Hierarchical statistical characterization of mixed-signal circuits using behavioral modeling
Eric Felt,S. Zanella,Carlo Guardiani,Alberto Sangiovanni-Vincentelli +3 more
- pp 374-380
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TLDR
A methodology for hierarchical statistical circuit characterization which does not rely upon circuit-level Monte Carlo simulation is presented and permits the statistical characterization of large analog and mixed-signal systems.Abstract:
A methodology for hierarchical statistical circuit characterization which does not rely upon circuit-level Monte Carlo simulation is presented. The methodology uses principal component analysis, response surface methodology, and statistics to directly calculate the statistical distributions of higher-level parameters from the distributions of lower-level parameters. We have used the methodology to characterize a folded cascode operational amplifier and a phase-locked loop. This methodology permits the statistical characterization of large analog and mixed-signal systems, many of which are extremely time-consuming or impossible to characterize using existing methods.read more
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Efficient parametric yield extraction for multiple correlated non-normal performance distributions of Analog/RF circuits
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