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Journal ArticleDOI

Experimental observations on hot-spots and derived acceptance/rejection criteria

01 Aug 2015-Solar Energy (Pergamon)-Vol. 118, pp 28-40
TL;DR: The IES–UPM observations on 200 affected photovoltaic modules are presented, as well as electroluminescence, peak power rating and operating voltage tests have been carried out, and hot-spots temperature gradients larger than 20 °C are proposed as rejecting conditions for routine inspections under contractual frameworks.
About: This article is published in Solar Energy.The article was published on 2015-08-01 and is currently open access. It has received 68 citations till now. The article focuses on the topics: Nominal power (photovoltaic) & Power rating.

Summary (3 min read)

2. Fundamentals of hot-spots

  • The by-pass diode assures V ^ 0, thus limiting the negative biasing and the power dissipation in this cell.
  • Obviously, the maximum hot-spot temperature is then attained when the group is short-circuited or, which is nearly the same, when the bypass-diode is ON.
  • In other words, hot-spot temperature mainly depends on the operating voltage and incident irradiance (which modulates I c ), on the defect gravity (which determines 7SC,D) and on the second quadrant I-V characteristic of the defective cell (which modulates V-D).

Voltage (V)

  • The great dispersion in the second quadrant behavior is notorious.
  • Associated voltage excursions in the defective module are much larger than that corresponding to the non-defective ones.
  • This observation was made at the Cáceres PV plant, at a system with one-axis azimuthal tracking affected by clouds, what explains the evolution of the incident irradiance.
  • The latter are slightly hotter than the former.

4.2. Infrared inspection

  • Where * stands for the Standard Test Conditions (STC).
  • Up to now, there has not been a widely accepted correlation for considering this effect on the heating of PV modules (IEC, 2014) .
  • Nevertheless, the authors think that there is a certain advantage of assuming that the hot-spot temperature is proportional to the incident irradiance.

4.3. Electroluminescence

  • The objective of this test is to analyze the correlation between the portion of isolated area of a cell affected by micro-cracks and the magnitude of hot-spots.
  • Each module was polarized in the fourth quadrant at 25% of the STC rated short circuit current.
  • The authors have followed the crack type classification proposed by Kontges et al. (2011) , dividing the affected cells into C-type (those exhibiting only background noise for the inactive cell part) and B-type (those exhibiting a reduced intensity but higher than the background noise).

4.4. Electrical inspection: power rating

  • The individual I-V curves of the affected PV modules were obtained with a commercial I-V tracer (Tritec Tri-ka) and extrapolated to STC in accordance with the IEC-60891 (procedure 1), using the current and voltage temperature coefficients given by the manufacturer.
  • The incident irradiance and the operating cell temperature were measured by means of a previously calibrated module of the same technology, used as reference.
  • The operating voltage of the PV module, when working within the PV array, was measured by simply inserting "T" connectors into the module output wires.
  • The voltage losses as regards the non-defective modules can be understood directly as power losses, as the current is common for all the modules connected in series.

5.1. Visual inspection

  • Fig. 10 shows examples of visible defects, where micro-cracks cause a current drift and a corresponding heat that leads to the burning of the metallization fingers and to bubbles at the rear of the modules.
  • The authors found observable defects in only a 19% of the concerned PV modules, which is a too weak correlation for considering visual defects as a basis for dealing with hot-spots.

5.2. Infrared inspection

  • Fig. 12 shows the combined result of these effects.
  • Each point in the graph describes the observed T* HS at two different moments.
  • Fig. 12a shows the evolution at the Cáceres PV plant between July 2012 (average ambient temperature, June have been considered on this occasion.
  • Here, the average AT* HS has decreased by 22%, in an example of seasonal effects overcoming the degradation over time.

5.3. Electroluminescence

  • Module temperature and can thus be much larger during the day (when hot-spots are observed) than during the night (when EL images are obtained).
  • Whichever the case, EL images, despite being a very useful tool for quality control during the PV manufacturing processes, are not appealing for dealing with hot-spots in the field.
  • Along similar lines, other authors have observed that the correlation between the number of cell cracks in a PV module and the power loss is very noisy (IEA, 2014).

5.4. Electrical inspections: power rating and operating voltage

  • First, the standard peak power is not a good indicator of the energy production capacity of defective modules, so that it must be disregarded for dealing with hot-spots.
  • Second, the correlation between A.T* HS and A.V* HS and thus, power losses during operation, is positive, but the large dispersion does not allow the correlation at individual levels to be applied.
  • Apart from that, Fig. 16 shows the relationship between the normalized hot-spot temperature and the operating voltage loss for a more complete ensemble of the 113 PV modules of the three different manufacturers (78 from the Cáceres PV plant and 35 from the Cuenca PV plant).
  • It can be observed that the behavior is not the same for every manufacturer (neither in the correlation slope nor in the spread around it).
  • Whichever the case, this behavior spread is not relevant here.

6. Discussion

  • As regards energy losses, it seems logical to just extend the application of usual warranties to defective modules.
  • Hence, it is proposed to reject any module exhibiting hot-spots whose corresponding voltage losses (in relation to a non-defective module being part of the same string), within the PV system in normal operation, exceeds the allowable peak power losses fixed at standard warranties.
  • This is also applicable to PV modules with defective by-pass diodes, regardless the derived hot-spot temperature.

7. Proposal

  • Finally defective (type II error when establishing a null hypothesis that considers the module as defective), the method will have correctly classified the suspicious elements in more than the 80%> of the cases.
  • Other authors have also reached similar conclusions (Buerhop etal., 2011b) .
  • Finally, it is worth mentioning that this procedure and these acceptance/rejection criteria have already been applied by the IES-UPM when mediating in conflicts between module manufacturers and EPC over hot-spots problems during the last years.

