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Proceedings ArticleDOI

High-speed CMOS: Si light emitters for on-chip optical interconnects

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TLDR
In this paper, the speed of operation of a reverse biased pn junction has been evaluated using a streak camera, and the results clearly indicate that optical interconnects are a viable option for the future IC technologies.
Abstract
The delays and power requirements associated with long metal lines for 70nm and beyond technologies make on-chip optical interconnects an attractive option. The semiconductor industry has not enthusiastically responded to on-chip optical interconnects due to the difficulties associated with fabrication of optical emitters on Silicon substrate. Most emitters being researched use materials other than Silicon technologies - not compatible with conventional Si fabrication process. Hence, an optical inter-connect incorporating Si light emitter that can be fabricated shows excellent promise. A reverse biased Si-based p-n junction is known to emit broadband visible and infrared light emission in the range of 400-900 nm. Due to indirect band-gap in Si, the speed of operation and power requirement of Si based light emitting diodes has been considered to be non feasible for VLSI implementation. In this paper, the speed of operation of a reverse biased pn junction has evaluated using a streak camera. Power requirement for optical interconnects has been calculated using the experimental value of quantum efficiency. Results from the experiments clearly show that Si-based diodes are capable of operating in minimum of 10's of GHz and will require power less than conventional global metal interconnects on an IC. These results clearly indicate that optical interconnects are a viable option for the future IC technologies.© (2002) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

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Citations
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Journal ArticleDOI

All Si-based optical interconnect for interchip signal transmission

TL;DR: In this paper, the authors demonstrate the ability to transmit electrical signals using Si-based components, i.e., the light was generated by biasing a p-n junction at avalanche breakdown voltage, light was coupled through a fiber cable made of SiO/sub 2/, and detected by an Sibased avalanche photodiode.
Journal ArticleDOI

Low-operating-voltage integrated silicon light-emitting devices

TL;DR: In this article, the structural details of two distinctly different line-patterned Si-LEDs are presented, composed of heavily doped n/sup +/p/sup+/ junctions, made by BiCMOS n/Sup +/ sinker and PMOS p/Sup+/ source/drain doped regions, respectively.
References
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Proceedings ArticleDOI

The projected power consumption of a wireless clock distribution system and comparison to conventional distribution systems

TL;DR: In this article, a wireless interconnect system has been proposed for global clock signal distribution, which transmits and receives signals at 20 GHz or higher, and the received signal is then amplified, frequency divided to 4 GHz or lower, and buffered to provide a clock signal to the local clock distribution system.
Journal ArticleDOI

New degradation mechanism associated with hydrogen in bipolar transistors under hot carrier stress

TL;DR: Avalanche hot carrier induced bipolar device degradation as a function of temperature, current density, and time is reported in this paper, where the observed drift in emitter−base breakdown voltage (Vebo) is well correlated to changes in forward base (Ib) and collector (Ic) currents.
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