification, crystallization, resistivity (ρ), hall mobility (μ), and carrier concentration of the CIS absorber layers were well investigated in this study.
Abstract: In this study, the Mo-electrode thin films were deposited by a two-stepped process, and the high-purity copper indium selenide-based powder (CuInSe2, CIS) was fabricated by hydrothermal process by Nanowin Technology Co. Ltd. From the X-ray pattern of the CIS precursor, the mainly crystalline phase was CIS, and the almost undetectable CuSe phase was observed. Because the CIS powder was aggregated into micro-scale particles and the average particle sizes were approximately 3 to 8 μm, the CIS power was ground into nano-scale particles, then the 6 wt.% CIS particles were dispersed into isopropyl alcohol to get the solution for spray coating method. Then, 0.1 ml CIS solution was sprayed on the 20 mm × 10 mm Mo/glass substrates, and the heat treatment for the nano-scale CIS solution under various parameters was carried out in a selenization furnace. The annealing temperature was set at 550°C, and the annealing time was changed from 5 to 30 min, without extra Se content was added in the furnace. The influences of annealing time on the densification, crystallization, resistivity (ρ), hall mobility (μ), and carrier concentration of the CIS absorber layers were well investigated in this study.

1,861 citations

Journal ArticleDOI
TL;DR: In this paper, the root mean square strain was determined from the interplanar spacing and strain estimated from the three models, viz, uniform deformation model, unweighted deformation stress model, and uniform density model.
Abstract: ZnO nanoparticles were prepared by coprecipitation method at 450C. X-ray diffraction result indicates that the sample is having a crystalline wurtzite phase. Transmission electron microscopy (TEM) result reveals that the ZnO sample is spherical in shape with an average grain size of about 50nm. X-ray peak broadening analysis was used to evaluate the crystalline sizes and lattice strain by the Williamson-Hall (W-H) analysis. All other relevant physical parameters such as strain, stress, and energy density values were also calculated using W-H analysis with different models, viz, uniform deformation model, uniform deformation stress model and uniform deformation energy density model. The root mean square strain was determined from the interplanar spacing and strain estimated from the three models. The three models yield different strain values; it may be due to the anisotropic nature of the material. The mean particle size of ZnO nanoparticles estimated from TEM analysis, Scherrers formula and W-H analysis is highly intercorrelated.

1,439 citations

Journal ArticleDOI
04 Oct 2013-JOM
TL;DR: In this paper, four core effects of high-entropy alloys were emphasized, several misconceptions on HEAs were clarified, and several routes for future HEA research and development were suggested.
Abstract: High-entropy alloys (HEAs) are newly emerging advanced materials. In contrast to conventional alloys, HEAs contain multiple principal elements, often five or more in equimolar or near-equimolar ratios. The basic principle behind HEAs is that solid-solution phases are relatively stabilized by their significantly high entropy of mixing compared to intermetallic compounds, especially at high temperatures. This makes them feasibly synthesized, processed, analyzed, and manipulated, and as well provides many opportunities for us. There are huge numbers of possible compositions and combinations of properties in the HEA field. Wise alloy design strategies for suitable compositions and processes to fit the requirements for either academic studies or industrial applications thus become especially important. In this article, four core effects were emphasized, several misconceptions on HEAs were clarified, and several routes for future HEA research and development were suggested.

897 citations

Book
30 Apr 2020
TL;DR: In this paper, the fundamental properties of soft x-rays and extreme ultraviolet (EUV) radiation are discussed and their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft X-ray biomicroscopy.
Abstract: This self-contained, comprehensive book describes the fundamental properties of soft x-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft x-ray biomicroscopy. The author begins by presenting the relevant basic principles such as radiation and scattering, wave propagation, diffraction, and coherence. He then goes on to examine a broad range of phenomena and applications. The topics covered include EUV lithography, biomicroscopy, spectromicroscopy, EUV astronomy, synchrotron radiation, and soft x-ray lasers. He also provides a great deal of useful reference material such as electron binding energies, characteristic emission lines and photo-absorption cross-sections. The book will be of great interest to graduate students and researchers in engineering, physics, chemistry, and the life sciences. It will also appeal to practicing engineers involved in semiconductor fabrication and materials science.

786 citations