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Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Characterization

TL;DR: Atom Probe Tomography Plasmon Dynamics of Nanostructured Surfaces Scanning Tunneling Microscopy of Self Assembled III-V Nanostructure Nanomembranes Aberration Corrected Scanning TransmissionMicroscopy and Electron Energy Loss Rayleigh Scattering from Carbon Nanotubes Low Energy Electron Microscopic Studies of Nanometrics as discussed by the authors.
Abstract: Atom Probe Tomography Plasmon Dynamics of Nanostructured Surfaces Scanning Tunneling Microscopy of Self Assembled III-V Nanostructures Nanomembranes Aberration Corrected Scanning Transmission Microscopy and Electron Energy Loss Rayleigh Scattering from Carbon Nanotubes Low Energy Electron Microscopy Studies of Nanostructured Semiconductor Surfaces Scanning Probe Microscopy of GaN Based Structures Time Domain Thermoreflectance for Thermal Characterization of Nanostructures X-Ray Studies of Nanostructures Single Nanowire Photoelectron Spectroscopy Ultra-High Vacuum Transmission Electron Microscopy Synthesis and Studies of Low-Dimensional Structures Raman Spectroscopy of Carbon Nanotubes Scanning Electron Microscopy for Characterization of Semiconducting Nanowires X-Ray Diffraction for Stress Determination in Nanostructures.
Citations
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Journal ArticleDOI
TL;DR: This approach considers aberrations up to fifth order, appropriate for image formation in state-of-the-art aberration-corrected LEEM and PEEM, and calculates contrast and resolution of one-dimensional and two-dimensional pure phase, pure amplitude, and mixed phase and amplitude objects.

46 citations

Journal ArticleDOI
TL;DR: In this article, a simple model based on thermal diffusivity and spatial extent of the absorption region is derived and applied to the experimental results, which is in good agreement with the published data.
Abstract: Investigation of wustite (FeO), iron (Fe), and silicon (Si) specimens by infrared laser assisted three dimensional atom probe tomography shows evidence of confined surface absorption of the laser energy as the mechanism of laser assisted field evaporation for high band gap materials. The absorption region is shown to be located on the laser illumination side, close to the specimen apex. A simple model based on thermal diffusivity and spatial extent of the absorption region is derived and applied to the experimental results. The values of thermal diffusivity thus obtained are in good agreement with the published data.

35 citations

Journal ArticleDOI
09 Nov 2011
TL;DR: In this paper, atom probe tomography and scanning transmission electron microscopy has been used to analyze a commercial microelectronics device prepared by depackaging and focused ion beam milling.
Abstract: Atom probe tomography and scanning transmission electron microscopy has been used to analyze a commercial microelectronics device prepared by depackaging and focused ion beam milling. Chemical and morphological data are presented from the source, drain and channel regions, and part of the gate oxide region of an Intel® i5-650 p-FET device demonstrating feasibility in using these techniques to investigate commercial chips.

34 citations

Journal ArticleDOI
TL;DR: In this article, the spatiotemporal focusing of surface plasmon polariton (SPP) wave packets (WPs) by planar PLASmonic-lens coupling structures is described using combined femtosecond interferometric time-resolved photoemission electron microscopy (ITR-PEEM) imaging and model simulations.
Abstract: The spatiotemporal focusing of surface plasmon polariton (SPP) wave packets (WPs) by planar plasmonic-lens coupling structures is described using combined femtosecond interferometric time-resolved photoemission electron microscopy (ITR-PEEM) imaging and model simulations. The focusing properties of lens structures inscribed lithographically into Ag films depend on the angle of incidence of the excitation field. Severe aberrations are introduced by the phase delay in the interaction of obliquely incident plane waves with the commonly employed circular arc-shaped lens structures. It is shown that the aberration can be corrected by accounting for propagation delays caused by the incidence angle-dependent retardation of the optical field-lens structure interaction. The focusing of SPP-WPs in both space and time is demonstrated with aberration corrected lens structures.

20 citations

Journal ArticleDOI
08 Aug 2017
TL;DR: In this paper, the authors reported the characterization of carbon nanotubes (CNTs) synthesised using a conventional microwave oven method, offering several advantages including fast, simple, low cost, and solvent free growth process.
Abstract: This paper reports the characterization of carbon nanotubes (CNTs) synthesised using a conventional microwave oven method, offering several advantages including fast, simple, low cost, and solvent free growth process. The procedure involves flattening of graphite/ferrocene mixture catalyst inside the microwave oven under ambient conditions for a very short duration of 5 s, which inhibits the loss factor of graphite and ferrocene. The effect of graphite/ferrocene mixture ratio for the synthesis of CNTs is investigated by transmission electron microscopy (TEM), field emission scanning electron microscopy (FESEM), x-ray diffraction (XRD), Raman spectroscopy and UV–NIR–Vis measurements. The samples produced using the different ratios contain nanotubes with an average diameter in the range 44–79 nm. The highest yield of CNTs is attained with graphite/ferrocene mixture ratio of 70:30. The lowest I D/I G ratio intensity as identified by Raman spectroscopy for 70:30 ratio indicates the improved crystallinity of CNTs. Due to the capillary effect of CNTs, Fe nanoparticles are found to be encapsulated inside the tubes at different positions along the tube length. The obtained results showed that the smaller the diameter of graphite and ferrocene favors the synthesis of graphene oxide upon microwave radiation.

20 citations