8. Conclusion

  • There is still not a widely accepted reference on how to face this problem within commercial frameworks.
  • This paper has reviewed hot-spot related phenomena, paying particular attention to the fact that hot-spot appearance entails also operation voltage losses at the concerned PV module.
  • Then, supported by experimental observations on 200 PV modules exhibiting hot-spots, the paper proposes a practical in-field approach to accomplish IR imaging inspection and straightforward acceptance and rejection criteria that address both the lifetime and the operational efficiency of the modules.
  • Then, normalized hot-spot temperatures fewer than 10 °C are considered as not problematic, as they are caused by convective heat transfer and slight solar cells mismatch.
  • On the other hand, those over 20 °C should imply a module rejection, as they entail significant probability of hot-spot absolute temperature exceed 85 °C.

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14 May 2020-Energies
TL;DR: A comprehensive review and highlights recent advances, ongoing research, and prospects, as reported in the literature, on bypass diode application on photovoltaic modules, as well as the state of the art in the field.
Abstract: Solar photovoltaic (PV) energy has shown significant expansion on the installed capacity over the last years. Most of its power systems are installed on rooftops, integrated into buildings. Considering the fast development of PV plants, it has becoming even more critical to understand the performance and reliability of such systems. One of the most common problems faced in PV plants occurs when solar cells receive non-uniform irradiance or partially shaded. The consequences of shading generally are prevented by bypass diodes. A significant number of studies and technical reports have been published as of today, based on extensive experience from research and field feedbacks. However, such material has not been cataloged or analyzed from a perspective of the technological evolution of bypass diodes devices. This paper presents a comprehensive review and highlights recent advances, ongoing research, and prospects, as reported in the literature, on bypass diode application on photovoltaic modules. First, it outlines the shading effect and hotspot problem on PV modules. Following, it explains bypass diodes’ working principle, as well as discusses how such devices can impact power output and PV modules’ reliability. Then, it gives a thorough review of recently published research, as well as the state of the art in the field. In conclusion, it makes a discussion on the overview and challenges to bypass diode as a mitigation technique.

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References
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Journal ArticleDOI
TL;DR: In this article, a spatially resolved measurement technique for ultra-fast hot-spot classification of solar cells is proposed and demonstrated, which can deliver quantitative images of the local heat dissipation in hot-spots in measurement times below 10 ms.
Abstract: We propose and demonstrate a reliable and non-destructive spatially resolved measurement technique for ultra-fast hot-spot classification of solar cells. The method can deliver quantitative images of the local heat dissipation in hot-spots in measurement times below 10 ms. The high accuracy and sensitivity allow for reliable hot-spot testing and provide the basis for a reliable classification of solar cells into different hot-spot categories. The method can be applied to wafer-based silicon solar cells and in principle also to thin-film solar cells of all material compositions. This paper explains the measurement principle, gives a detailed step-by-step description of viable automated evaluation procedures, and assesses the sensitivity and accuracy of the method.

15 citations


"Experimental observations on hot-sp..." refers background in this paper

  • ...Fortunately, they can be easily detected through IR inspection, which has become a common practice in current PV installations (Auer et al., 2007; Botsaris and Tsanakas, 2010; Buerhop et al., 2011a,b,2012; Hoyer and Buerhop, 2008; Kasemann et al., 2009; King et al., 2000; Muñoz et al., 2011)....

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TL;DR: In this paper, the authors present data exhibiting hot spots spontaneously emerging in forward biased thin film photovoltaics based on a-Si:H technology, which evolve over time shrinking in their diameter and increasing temperature up to approximately 300 $^o$C above that of the surrounding area.
Abstract: We present data exhibiting hot spots spontaneously emerging in forward biased thin film photovoltaics based on a-Si:H technology. These spots evolve over time shrinking in their diameter and increasing temperature up to approximately 300 $^o$C above that of the surrounding area. Our numerical approach explores a system of many identical diodes in parallel connected through the resistive electrode and through thermal connectors, a model which couples electric and thermal processes. The modeling results show that hot spots emerge collapsing from a rather large area of nonuniform temperature, then collapse to local entities. Finally, we present a simplified analytical treatment establishing relations between the hot spot parameters.

11 citations

Journal ArticleDOI
TL;DR: In this article, the spontaneous emergence of hot spots in forward biased thin film photovoltaics based on a-Si:H technology was studied and shown to evolve over time, shrinking in their diameter and increasing in temperature up to approximately 300°C above that of the surrounding area.

10 citations

01 Jan 1982
TL;DR: In this article, the use of accelerated testing methods in a program to determine the reliability attributes of terrestrial silicon solar cells is discussed and different failure modes are to be expected when cells with and without encapsulation are subjected to accelerated testing and separate test schedules for each are described.
Abstract: The use of accelerated testing methods in a program to determine the reliability attributes of terrestrial silicon solar cells is discussed. Different failure modes are to be expected when cells with and without encapsulation are subjected to accelerated testing and separate test schedules for each are described. Unencapsulated test cells having slight variations in metallization are used to illustrate how accelerated testing can highlight different diffusion related failure mechanisms. The usefulness of accelerated testing when applied to encapsulated cells is illustrated by results showing that moisture related degradation may be many times worse with some forms of encapsulation than with no encapsulation at all.

6 citations


"Experimental observations on hot-sp..." refers background in this paper

  • ...Moreover, it avoids reaching 100 °C, which has been sometimes suggested as an absolute maximum for preventing early degradation (Lathrop et al., 1982)....

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