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Growth of InN thin films by modified activated reactive evaporation

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TLDR
In this paper, a modified activated reactive evaporation (MARE) was used to grow indium nitride films on glass and silicon substrates at room temperature, without any intentional substrate heating.
Abstract
Indium nitride films have been grown using modified activated reactive evaporation (MARE). The films were grown on glass and silicon substrates at room temperatures, i.e. without any intentional substrate heating. In this technique, the substrates were kept on the cathode instead of the grounded electrode and hence subjected to low energy nitrogen ion bombardment leading to highly c-axis oriented films. The photoluminescence (PL) and Raman spectrum shows significant improvement in the quality of the films compared with conventional activated reactive evaporation. The band gap measured from the room temperature PL was found to be 1.9 eV. Very high growth rates can be achieved in the MARE growth technique. The modification in the activated reactive evaporation technique may have a large impact on the growth of various compounds such as metal oxides.

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Room temperature growth of high crystalline quality Cu3N thin films by modified activated reactive evaporation

TL;DR: In this article, the effects of change in radio frequency (RF) power and deposition pressure on the structural and optical properties of the films have been investigated, and the lattice parameter, film thickness and optical band gap are found to be strongly dependent on the deposition pressure.
Journal ArticleDOI

Carrier transport in InxGa1−xN thin films grown by modified activated reactive evaporation

TL;DR: In this article, the temperature dependent carrier transport properties of InxGa1−xN thin films in the entire composition range grown by modified activated reactive evaporation were investigated and a transition from metallic to semiconducting type resistivity was observed for indium rich films.
Journal ArticleDOI

Composition-dependent structural, optical and electrical properties of In x Ga 1− x N (0.5 ≤ x ≤ 0.93) thin films grown by modified activated reactive evaporation

TL;DR: In this article, the compositional dependence of structural, optical and electrical properties of polycrystalline In 1 −1 −x Ga1−x N thin films grown by modified activated reactive evaporation was studied.
Journal ArticleDOI

Annealing studies on InN thin films grown by modified activated reactive evaporation

TL;DR: In this paper, the effect of annealing in air and in vacuum on structural, electrical and optical properties of indium nitride (InN) thin films was described, where the films were grown by modified activated reactive evaporation.
Journal ArticleDOI

Structural and nanomechanical properties of InN films grown on Si(1 0 0) by femtosecond pulsed laser deposition

TL;DR: In this paper, the structural and nanomechanical properties of InN films grown on Si(1 0 0 0) using femtosecond pulsed laser deposition were studied for different growth conditions.
References
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Journal ArticleDOI

GaN, AlN, and InN: A review

TL;DR: The status of research on both wurtzite and zinc-blende GaN, AlN, and InN and their alloys including exciting recent results is reviewed in this paper.
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Absorption and Emission of Hexagonal InN. Evidence of Narrow Fundamental Band Gap.

TL;DR: In this article, the authors present the results of a joint study with the Ioffe Physico-Technical Institute, Russian Academy of Science, Polytekhnicheskaya 26, 194021 St. Petersburg, Russia and the Belarus Academy of Sciences, Brovki 17, 220072 Minsk, Belarus.
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Indium nitride (InN): A review on growth, characterization, and properties

TL;DR: In this paper, the authors reviewed the development of indium nitride (InN) semiconductors from its evolution to the present day and discussed the most popular growth techniques, metalorganic vapor phase epitaxy and molecular beam epitaxy.
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Optical bandgap energy of wurtzite InN

TL;DR: Wurtzite InN films were grown on a thick GaN layer by metalorganic vapor phase epitaxy as discussed by the authors, and growth of a (0001)-oriented single crystalline layer was confirmed by Raman scattering, x-ray diffraction, and reflection high energy electron diffraction.
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Superior radiation resistance of In1-xGaxN alloys: Full-solar-spectrum photovoltaic material system

TL;DR: In this paper, the optical and electronic properties of the In1−xGaxN alloys have been investigated and shown to exhibit a much higher resistance to high energy (2 MeV) proton irradiation than the standard currently used photovoltaic materials such as GaAs and GaInP, and therefore offer great potential for radiation-hard high-efficiency solar cells for space applications.
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